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IPC classes for russian patent (RU 2253861):
G01N23/207 -
Another patents in same IPC classes:
/ 2253861
/ 2265830
/ 2314517
Sheet of steel 01x18h9t Sheet of steel 01x18h9t / 2356992
Invention relates to metallurgy field and can be used for manufacturing of tanks of liquefied gas, low-temperature and cryogenic equipment, facilities for receiving of liquefied gas, rocket envelopes and tanks for keeping of propellant from steel 01X18H9T. Steel sheet is subject to effect of penetrating radiation. Integral width X-ray line 111, measured on characteristic radiation CoKα with overlapping probability 2.18·10-5, is 0.204±0.003 angular degree.
Method of determining local concentration of residual microstress in metals and alloys Method of determining local concentration of residual microstress in metals and alloys / 2390763
Method of determining local concentration of residual microstress in metals and alloys localised in micro-regions of the order of 1 micrometre involves obtaining an intensity distribution curve of the interference line of indices in long-range orders - large Vulf-Bragg angles on the X-ray diffractometre for the analysed material in point by point calculation mode or in diffractogram recording mode. The diffractogram is processed: drawing the background line, determination of the position of the 2θmax position and drawing the medial line. The area of cut off peripheral sections (S1 and S2) and the total area (Stot) of the diffractogram are measured. The local concentration value of residual microstress ratio (δ%) is then determined using the expression
Adjustable device for irradiation and detecting radiation Adjustable device for irradiation and detecting radiation / 2403560
Adjustable device for irradiation and detecting radiation has a neutron source or a neutron source combined with other radiation sources, a system of robots and a mobile surface (10) connected to a main shaft (11) which is actuated mechanically, electrically or manually, and also raises and lowers a first platform (12) joined to it, on which a second platform (13) is mounted, wherein the second platform (13) can move by sliding relative the platform (12) in the direction of x and y axes through mechanical reducing gears and guides which are controlled manually or electrically, wherein the system of robots comprises three robots placed on the second platform (13) with possibility of moving on a given path and realisation of a virtual goniometre, wherein during movement of the robots on the given path, the system of robots creates conditions for viewing from different positions of radiation coming from the properly irradiated sample which is mobile or fixed.
Method for structural inspection of semiconductor multilayer structure (variants) Method for structural inspection of semiconductor multilayer structure (variants) / 2442145

FIELD: structural diagnostics.

SUBSTANCE: sample is scanned in the context of the Bragg reflection with the use of Ω-method in the roentgen diffractometry single-step mode, furthermore, for multilayer structures with heterogeneous composition AlGaN/GaN with nanometric layers the roentgen single-crystal diffractometry is used with the power of 5-15 W and heterochromatic quasiparallel X-ray beam and a position-sensitive detector with an angular width of 10°-15°. At first the X-ray tube is fixed in the position of Bragg reflection for the crystallographic plane (0002) of the layer GaNm the samples are scanned via inclining the X-ray tube in the angular range lying on the left and on the right from the main diffraction maximum (0002) of the GaN layer and including all diffraction maximums of AlxGa(1-x)N/GaN structures, where x ranges from 0,1 to 0,9, and the single-step scanning is carried out by setting the X-ray tube consequently in several angular positions which correspond to the maximum reflection of each minor peak point, while recording the diffractogram with the same exposition for all minor peak points, and the exposition time ranges from 30 to 100 seconds.

EFFECT: resolution of interference peaks corresponding to separate nanometric layers of semiconductor structures; use of low-capacity devices becomes possible.

3 cl, 3 tbl, 6 dwg

X-ray diffraction apparatus and x-ray diffraction method X-ray diffraction apparatus and x-ray diffraction method / 2449262
X-ray diffraction apparatus has a mirror (18), having a reflecting surface (19) which is formed such that the angle in the plane parallel to the diffraction plane between the tangential line (38) of the reflecting surface (19), at any point on the reflecting surface (19), and the linear section (36) which connects any point and a sample (26) becomes constant and the crystal lattice plane which causes reflection is parallel to the reflection surface (19) at any point on the reflection surface (19); the X-ray detector (20) is one-dimensional, position-sensitive in the plane parallel to the diffraction plane; and the relative position of the mirror (18) and the X-ray detector (20) is defined in the plane parallel to the diffraction plane such that reflected X-ray beams (40) from different points on the reflecting surface (19) of the mirror (18) reach different points on the X-ray detector (20), respectively.
Method of quantitative determination of portland cement clinker phase composition Method of quantitative determination of portland cement clinker phase composition / 2461817
Polished section is premade from Portland cement clinker to reveal phase present in said section under microscope. Thereafter, phase compositions are compared to correct phase composition defined from X-ray diffraction spectrum of phases revealed in minor quantities. Then, relationship between two alite monoclinic modifications are defined. Said alite is contained in clinker in major amount. Said modifications are defined by analysing asymmetry of superimposed reflections in the range of angles 2θCu=31.5-33°. Then, Ritweld method is used to define quantitative content of all revealed phases by, first, one monoclinic modification. Then, it is defined by second monoclinic modification. Now, defined is quantitative content of all phases in the range of their mean content and that obtained from monoclinic modification present in major amount.
Method and device for performance of x-ray analysis of sample Method and device for performance of x-ray analysis of sample / 2506570
Use: for performing X-ray analysis of the sample. The invention consists in the fact that irradiation is performed with X-rays from a sample source of polychromatic X-ray radiation, a combined device is used for recording of XRD and XRF, comprising a scanning wavelength selector and at least one X-ray detector dedicated for registration of X-rays selected by the wavelength selector, and performing XRD-analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample, using a scanning wavelength selector and recording the selected X-ray fixed wavelength (wavelengths) on one or more values of the angle of diffraction φ of the sample using the detector (s) of X-ray radiation, and/or performing XRF-analysis of a sample by scanning the wavelengths of X-rays emitted from the sample, using a scanning wavelength selector and registration of the scanned x-ray wavelengths, using the detector (s) of X-radiation.

 

The present invention relates to a device for the detection of unresolved objects in the objects, mostly in the baggage, as well as to a method for the detection of such objects by means of x-ray radiation.

In order to ensure safety, for example, air transport baggage included with this baggage items must be controlled primarily by the presence of explosives, which employs the most modern technical means. To this end, the object (baggage) is, as a rule, two or more speed control, while at the first level of control often include the use of high-speed x-ray system that is designed for large volume of checked baggage. In the presence of inside storage of materials that are not amenable to unambiguous identification, conducted additional tests on the second level of control.

To this end, as described in DE 4406956 C2, for fast control on the second, higher, level control using a computer specifically define multiple coordinate those areas that were not clearly defined on the lower, first, speed control, and this information is forwarded to the second, higher, level of control.

To search for explosives can be, in particular, and the used x-ray diffraction analysis, in which measure the ambient crystal structure x-ray emission and compare it with characteristic energy spectra, for example, various explosives, which allows on the basis of a specified dimension of energy to make a conclusion about the presence in the object explosives, and the material of the explosive.

In DE 19510168 A1 describes the appropriate device. In this unit on the x-ray source set aperture, which is formed fan-shaped beam of x-rays directed to the controlled area of the scanned material. In the controlled area in front of the x-ray source symmetrically with the axis of the Central x-ray beam in the plane perpendicular to the fan-shaped beam of x-rays, are slit collimators. X-ray emission is detected throughout irradiated controlled area multiple detectors.

In EP 0354045 A2 describes a device and method, which also provides for the formation of a fan-shaped beam of x-rays. When scanning the inspected object this fan-shaped beam of x-rays giragira on the crystal lattice of the object that is registered in the form of the energy spectrum multiple detectors.

Another device is described in about US 4956856. This device is formed by a narrow beam of x-rays, which is a rotating disk with a spiral slit is directed to the irradiated object. This slit narrow beam moves to the object being examined in the transverse direction.

Use in x-ray primary beam of small cross-section is described in DE 4101544 A1. When this scattered radiation of the primary beam is logged multiple detectors and concentric collimator system.

The disadvantage of the above devices is that for all not permitted for carriage of baggage scanning is always exposed to all the baggage entirely.

From DE 4130039 A1 is known a system for forming an extruded beam of x-rays. Used for this purpose, the diaphragm consists of two limiting elements, which are oriented relative to each other in such a way as to limit the amount that corresponds to the shape of the beam. This system is designed to increase covered by x-ray radiation surface area.

Based on the foregoing, the present invention was based on the objective to develop a method for fast and automatic detection is not permitted for carriage of baggage inside of the detector device, and once abotut a corresponding device for implementing this method.

In the proposed method of detection of unauthorized items, which uses a detector device with a lower level of control at which the object is present at least in two-dimensional coordinate system, the above problem is solved due to the fact that on the lower level of control, irradiated, which is considered an unresolved item define and injected into the memory in the form of the local zone in a controlled object, described in the coordinate system of at least two coordinates, the coordinates that describe the position of this local zone is passed to a higher level control peripheral devices and not clearly identified the subject then subjected to targeted direct control carried out by using x-ray diffraction analysis.

In the implementation of the proposed method one of the coordinates describing the position of the above-mentioned local area, can be determined using the detector that registers propagating along the respective paths of the beam is fan-shaped beam of x-rays on the lower level of control, and the second coordinate is based on the initial position of the conveyor belt to be registered upon receipt of the object on a higher level of control. If the higher is the second stage of control to use adjustable by the position of the electron - it can be put directly on specified using the lower level control of the local area and to move along a particular at this lower level control pathways in height and, if necessary, to the side. Occur when the detection subject of the scattered radiation is converted in the analyzed signal, which is sent for processing and analysis.

With additional fan-shaped beam of x-rays on the lower level of control may determine the third coordinate describing the position of the local area. In this case, if a higher level of control to use adjustable by the position of the electron-it can bring directly described by the three coordinates of the point. Scattered radiation arising at this point, is converted in the analyzed signal, which is sent for processing and analysis.

The proposed device for detecting unauthorized items has a detector device with a lower degree of control that contains the x-ray source, the detector unit, as well as conveyor and a marking unit, with the detector unit and the marking unit electrically connected to the computer. In this device, the above-mentioned problem is solved due to the fact that the x-ray source and d is tectorum unit, implement a lower level of control, is electron-implements a higher level of control and electrically connected with the computer.

While the basic idea of the invention is to split the whole process into several stages and pre-scan controlled Luggage on the lower level of control in the detector device, so that on the basis of one local area/the local point or more local zones/local points defined on the lower level of control described by two or three coordinates, to perform at a higher level of control in the detector device targeting is considered(-s) is not permitted(s) for carriage subject(s) of Luggage in each of these established local zones. Thus there is no need to scan the entire piece, which saves time and allows you to expose the object to the impact of lower doses. At a higher level of control on the basis of information about a specified described the local area, respectively, on the above described local zones is determined by the type of material using x-ray diffraction analysis. Thus, the second higher level of control allows you to create at the airport effective means for rapid is th, simple and at the same time automatic baggage inspection.

Achieved a specified result, due to the fact that on the lower level of control based on the position of the conveyor belt, respectively, of the object and the detector, controlling piece, determine the appropriate point at which it starts to work located on a higher level of control electronography.

Electronography can have another x-ray source and located at a higher level of control collimation-detector system, which is focused on the x-ray source and has an adjustable height position relative to the x-ray source using the appropriate devices and the possibility of simultaneous regulation of its lateral position with the x-ray source, for which the x-ray source can be made with the possibility of a directional move in the lateral direction using appropriate tools and managing all of these devices be carried out by the computer.

The device may be a conveyor that moves the object in the longitudinal direction, thereby scanning the object b is of plaster in this particular point using x-ray diffraction analysis.

With adjustable position electronography on the basis of two known coordinates to scan the subject of baggage by the third coordinate, or on the basis of three known coordinates to measure only one local point. To this end, electronography or suggest defined as the X coordinate position of the conveyor belt and move the height and respectively in the lateral direction during the propagation of rays, either directly bring upon this point.

This height-adjustable collimation-detector system preferably consists of a collimator and located behind the detector. The collimator may have a conically expanding circular slit reproducing a given angle and oriented x-ray radiation sensitive surface of the detector.

At a higher level of control can be further determine the exact spatial location and dimensions of the object in the object, for example, not permitted subject to baggage, i.e. the coordinates of the object X, Y and Z.

At the next stage, knowing diffraction spectrum and additionally determined by the average value of the charge on the nucleus of atoms of type of material, you can get additional information to identify this material. To this end, the collimator with a circular slit pre is provided a Central blind hole, in which at a certain distance from each other consistently, there are two detector unit and with which in a known manner determined by the average value of the charge on the nucleus of atoms for the primary beam of the object.

The first detector unit can be designed as detector for the lower, and the second detector block for higher energy x-rays. In addition, collimation-detector system can be oriented first detector unit and the second detector unit to the primary beam from the x-ray source.

Preferably the lower and higher levels of control are in General the detector device at the second stage of control.

Below the invention is explained in more detail on the example of one of the variants of its implementation with reference to the accompanying drawings on which is shown:

figure 1 - simplified diagram of scanning the object with the objects in x-ray camera on the lower level control peripheral devices,

figure 2 - schematic representation proposed in the invention device at a higher level of control,

on figa image collimation-detector system shown in figure 2,

on figb diagram explaining the principle of operation of the system shown in figure 2,

on Fig - the image in the future peripheral devices, basic elements of which are shown in figures 1 and 2,

figure 4 is another diagram collimation-detector system shown in figure 2.

As you know, on the first (or lower) level of control is not shown in more detail the control system baggage 5 (object) checks for the presence of important from the point of view of safety material. Upon detection of such suspicious material of the object 5 is supplied to re-verify and determine the type of material suspicious items 6 and/or 7 of baggage on the second (or higher) level of control. These speed control, as is known, spatially separated from each other. Therefore, in this case mainly considered the second stage of control, which is determined by the material type.

At the second stage (the detector device 30) is provided preferably two levels of control, namely 30.1 and 30.2, with a lower level of control indicated by the position 30.1, and a higher level of control indicated by the position 30.2.

Figure 1 presents a lower level of control.

The object 5 is placed in a known x-ray camera 1 lower level 30.1 control detail not shown in the drawing, the detector device 30. Inside the x-ray camera 1 are, nab is emer, An l-shaped detector unit 2, a conveyor 3 that serves as a base horizontal plane, and the source 4 x-ray radiation, is placed on the side. Source 4 x-ray radiation is preferably situated above the conveyor 3 and opposite the detector unit 2. On the conveyor 3 is irradiated object 5 items 6, 7. The detector unit 2 has several individual detectors D1-nwith the help of which as usual is determined by the type of material. To simplify the detectors D1-nshows only a small length of the plot. To determine the material source 4 x-ray radiation in a known manner is formed preferably fan-shaped beam FX x-rays. This beam, preferably having a narrow cross-section, x-rayed x-ray camera 1, and thus the test object 5. G-shape detection unit 2 and the individual location and orientation of the individual detectors D1-nprovide drop x-ray FX1-nfan-shaped beam of these rays are at right angles to each detector D1-n. In other embodiments can also be applied several fan-shaped beam of x-rays of different energies and/or different orientation.

When one or more items 6, 7 on testwuide the way of a 1-ndistribution of x-rays FX1-nis the weakening of these x-ray FX1-nthat the registered number is located on the way of a1-ndistribution ray detectors D1-n.

Figure 2 schematically shows a higher level 30.2 control. In this case, the object 5 on the conveyor 3, the incoming preferably with the lower level of 30.1 control, moves on to a higher level 30.2 control of the detector device 30 having an adjustable position electronography 10. This electronography 10 consists of collimation-detector system 11 and the source 12 of x-ray radiation. Collimation-detector system 11 is oriented in the x-ray beam FX’, which preferably is a narrow primary beam emitted from the specified source 12 of x-ray radiation, which is preferably positioned in the x-ray camera 2 under the conveyor 4. Collimation-detector system 11 is made adjustable in position with the possibility of simultaneous displacement height in the lateral direction (in the directions Z and Y), which provides not shown in more detail fixture 13. Together with this, the source 12 of x-ray radiation is also made adjustable in the lateral direction can be moved in direction is Y, what is the device 14 on which it is mounted. Directional movement collimation-detector system 11 and the source 12 of x-ray radiation occurs synchronously, which provides centralized management of devices 13 and 14, for example rectilinear guides driven by a lead screw. This motion can coordinate details not shown in the drawing, the computer 31.

On figa more detail the preferred embodiment of shown in figure 2 collimation-detector system 11, designed for x-ray diffraction analysis.

The collimator 15 has a circular slit 18, which has the shape of a truncated cone and which is designed to pass only the portion of the scattered radiation coming from a controlled point of an object that falls under a certain angle θM. This scattered radiation is captured x-ray radiation sensitive surface 16.1 established by the collimator of the detector 16. In the center of the collimator 15 is a blind hole 17, which is provided in case collimation-detector system 11 will have to take on additional functions (described below).

On figb in simplified form illustrated the principle of x-ray diffraction analysis. Position 12 is bonacin the x-ray source, shown in figure 2. To obtain the primary beam FX’ in front of the source 12 of x-ray radiation of the aperture 20, for example a point aperture. Above the source 12 of x-ray radiation is the conveyor 3, which is the object 5. In the fall of the primary beam FX’ on the material the beam FX’, as it is known, partially deflects the material lattice (Bragg's law), and exits the material in the form of scattered radiation FX’. As a result, the energy spectrum obtained is sensitive to the energy of the radiation detector 16, it is possible to determine the crystal structure of the material, and thereby to identify the substance. In this way it is possible, in particular, to distinguish well as explosives.

Figure 3 in perspective showing the entire detector device 30, including the most important details of figure 1 and 2 more clearly shows the devices 13 and 14.

In this example, for illustrative purposes in joint consideration of schemes 1-3 are described in more detail only the control item 6.

Upon receipt of the object 5 on the lower level 30.1 control not shown in detail marker unit in the computer memory 31 is introduced first label of X1characterizing the position of the conveyor belt and the start of the object 5. Such marking of components which can serve as an optocoupler. Upon further movement of the object 5 in the memory are written to the subsequent provisions of the conveyor belt, as defined, for example, by counting picture elements (pixels). Upon detection of the object 6 in the memory is entered corresponding to so-called initial position XAGthe conveyor belt, while together with the recorded tape positions advanced in the same or another memory of the computer 31 also receives signals from the detectors D266-275registering a decrease of the energy of radiation, and the corresponding data paths and1-ndistribution of rays.

On the basis of the stored information by the image processing system according to special criteria to determine "typical" local area GM. This zone can be described by two coordinates, and the X coordinate is determined on the basis of the stored position data XAGthe conveyor belt, and the Y coordinate is determined by controlling the detector D270and it is equal to YG. Data related to the detector D270path and270the distribution of rays is also stored in memory. When describing a local point of GMthree spatial coordinates, for example, using additional areas of radiation and applying the additional detector system is s on the lower level of 30.1 control preferably is determined by the average point-margined surface of the subject 6, lying within the fan-shaped beam FX1-nrays, and the specified point average is determined in this case, XGM, YGMand ZGM. This operation is also performed in the computer 31, and its results are stored in it.

The computer 31 transmits the specified data to a higher level 30.2 control of the detector device 30.

After that electronography 10 at the higher level control is moved in accordance with the coordinates of the local area or local points of GMtransferred from the lower level of 30.1 control to a higher level 30.2 control.

If there are two known coordinates of the local area GMelectronography 10 preferably moves in a certain subject to 6 the initial position of XAGthe conveyor belt. Then collimation-detector system 11 is moved parallel to the direction of a270i.e. synchronously moved in height and in the lateral direction, along the line a270selectively logged energy scattered by the subject of radiation. Accordingly, the source 12 of x-ray radiation synchronously moved in the horizontal direction.

Characterizing the change in energy signals accumulate, forming one or optionally several consecutive time the energy is their spectra, that also allows you to spatially distinguish the material, the measurements are carried out along the line a270.

Spectra have been obtained in a known manner are compared in the computer 31 with known energy spectra. This comparison allows to determine the type of material, in particular the presence of explosives.

In the presence of three well-known spatial coordinates of the local points of GMdefined on the lower level of control, the subject 6 is moved to a predetermined position XGMthe conveyor belt, and collimation-detector system 11 and the source 12 of x-ray radiation electronography 10 is transferred to the local point of GMso at this point, GMcircular slit collimator 18 15 caught diffuse radiation FX’ from a source 12 of x-ray radiation, say no to crystal lattice of the subject 6. In this case there is no need for moving the system to determine the material type.

There is also the possibility to combine the information about the coordinates obtained on the lower level of control, with additional spatial information obtained at the higher level of control, expanding it if necessary through the use of several measuring passages, and such education is to determine the amount and the exact spatial location of the object 6 in the object 5.

The preferred embodiment of the collimator 15 with a circular slit is presented in figure 4. In the collimator 15 is preferable to provide a Central blind hole 17. In this opening 17 is first detector unit 21, followed at a certain distance from it - the second detector unit 22. The first detector unit 21 is designed as detector for the lower, and the second detector unit 22 is in the form of a detector for higher energy x-rays. With this design using this collimator 15 can, for example, in addition to carry out normal detection materials by determining the average value of the charge on the nucleus of the atoms of the material of the object 6. Combining the specified value of the charge on the nucleus with the obtained energy spectra allows you to more reliably identify the material of the object 6. This possibility is of particular importance especially in cases where the subject 6 contains a material with a high absorption capacity. Thus, in particular, often lower energy Central beam FX’ is absorbed by this material, resulting in the measured energy spectrum no corresponding diffraction lines. Information about their absence, together with the additional material definition can be entered into the computer 31 to account for them against the positive analysis.

In addition, the detector blocks 21, 22 allow high-precision spatial bridging (align) collimation-detector system 11 to a source 12 of x-ray radiation. The alignment thus produced without the presence of an object between 5 collimation-detector system 11 and the source 12 of x-ray radiation.

Obviously, in the invention it is possible to make various modifications without going beyond its scope. So, for example, the steps 30.1 and 30.2 of control, you can perform the individual, so in this case, on the lower level of control as the first stage will be determined describing the local area or point coordinates, which will be transmitted at a higher, in this case, the second stage of control, it is necessary to ensure the transfer of certain first speed control coordinates on the second stage of control without distortion of information about the position of this zone or point. In addition, you can use other electronography 10, such as those known and described in the prior art, it is necessary to provide for the regulation of electronography 10 in position, as, for example, considered in the present description.

1. Method detection using x-ray unresolved objects in the objects, mostly in the baggage, with p the power of the detector device with a lower degree of control, on which the object is present at least in two-dimensional coordinate system, characterized in that on the lower level (30.1) control irradiated, which is considered an unresolved item (6, 7) define and put in memory in a local area (GMin the controlled object (5)described in the coordinate system of at least two coordinates, the coordinates that describe the position of this local zone (GM), is passed to a higher level (30.2) control detector device (30) and then not clearly identified the subject (6, 7) is subjected to targeted direct control carried out by using x-ray diffraction analysis.

2. The method according to claim 1, characterized in that one of describing the specified position coordinate (Y) is determined using the detector (D1-nwhich registers propagating along the respective paths (a) the beam is fan-shaped beam (FX) x-rays on the lower level (30.1) control, and the second describing the specified position coordinate (X) is determined on the basis of the initial position (XAG) of the conveyor belt to be registered upon receipt of the object (5) to a higher level (30.2) control.

3. The method according to claim 1, characterized in that the third describing the specified position coordinate (Z ) is determined using an additional fan-shaped beam of x-rays on the lower level (30.1) of the control.

4. The method according to claim 2, characterized in that at the higher level (30.2) control is adjustable by the position of electromagnet (10), which lead directly to the one described by using the lower level (30.1) control local zone (GMand move along a particular at this lower level (30.1) of the control path (a) distribution of height and, if necessary, to the side, thus resulting in the detection of the object (6, 7) diffuse radiation (FX) transform in the analyzed signal, which is sent for processing and analysis.

5. The method according to claim 3, characterized in that at the higher level (30.2) control is adjustable by the position of electromagnet (10), which lead directly to the one described by three coordinates (XGM, YGM, ZGM) point (GM)arising in which the scattered radiation (FX) transform in the analyzed signal, which is sent for processing and analysis.

6. The method according to any one of claims 1 to 5, characterized in that on the basis of the coordinate information within the higher level (30.2) control determines the local location and dimensions of the subject (6, 7) in the object (5).

7. The method according to claim 4 or 5, characterized in that through the favor is its inside electronography (10) detector blocks (21, 22) further define the average value of the charge on the nucleus of the atoms of the material of the object (6, 7).

8. Device for the detection of unresolved objects in the objects, mostly in the baggage with the detector device with a lower degree of control that contains the x-ray source, the detector unit, as well as conveyor and a marking unit, with the detector unit and the marking unit electrically connected to a computer, characterized in that the source (4) x-ray radiation and the detector unit (2)that implement the lower level (30.1) control, is electronography (10)that implements higher (30.2) the degree of control and electrically connected with the computer (31).

9. The device according to claim 8, characterized in that electronography (10) has another source (12) of x-ray radiation and collimation-detector system (11), which is focused on this source (12) of x-ray radiation and which has an adjustable height position relative to the source (12) of the x-ray radiation by means of suitable devices (13) and the possibility of simultaneous regulation of its lateral position with the x-ray source, which source (12) x-rays made with the possibility of directional peremesheniya lateral direction using a suitable device (14), and management of all these devices (13, 14) is carried out by the computer (31).

10. The device according to claim 9, characterized in that collimation-detector system (11) consists of a collimator (15) and located behind the detector (16), the collimator (15) has a conically expanding circular slit (18), reproducing a given angle (θMand oriented x-ray radiation sensitive surface (16.1) of the detector (16).

11. The device according to claim 10, characterized in that the collimator (15) has a Central blind hole (17)in which at a certain distance from each other consistently, there are two detector unit (21, 22).

12. The device according to claim 11, characterized in that the first detector unit (21) is designed as detector for the lower, and the second detector unit (22) is designed as a detector for high energy x-rays.

13. The device according to claim 11 or 12, characterized in that collimation-detector system (11) focus detector unit (21) and the detector unit (22) primary beam (FX’) from a source (12) of x-ray radiation.

 

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