The present invention relates to a device for determining the presence in the subject crystalline and polycrystalline materials.

In order to ensure safety, for example, air transport baggage (object) from within the Luggage items must be controlled primarily by the presence of explosives, which employs the most modern technical means.

To search for explosives can be, in particular, used x-ray diffraction analysis, which measure the ambient crystal structure x-ray emission and compare it with characteristic energy spectra, for example, various explosives, which allows on the basis of a specified dimension of energy to make a conclusion about the presence in the object explosives, and the material of the explosive.

In DE 19510168 A1 describes the appropriate device. In this unit on the x-ray source set aperture, which is formed fan-shaped beam of x-rays directed to the controlled area of the scanned material. In the controlled area in front of the x-ray source symmetrically with the axis of the Central x-ray beam in the plane perpendicular to the fan-shaped beam of x-rays, are school who Evie collimators. X-ray emission is detected throughout irradiated controlled area multiple detectors.

In EP 0354045 A2 describes a device and method, which also provides for the formation of a fan-shaped beam of x-rays. When scanning the inspected object this fan-shaped beam of x-rays giragira on the crystal lattice of the object that is registered in the form of the energy spectrum multiple detectors.

Another device is described in US 4956856. This device is formed by a narrow beam of x-rays, which is a rotating disk with a spiral slit is directed to the irradiated object. This slit narrow beam moves to the object being examined in the transverse direction.

Use in x-ray primary beam of small cross-section is described in DE 4101544 A1. When this scattered radiation of the primary beam is logged multiple detectors and concentric collimator system.

In the publication SU 1608526 A1 disclosed closest to the invention is a technical solution, essentially related to a device for determining the presence of crystalline and polycrystalline materials of the object in the objects of an electron-including collimation-detector system consisting of collimators and the child is tori, and focused on her x-ray source. However, the known solution is to x-ray tomographic computational device and not adapted for rapid determination of the presence of crystalline and polycrystalline materials in separate pieces of Luggage.

Accordingly, the disadvantage of the above devices is that for all not permitted for carriage of baggage scanning is always exposed to all the baggage entirely.

From DE 4130039 A1 is known a system for forming an extruded beam of x-rays. Used for this purpose, the diaphragm consists of two limiting elements, which are oriented relative to each other in such a way as to limit the amount that corresponds to the shape of the beam. This system is designed to increase covered by x-ray radiation surface area.

Based on the foregoing, the present invention was based on the task to develop such a device is specified in the beginning of the description of the type, which would allow to quickly determine the presence of a separate subject crystalline and polycrystalline materials.

This problem is solved by improving the design closest analogue in such a way that collimation-detector system the EMA has the ability to regulate its height position relative to the x-ray source using the appropriate devices and the possibility of simultaneous regulation of its lateral position along with this x-ray source, for which the x-ray source is made with the possibility of a directional move in the lateral direction by using devices, and control of these devices is carried out by the computer.

The basic idea of the invention consists in that at the appropriate speed control to position in the x-ray installation electron-including collimation-detector system and aimed at her x-ray source, with adjustable height and in the transverse direction, using x-ray diffraction analysis allows to determine the material of the object in the specified local area of the control. To this end collimation-detector system and the x-ray source is made with the possibility of their joint simultaneous regulation of the position, collimation-detector system preferably performs a height-adjustable relative to the x-ray source.

On the basis of only two known coordinates of the predetermined local area (for example, the position of the conveyor belt and angle) adjustable position electronography can continuously scan the third missing coordinate in one measuring passage. Thanks POPs is correspondingly able to measure with reference to a specific local area located on the line materials. On the basis of three known coordinates pre-defined local zone electronography can purposefully be picking up on the point, which then will be determined by the type of material.

While it is preferable that the height-adjustable collimation-detector system consisted of Ostroumova collimator and located behind the detector. In this embodiment, the collimator may have a conically expanding circular slit reproducing a given angle and focused on the detector.

At the next stage, knowing diffraction spectrum and additionally determined by the average value of the charge on the nucleus of atoms of type of material, you can get additional information to identify this material. To this end, the collimator with a circular slit may be provided by the Central deaf, closed by the detector of the hole, which consistently at a certain distance from each other are two different detector unit and with which in a known manner determined by the average value of the charge on the nucleus of atoms for the primary beam of the subject. This hole collimation-detector system can be oriented to the primary beam from the x-ray source. The first detector unit can be designed as detector for the lower, and the second in the form of a detector for higher energy x-rays.

Below the invention is explained in more detail on the example of one of the variants of its implementation with reference to the accompanying drawings on which is shown:

figure 1 - schematic representation proposed in the invention device,

figure 2 - image of electronography of figure 1,

figure 3 is another image collimation-detector system of figure 2.

Figure 1 shows the irradiated object 1, which is an x-ray camera 2 control x-ray machine 3. Inside the x-ray camera 2 is adjustable by the position of electromagnet 10. This electronography 10 consists of collimation-detector system 11 and the source 12 of x-ray radiation. Collimation-detector system 11 is oriented in the x-ray beam FX'. which preferably is a narrow primary beam emitted from the specified source 12 of x-ray radiation, which is preferably positioned in the x-ray camera 2 under the conveyor 4. Collimation-detector system 11 is made adjustable in position with the possibility of simultaneous displacement height in the lateral direction (in the directions Z and Y), which provides not shown in more detail device 5. Together with this, the source 12 of x-ray radiation is also made adjustable in the lateral direction the AI can move in the Y direction, what is the device 6 on which it is mounted. Directional movement collimation-detector system 11 source 12 of x-ray radiation occurs synchronously, which provides centralized management of devices 5 and 6, for example rectilinear guides driven by a lead screw. This motion can coordinate not shown in the drawing, the computer. Irradiated object 1 with items 7, 8 is located on the conveyor 4.

Figure 2 depicts electronography 10.

The collimator 13 has a circular slit 15, which has the shape of a truncated cone and which is designed to pass only the portion of the scattered radiation coming from a controlled point G_M7item 7 in the object that falls under a certain angle θ_M. Thus, the scattered radiation FX", coming at an angle scattering θ_Mregisters are located behind the collimator 13 and the detector 14, and it is sensitive to the energy of the radiation surface 14.1. To obtain the primary beam FX' in front of the source 12 of x-ray radiation from the aperture 16, for example a point aperture.

In the fall of the primary beam FX' on the material the beam FX'. as is known, partially deflects the material lattice (Bragg's law) and uhodit of material in the form of scattered radiation FX". As a result, the energy spectrum obtained is sensitive to the energy of the radiation detector 16, it is possible to determine the crystal structure of the material, and thereby to identify the substance. In this way it is possible, in particular, to distinguish well as explosives.

If on the lower level of control known location information, for example, items 7 and 8 on two spatial coordinates (for example, the position of the conveyor belt and angle), then the missing coordinate is needed in each case to determine continuous scanning with the measuring passage. To this end, the conveyor 4 and collimation-detector system 11 each time transferred to the initial position corresponding to the subject 7. It starts with measuring the passage, which consists in moving said system 11 in height and, if necessary, to the side synchronously with the source 12 of x-ray radiation in the direction of the missing coordinates. The signals are perceived by the detector during the measurement pass, stored in one or more energy spectra and known compared in the computer with known energy spectra. This allows the comparison to determine the type of material, especially material explosives.

If the position of prewar the tion of certain points of G _M7and G_M8a three-dimensional position is known, collimation-detector system 11 and the source 12 of x-ray radiation electronography 10 sequentially shifted to the point G_M7and G_M8. Say no to crystal lattice items 7 or 8 diffuse radiation FX source 12 of x-ray radiation is captured in a circular slit 15 of the collimator 13. Additional moving collimation-detector system 11 while the corresponding measurement is not necessary.

There is also the possibility to combine the information about the coordinates obtained on the lower level of control, with additional spatial information obtained at the higher level of control, expanding it if necessary through the use of several measuring passageways, and thus to determine the amount and exact spatial location, for example, the object 8 object 1.

The preferred embodiment of the collimator 13 with a circular slit is presented in figure 3. In the collimator 13 is preferable to provide a Central blind hole 17. Blind end of the hole 17 is located on the set behind him detector 14. The hole 17 is first detector unit 21, followed at a certain distance from it - the second detector unit 22. the first detector unit 21 is designed as detector for lower and the second detector unit 22 is in the form of a detector for higher energy x-rays. With this design using this collimator 13 can, for example, in addition to carry out normal detection materials by determining the average value of the charge on the nucleus of the atoms of the material of the object 7 or 8. Combining the specified value of the charge on the nucleus with the obtained energy spectrum allows for more reliable identification of the material items 7 or 8. This possibility is of particular importance especially in cases where items 7 or 8 contain material with high absorption capacity. Thus, in particular, often lower energy Central beam FX' is absorbed by this material, resulting in the measured energy spectrum no corresponding diffraction lines. Information about their absence, together with the additional material definition can be entered into the computer for inclusion in the comparative analysis.

In addition, the detector blocks 21, 22 that can be performed, for example, in the form of a quadrant detector, allow high-precision spatial bridging (align) collimation-detector system 11 to a source 12 of x-ray radiation. The alignment thus produced without the presence of the object 1 between collimation-crystal si is the subject 11 and the source 12 of x-ray radiation. For this purpose, as shown in figure 2, the collimator 13 provides this additional hole 17 with the detector blocks that, for simplicity, in figure 2, detail not shown.

Obviously, in the invention it is possible to make various modifications without going beyond its scope. For example, you can use other electronography 10, such as those known and described in the prior art, it is necessary to provide for the regulation of electronography 10 in position, as, for example, considered in the present description.

1. A device for determining the presence of crystalline and polycrystalline materials of the object in the objects, mostly in the baggage having electron-including collimation-detector system consisting of collimators and detectors, and focused on her x-ray source, wherein collimation-detector system (11) is adjustable in its height position relative to the source (12) of the x-ray radiation by means of suitable devices (5) and the possibility of simultaneous regulation of its lateral position with the x-ray source, which source (12) x-rays made with the possibility of a directional move in the lateral direction is by using a tool (6), and management of these devices (5, 6) is carried out by the computer.

2. The device according to claim 1, characterized in that collimation-detector system (11) consists of a collimator (13) and located behind the detector (14), the collimator (13) has a conically expanding circular slit (15), reproducing a given angle (θ_Mand focused on the detector (14).

3. The device according to claim 2, characterized in that the collimator (13) has a Central blind, closed side of the detector (14) hole (17)in which at a certain distance from each other consistently, there are two detector unit (21, 22).

4. The device according to claim 3, characterized in that the first detector unit (21) is designed as detector for the lower, and the second detector unit (22) is designed as a detector for high energy x-rays.

5. The device according to claim 2, characterized in that collimation-detector system (11) is oriented hole (17) primary beam (FX') from a source (12) of x-ray radiation.