The technical FIELD TO WHICH the PRESENT INVENTION
The present invention relates to the diffractometer, in particular to an x-ray diffractometer. More specifically it refers to the diffractometer for non-destructive testing at the elementary components that are inappropriate (or not allowed) to analyze conventional diffractometers, or even on components that cannot be shifted from their original location.
PRIOR art
Diffraction research methods find wide use in the analysis of the structure of materials. The information obtained with the help of this technology, important in some fields, such as chemistry, metallurgy and metallography, mining, transport, environment, aviation, aerospace, construction and even the protection of cultural heritage.
For diffraction analysis using several types of radiation. Very conventional diffraction methods are carried out using x-rays, electrons and neutrons. Of particular importance is the technology of x-ray diffraction.
Typically, this type of equipment is used for detecting diffraction on powder or polycrystalline solid phone Analysis for polycrystalline solids is particularly the initial interest if you want to study components of industrial implants and/or implant, in the development process.
Such apparatus requires an x-ray source, the object stage and the x-ray detector. It is required that the sample was rotated so that the surface was irradiated by a beam of x-rays from the source at different angles. You want the sample and the detector was rotated simultaneously (optional) with different speeds, so that their relative position provides the opportunity to receive the diffracted beam from the crystallographic planes that are in the correct position for reflection.
X-ray diffractometry suitable for obtaining information in the field of chemical composition, physical and mechanical properties of the samples (presence of residual tension or compression) made of metal or other material. This technique is suitable even for the early detection of defects or distortions of the crystal structure, for example, in welded elements or elements that are under stress or in a state of fatigue. Such voltage is called, in General, the preferred orientation of the crystal lattice, which can be detected by x-ray diffraction when choosing a particular procedure. This t is hnology suitable even for the analysis of fibrous structures and Windows to determine the state of preservation, as well as the chemical and physical properties.
Sometimes it is useful to explore using non-destructive test methods the structure of the crystal lattice of the components used in the implants. In this case, it is often difficult or impossible to obtain samples for traditional analysis and laboratory tests. Very often the analyzed component or implant can not move. For this reason, there is a need in the diffractometer and, in particular, in the x-ray diffractometer, which could just be used without moving any structure or component of the implant. It is important that this diffractometer was given the opportunity to obtain a substantial range of information (i.e. was equivalent laboratory diffractometer for the analysis of powders and polycrystalline materials). In particular, it is useful to identify the presence of mechanical stress, preferred orientation, structural defects of the material, which has the analyzed component, avoiding that special working conditions diffractometer limited the receipt of necessary information. This means that there is a need to develop diffractometer, which is suitable for use on location and in improving the performance of traditional laboratory diffractometers.
The NATURE of THIS IZOPET THE DEPOSITS
The aforementioned problems are solved by using a diffractometer, containing
analytical device that supports the radiation source containing collimation axis; and a radiation detector having a receiving axis, and these collimation and reception axes converge in the center, called the center of the diffractometer, which is a constant relative to the analytical instrument;
means for providing movement of the specified analytical instrument;
means for providing rotation of the specified source and detector around the specified center of the diffractometer.
Preferably, these means to ensure move of the specified analytical instrument provided the ability to change the position of the centre of the diffractometer in space.
In accordance with a preferred embodiment of the present invention diffractometer is an x-ray diffractometer.
Preferably, these means for providing rotation of the specified source and detector were suitable for rotating the source and detector so that collimation and reception axis was in the Equatorial plane. This plane is stationary relative to the analytical device.
In accordance with a preferred embodiment of the present invention shows the analytical device is supported with design support and movement and provided with means for ensuring movement of the specified analytical instrument regarding the design, maintain and move to the analytical device could rotate around an axis, called the Equatorial axis in the Equatorial plane and passing through the center of the diffractometer. This fact corresponds to the rotation of the Equatorial plane around the Equatorial axis. This type of rotation is preferably possible for an arc of at least 10 degrees, preferably at least 20 degrees or even slightly higher values for special need analytical research.
In accordance with a preferred embodiment of the present invention the movement of this analytical device relative to the design, maintenance and movement allows rotation of the Equatorial plane with respect to the Equatorial axis without changing the position of the axis in space.
The plane perpendicular to the specified Equatorial axis and which is the center of the diffractometer, fixed relative to the analytical instrument and is called the axial plane. This plane can form a plane of symmetry of the specified analytical device.
As collimation axis source" is usually defined by the axis of the beam) the treatment, which can emit source, and as a receiving axis - the axis of the beam of radiation that can be detected by a detector.
The present invention also relates to a method of diffraction, preferably x-ray diffractometry, providing for the positioning of the diffractometer as described above, with the center of the diffractometer located at the point of the surface of the analyzed element.
In accordance with a possible embodiment of the present invention the axial plane may be preferable is perpendicular to the surface of the analyzed element at a point coincident with the center of the diffractometer.
In accordance with the embodiment of the present invention analyzed the specified element is not mechanically connected to the diffractometer, with whom he is not even in the contact interaction, which is preferable.
BRIEF DESCRIPTION of DRAWINGS
Figure 1 - schematic side view of an x-ray diffractometer corresponding to the present invention.
Figure 2 - schematic front view of the diffractometer, illustrated in figure 1.
Figure 3 - schematic illustration of a node diffractometer illustrated in figure 1, and more specifically, the illustration of the tip of the diffractometer, which contains the first analytical device, podderjivaushiy source and the x-ray detector.
4 is a schematic side view of node diffractometer illustrated in figure 1, containing the first analytical device that supports source and the x-ray detector, and a framework for supporting and moving the analytical device.
5 is a schematic articulation capable of moving the specified analytical device in space in accordance with a particular embodiment of the present invention.
DETAILED DESCRIPTION of the POSSIBLE alternative IMPLEMENTATION of the PRESENT INVENTION
Figure 1 shows a side view of an x-ray diffractometer corresponding to the present invention. The apparatus includes a frame 1, which may be equipped with two wheels or other means for transporting and positioning the x-ray diffractometer, and may also contain an electric generator capable of generating the energy required for use, a container of coolant for an x-ray source and the electrical elements for positioning the moving parts and collecting data from measuring equipment, and to process these data.
The apparatus includes a support leg 3 and the console 4 is supported by means of the support columns 3 and measurable rotation relative to the vertical is th stand, for vertical positioning of the tip 6, which includes an analytical device, supported by the console 4. The locking device 5 can fix the console 4, positioned relative to the support legs 3. Tip 6 are also illustrated in figure 2 and figure 3, includes a source of 7 x-ray detector 8 x-rays and other locations on the devices. These devices include the element 9, which is called a fundamental pillar of Euler, which preferably may be in the form of an arc of a circle and is designed to maintain the source 7 x-ray radiation and the detector 8 x-ray radiation, In the described embodiment, the main bearing Euler is an analytical device. Source 7 x-ray radiation and the detector 8 x-ray radiation can simply be moved along the main bearing 9 Euler. For each position reached on the main landing Euler x-ray source and x-ray detector, collimation axis 11 and the reception axis 10 is always directed to the point 12, which is the center 12 of the diffractometer and preferably coincides with the center of curvature of the main bearing 9 Euler.
Thus, the axes 10 and 11 can be rotated around the center 12 in the plane, in the Equatorial flat is STI, which is essentially parallel to the main support 9 Euler. As shown in figure 3, the Equatorial plane coincides with the plane of the drawing, an axial plane perpendicular to it, and their intersection is the axis 13, which is called the axis of research.
In accordance with a preferred embodiment of the present invention specified main bearing 9 Euler merely supported by design 14 maintain and move called auxiliary support Euler. Special system provides the main support 9 Euler move relative to the auxiliary support 14 Euler for the implementation of the Equatorial rotation around the axis 15. Equatorial axis 15 is located in the Equatorial plane and passes perpendicular to the axis 13 of the study. In this case, all the Equatorial plane can be rotated to a certain angle relative to the Equatorial axis 15 and, thus, can be rotated collimation axis 11 and the reception axis 10, as the source of 7 x-ray radiation and the detector 8 x-ray radiation are supported by the main bearing 9 Euler.
Figure 4 shows a side view of the tip 6, which includes these two pillars of Euler, and illustrates a possible implementation of the articulation mechanism of the main bearing 9 Euler relatively VSP the service supports 14 Euler. The main bearing 9 Euler includes two toothed arc 21 and 21′United appropriately. Source 7 x-ray radiation and the detector 8 x-ray move along the arcs through gears driven by motors 20 and 20′that are part of the x-ray source and x-ray detector. The bracket 22 connected to the main support 9 Euler, her back to the auxiliary pole 14 Euler. The bracket 22 has a portion 23 having the structure 24 in the form of a dovetail, and this design is held in the respective cavities 25 (shown in figure 4 by the dashed line) auxiliary supports 14 Euler, thus allowing rotation of the Equatorial plane, as described above. A worm (not shown) installed parallel to the axis 26, is driven by an electric motor 27 and mates with a corresponding thread in the upper surface 28 of the structure 24. The worm causes rotation of the main bearing 9 Euler. This, like other types of mechanisms can be simply implemented by a specialist in this field of technology.
Also, there will be a series of devices to ensure traffic intended for positioning in space of the tip 6, which contains two supports Euler.
Kaksleduet of figure 2, 16, equipped with an electric motor 30, provides a full turn around the axis of the console 4 this tip 6. This provides a very advantageous location of the measuring devices and also enables studies to be analyzed material along different directions. The reference numbers 31 and 32 are two carriages; they provide the possibility of mutually perpendicular movements of the displacement; this movement is also perpendicular to the axis of the console 4; these carriages also are driven by a special motor.
The motor 33 through the screw mechanism provides the possibility of bias console 4 along its axis.
Other devices to ensure traffic can be provided to facilitate the positioning of the tip 6. For example, the joint may be provided preferably between system 16 and carriages 31 and 32, providing the possibility of rotation around the axis perpendicular to the axis of the console 4. As evident from figure 5, this coupling is schematically represented by reference number 35 and are mounted above the pin 36 (shown schematically). This articulation provides the ability to rotate 180 degrees and can easily move thanks to a special motor.
Instead of the legs 3 may be provided ve the vertical support, along which the bracket (console) 4 can be displaced vertically by a special device. The vertical support can be rotated around its axis, thus giving an additional degree of freedom for positioning the structure. It is obvious that this apparatus can be implemented with various types of devices for providing movement to the demands of the study.
On the main landing 9 Euler can be provided pointing device, designed for proper placement of the measuring device relative to the analyzed element. As described above, analyzed this element can be an element of working designs, such as part of an industrial installation, or the item is too large for him to move, and which requires non-destructive testing of the structure. Pointing device may include two lasers mounted on the main landing Euler, and directed toward the center 12 of the diffractometer, and the camera is also mounted on the main landing Euler and directed along the axis 13 of the study. The overlap of the two spots projected by the laser on the surface of the analyzed element, and the form will point to the correct location of equipment relative to the analyzed element. Moving the hour is preferably ΓΌ can be moved by means of a special motor, managed by electronic systems. These systems can collect data from the pointing device and fully control the positioning of the equipment.
The movement of the x-ray source and x-ray detector can also be controlled using the electronic system, as well as the movement of the main bearing Euler electron can be controlled relative to the auxiliary support Euler.
The x-ray source and the x-ray detector can be of different types selected from the types commonly used for x-ray diffraction. These types include all suitable collimation system (slits, air conditioning rays, and if necessary also the monochromators). In particular, the detector may include a sliding system that allows movement collimation system (i.e., "capillary optics", "polycapillary optics," and so forth.) along the receiving axis of the beam from the centre of the diffractometer and the center of the diffractometer.
The choice depends on the type of radiation and the characteristics of the analyzed element, as well as from the structural problems of the equipment. In particular, in the case of x-ray diffraction detector may be a scintillation detector, solid state, or any other known app is rum. In accordance with a possible embodiment can be used ionization gas detector such as a Geiger counter, due to its small size. In accordance with a preferred embodiment of the present invention can use a Geiger counter in his area of proportionality, also called a proportional counter. In addition, the x-ray source and the x-ray detector can be equipped with devices that provide the opportunity to offset their collimation and reception axes, respectively, to regulate outside the specified x-ray source and x-ray detector, the optical path of the beam incident on the analyzed material and Draginovo beam in accordance with work requirements.
The size of the equipment can be selected depending on the application, to be built and to be such that all devices are supported, respectively. In particular, with regard to the main bearing Euler, they should be adequate enough to maintain the x-ray source and x-ray detector in relation to their size and to allow sufficient progress along the main pillars of Euler. It is also important to bear in mind that with increasing R is smera increased motor power, required to move structures without causing vibration.
For example, it is possible to provide apparatus, as described, with the outer radius of the main bearing Euler, constituting approximately 22 cm, the progress of the x-ray source and x-ray detector, is proportional to the ionization type, constituting approximately 135 degrees, distance, constituting approximately 11 cm between the center of the diffractometer and x-ray source and between the center of the diffractometer and x-ray detector. The analysis of the reference sample gave results corresponding to the results obtained using a conventional diffractometer. The design can also include an electrical connection and a data connection between the electronic control systems and various devices for providing or motion detection, described above, as well as pipes for coolant for the x-ray source.
In accordance with a possible way of using the diffractometer, the latter are placed so that the point of the surface of the analyzed element was the center 12 of the diffractometer. When you run this surface must be perpendicular to the axis 13 of the study; if the surface is not flat, the plane, the handle either the other to the surface, called sample plane must be perpendicular to the axis of the study. Thus, collimation axis 11 forms an angle θ with the plane of the sample. Reception axis 10 will form an angle θ with sample plane and angle 2θ relatively collimation axis. Thus, the system is able to detect the rays reflected by the families of crystallographic planes, which have interplanar distance d, which for angle θ corresponds to the relative position of the x-ray source and x-ray detector and satisfies the Bragg law, described by the equation nλ=2d·sinθwhere n is an integer and λ - wavelength beam of x-rays emanating from the source.
In accordance with a possible way of working, collimation axis 11 and the reception axis 10 carry out the above-mentioned rotation, keeping the symmetry axis 13 of the study; thus it is possible to detect receiving optics from different families of planes in the crystal lattice satisfying the Bragg law at different angles θ.
If the sample is a polycrystalline solid with a relatively small crystals, as it usually is, different families of planes can be arbitrarily oriented in all directions. So what Braz, can be detected as different families of planes that satisfy the Bragg law, by scanning from different angles θ. Due to the rotation of the Equatorial plane around the Equatorial axis 15, as described above, and by keeping constant the position of the x-ray source and x-ray detector about the axis 13 of the study (which will turn the corner ω together with the Equatorial plane), the Equatorial plane is no longer perpendicular to the sample plane. Thus, it is possible to scan and in this case from different angles θ and to detect signals from planes, inclined at an angle ω relative to the sample plane. Comparison at different angles θ intensities of diffraction at a single angle θ (corresponding families of planes with one interplanar distance) gives information about possible preferred orientations in the crystal structure. It is equivalent to study a particular Debye arcs of a circle.
Alternatively collimation and reception axis can be symmetrical about an axis lying in the Equatorial plane, and be different from the axis of studies for the analysis of families of planes with different inclinations relative to the axis of the surveys. This is important when the need for the analysis of single-crystal materials or if it is not possible to position the axis of the studies perpendicular to the sample plane, or if necessary, analysis of special directions in the materials.
The number of different possible location equipment provides greater versatility for use of the diffractometer.
If the sample can at least partially move and to give orientation in space, the analysis capabilities expand, so you may receive a range of information that is comparable to the range of information obtained using conventional laboratory instrumentation, such as monocrystalline measuring devices, which have the highest number of degrees of freedom for the orientation of the sample in space.
Were described diffractometer and the method of its use, where as the radiation source used, the x-ray source. This is the preferred implementation of the present invention. Anyway, using equipment with special dimensions and elements, you can use different types of sources and detectors of other types of radiation, such as electromagnetic radiation, soundmaking or radiation, consisting of beams ale is ntalnyh particles.
1. Diffractometer, containing
base;
analytical device (9), supporting source (7) of the radiation beam, having collimation axis (11)and the detector (8) of the radiation beam with the receiving axis (10)with these collimation axis (11) and the reception axis (10) converge in the center (12) diffractometer, which is fixed relative to the specified analytical device (9);
means (16, 31, 32, 33) to ensure move of the specified analytical device (9) in space and supporting analytical instrument bracket (4)mounted for rotation and vertical movement of the specified analytical device (9) with capability of changing the position of the centre of the diffractometer in space;
means (20, 20′) to ensure rotation of the specified source and detector around the specified center of the diffractometer so that these collimation axis (11) and the reception axis (10) were located in the Equatorial plane, being fixed relative to the specified analytical device (9);
structure (14) for supporting and moving the specified analytical device (9);
means (27) to ensure move of the specified analytical device relative to the above structure (14) for supporting and moving to oksanaconstance device (9) can rotate around the Equatorial axis (15), are specified in the Equatorial plane and passing through the centre (12) diffractometer,
but such means (27) to ensure move of the specified analytical device relative to the above structure (14) for supporting and moving made with the possibility of rotation of the Equatorial plane around the specified Equatorial axis (15) without changing the position of this axis in space.
2. The diffractometer according to claim 1, characterized in that the said means (16, 30) to ensure move of the specified analytical device in space made with the possibility of rotation of the specified analytical device around an axis perpendicular to the specified Equatorial axis.
3. The diffractometer according to claim 1 or 2, characterized in that the spring (7) is a source of electromagnetic radiation, or soundmaking, or radiation, consisting of beams of elementary particles and the detector (8) is a detector of electromagnetic radiation, or soundmaking, or radiation, consisting of beams of elementary particles.
4. The diffractometer according to claim 1, characterized in that the spring (7) is the x-ray source and the detector (8) is the x-ray detector.
5. The diffractometer according to claim 1, characterized in that the said means (16, 31, 32, 33) to ensure the move is s specified analytical device (9) in the space suitable to allow changing the position of the center (12) diffractometer by rotating or moving the specified analytical device.
6. The diffractometer according to claim 1, characterized in that the Equatorial axis (15) perpendicular to the plane of symmetry of the specified analytical device (9).
7. The diffractometer according to claim 1, characterized in that the rotation around the specified Equatorial axis (15) is possible along the arc component of at least 10°preferably at least 20°.
8. The diffractometer according to claim 3, characterized in that the detector (8) is proportional to the ionization counter.
9. The diffractometer according to claim 1, characterized in that it contains a pointing device located on the specified analytical device (9) and designed to accommodate the specified analytical device relative to the analyzed element.
10. The diffractometer according to claim 9, characterized in that the pointing device has two lasers and a camera.
11. The diffractometer according to claim 1, characterized in that the said analytical device is made in the shape of an arc of a circle.
12. The diffraction method, providing for placement of the diffractometer, containing
the basis of the analytical device that supports the source radiation beam having collimation axis, and the detector of the radiation beam with the receiving axis, and these collimation axis and the reception axis converge in the center of the WPPT is actometry, which is fixed relative to the specified analytical instrument;
means for providing movement of the specified analytical device (9) in space and supporting analytical instrument bracket (4)mounted for rotation and vertical movement of the specified analytical device (9) with capability of changing the position of the centre of the diffractometer in space;
means for providing rotation of the specified source and detector around the specified center of the diffractometer so that these collimation axis (11) and the reception axis (10) were located in the Equatorial plane, being fixed relative to the specified analytical device (9);
structure (14) for supporting and moving the specified analytical device (9);
means (27) to ensure move of the specified analytical device relative to the above structure (14) maintain and move to the specified analytical device (9) can rotate around the Equatorial axis (15), which is specified in the Equatorial plane and passing through the centre (12) diffractometer;
but such means (27) to ensure move of the specified analytical device relative to the above structure (14) maintain peremesheniya made with the possibility of rotation of the Equatorial plane around the specified Equatorial axis (15) without changing the position of this axis in space, and the centre of the diffractometer is placed on a surface point of the analyzed element.
13. The diffraction method according to item 12, characterized in that the analytical device has a plane of symmetry located perpendicular to the surface of the analyzed element at a point coincident with the specified center of the diffractometer.
14. The diffraction method according to item 12, characterized in that the analyzed element is not mechanically connected with the diffractometer.
15. The diffraction method according to any one of p-14, characterized in that the diffraction is x-ray diffractometry.