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Ultra-high-speed parallel analogue-to-digital converter with differential input

Ultra-high-speed parallel analogue-to-digital converter with differential input
IPC classes for russian patent Ultra-high-speed parallel analogue-to-digital converter with differential input (RU 2518997):
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FIELD: radio engineering, communication.

SUBSTANCE: disclosed is an ultra-high-speed parallel analogue-to-digital converter with a differential input, having N sections of identical architecture. Each of the sections includes a voltage comparator, the first input of which is connected to a first input voltage source through a first reference resistor, and the second input of the voltage comparator is connected to a second input anti-phase voltage source through a second reference resistor, wherein the first input of the voltage comparator is connected to a first reference current source and a first parasitic capacitor, the second input of the voltage comparator is connected to a second reference current source and a second parasitic capacitor. The first reference current source is connected in form of a first current mirror which is matched with a first power supply bus, and a first auxiliary reference current source connected to the input of the first current mirror, wherein the output of the first current mirror is the output of the first reference current source, and the second input anti-phase voltage source is connected to the input of the first current mirror through a first balancing capacitor.

EFFECT: multifold expansion of the frequency range of processed analogue-to-digital converter signals by reducing the transmission error of input differential voltages from input voltage sources to voltage comparator inputs.

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The present invention relates to the field of measurement and computer engineering, radio engineering, communications and can be used in the structure of different processing devices analog information, measuring instruments, systems, telecommunications, etc.

In the modern technology have found an extensive use of parallel analog-to-digital converters (ADCS)that provide the highest conversion speed analog signals (uIdigital signals [1-27]. With increasing frequency of the input voltage uIin such microelectronic ADC substantial conversion error due to the influence of parasitic capacitors formed by the containers on a substrate of active and passive components [28-29]. A further increase in speed parallel ADC is one of the problems of modern information and measuring equipment, which will enable the practical implementation of new communication and telecommunication systems with higher quality characteristics.

Closest to the technical nature of the claimed device is parallel ADC of Fig. 1 described in the patent US 7.394.420, fig.3, fig.4. Analysis of the limiting frequency range (fvmag), as well as attempts to increase the fvmagby optimizing the absolute values of the reference resistance through the stores, articles [28-29], including co-author of this application [29].

ADC prototype contains N identical architecture sections (figure 1). Each section contains a voltage comparator 1, the first 2 input connected with the first 3 source of input voltage through the first 4 reference resistor 5 and the second input of the voltage comparator 1 is connected to the second 6 source antiphase input voltage 7 through the second reference resistor, and the first 2 input of the voltage comparator 1 is connected with the first 8 reference current and the first 9 of the parasitic capacitor, the second 5, the input of the voltage comparator 1 is connected with the second 10 reference current 11 and the second parasitic capacitor.

A significant disadvantage of the ADC prototype (figure 1), schema, one section of which is shown in Fig. 2, is that it limits the frequency range conversion analog input signals to digital (even when implemented on microwave transistors with fmax=200 GHz process SGB25H1, IHP, Germany [28, 29]) is limited due to decrease at high frequencies the gain of the signal with the ADC inputs to the inputs of voltage Comparators.

The main objective of the present invention is to increase several times the frequency range of the processed signals of the ADC by reducing the errors of the transmission input diff the account of the differential voltages from input voltages of 3 and 6 to the inputs of the voltage Comparators 1.

This object is achieved in that in a parallel analog-to-digital Converter with a differential input (figure 1), each of the N sections (figure 2) contains a voltage comparator 1, the first 2 input connected with the first 3 source of input voltage through the first 4 reference resistor 5 and the second input of the voltage comparator 1 is connected to the second 6 source antiphase input voltage 7 through the second reference resistor, and the first 2 input of the voltage comparator 1 is connected with the first 8 reference current and the first 9 of the parasitic capacitor, the second 5, the input of the voltage comparator 1 is connected with the second 10 the reference current 11 and the second parasitic capacitor, there are new elements and connections of the first 8 reference current is performed in the first 12 current mirror that is consistent with the first 13 bus power source 14 and the first auxiliary reference current connected to the input of the first 12 of the current mirror, and the output of the first 12 of the current mirror is the output of the first 8 of the reference current and the second 6 the input phase voltage is connected to the input of the first 12 of the current mirror through the first 15 correction capacitor.

Figure 1 shows a diagram of the ADC prototype, which contains N-parallel connected sections with the same architect is the established levels (figure 2), but different absolute values of the resistance of the reference resistor 4 (7) and current I8(I10sources of reference currents 8 (10).

In Fig. 2 shows the equivalent circuit of one section of the ADC of Fig. 1, the corresponding ADC prototype.

In Fig. 3 shows a diagram of one of the sections of the proposed ADC, the corresponding PP. 1, 2 claims.

In Fig. 4 shows the equivalent circuit of the inventive ADC in Cadence environment models SiGe transistors (npn 200-n; the process SG25H1, IHP, Ccah = 4 mA. A high-performance 0.25 µm technology with npn-HBTs up to fT/fmax=180/220 GHz.), taking into account the parasitic capacity of the real current mirrors, capacitance to the substrate of the passive components and the input capacitance of the voltage Comparators 1 on the basis of real differential cascades.

In Fig. 5 shows the logarithmic amplitude-frequency characteristic of the gain from input voltages of 3 and 6 to a differential comparator input # 2 (channels: 32, 48) of the ADC circuit of Fig. 4.

In Fig. 6 shows the logarithmic amplitude-frequency characteristic of the gain from input voltages of 3 and 6 to a differential comparator input # 2 (channels: 32, 48) of the ADC circuit of Fig. 4. In this scheme:

- takes into account the capacitance to the substrate of the reference resistors 4 and 7;

consistently with each correction capacitor 15 and 18 Cthe included additional resistor R=50 Ohm;

- parasitic output capacitance of the current mirrors 12 and 16 has a relatively small value Withn=70 FF;

in the scheme used real Comparators voltage 1 (differential cascades) with the parasitic capacitances of their transistors.

In Fig. 7 shows the logarithmic amplitude-frequency characteristic of the gain from sources of stress 3 and 6 to a differential comparator input # 2 (channels: 32, 48) of the ADC circuit of Fig. 4. In the circuit of Fig. 4:

- takes into account the capacitance to the substrate of the reference resistors 4 and 7;

- consistently with the capacity of each corrective capacitors 15 and 18 (Cto) included an additional resistor R=50 Ohm;

- parasitic output capacitance of the current mirrors 12 and 16 has a high value Withn=300 FF;

- used real Comparators voltage 1 (differential cascades) with the parasitic capacitances of its transistors.

Ultrahigh-speed parallel analog-to-digital Converter with a differential input contains N identical architecture sections of Fig. 3. Each section includes a voltage comparator 1, the first 2 input connected with the first 3 source of input voltage through the first 4 reference resistor 5 and the second input of the voltage comparator 1 is connected to the second 6 source input about ilopango voltage through the second 7 reference resistor, the first 2 input of the voltage comparator 1 is connected with the first 8 reference current and the first 9 of the parasitic capacitor, the second 5, the input of the voltage comparator 1 is connected with the second 10 reference current 11 and the second parasitic capacitor. The first 8 reference current is performed in the first 12 current mirror that is consistent with the first 13 bus power source 14 and the first auxiliary reference current connected to the input of the first 12 of the current mirror, and the output of the first 12 of the current mirror is the output of the first 8 of the reference current and the second 6 the input phase voltage is connected to the input of the first 12 of the current mirror through the first 15 correction capacitor. The state of the outputs of the voltage Comparators is judged on the digital equivalent of the input signal.

Figure 3, in accordance with claim 2, the second 10, the reference current is made in the form of 16 second current mirror that is consistent with the first 13 bus power source, and the second 17 auxiliary source of reference voltage connected to the input 16 second current mirror and the second output 16 of the current mirrors is an output of the second 10 of the reference current and the first 3 source of input voltage connected to the input 16 second current mirror 18 through the second corrective condensate is R.

In figure 4, in accordance with section 3 of the claims, consistently with each correction capacitor 15 and 18 includes additional resistors.

Consider the analog sections ADC figure 1, figure 2 and figure 3, including the reference resistors 4, 7, sources of reference voltage 8, 10, the voltage comparator 1.

The ADC prototype figure 1 performance of the analog section figure 2 (limiting the frequency range fvmag) is determined by the parasitic capacitors 9 and 11. Almost upper cutoff frequency (- 1 dB) ADC prototype during its implementation in SiGe technology does not exceed 2-7 GHz (figure 5, 6), while the performance of the comparator 1, implemented on microwave SiGe transistors [28, 29] with fT=200 GHz, allows you to work in a wider frequency range (20÷50 GHz).

In the inventive device of Fig. 3 due to the introduction of new connections limit the operating frequency range of the analog section of the ADC is expanding 2-6 times (figure 5-7). This allows analog-to-digital conversion of the higher frequency signals.

Introduction in series with corrective capacitors 18 and 15 adjustment resistors (figure 4) allows you to optimize the flatness of the amplitude-frequency characteristics of the analog section of the ADC, which creates conditions for further expansion of the frequency range (Fig.6, Fig.7).

the thus, the the inventive device is characterized by significant advantages in comparison with the prototype over the frequency range of the processed signals.

BIBLIOGRAPHIC LIST

1. Patent US 6.437.724 fig.4

2. Patent US 6.882.294

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4. Patent US 4.058.806 fig.2a

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28. Y.Borokhovych. 4-bit, 16 GS/s ADC with new Parallel Reference Network. / Y.Borokhovych, H.Gustat, C.Scheytt // COMCAS 2009-2009 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems

29. Serebryakov A.I. Method of improving performance of a parallel ADC. / Ahikereru, Abbrogated. // Solid-state electronics. Complex functional blocks REA: materials of the scientific-technical conference. - M.: MENTORES them. Popov Central Museum of communications, 2012. - P.150-155.

1. Ultrahigh-speed parallel analog-to-digital Converter with differentia inim entrance each of the N sections of which contains a voltage comparator (1), first (2) an input connected to the first (3) a source of input voltage through the first (4) reference resistor, and the second (5) comparator input voltage (1) is connected to the second (6) the input phase voltage through the second (7) reference resistor, and the first (2) comparator input voltage (1) associated with the first (8) the reference current and the first (9) of the parasitic capacitor, the second (5) comparator input voltage (1) associated with the second (10) the reference current and the second (11) of the parasitic capacitor, characterized in that the first (8) the reference current is made in the form of the first (12) current mirrors, consistent with the first (13) bus power source, and first (14) the auxiliary reference current connected to the input of the first (12) of the current mirror, and the output of the first (12) of the current mirror is the output of the first (8) reference current, and the second (6) input phase voltage associated with the input the first (12) of the current mirror through a first (15) corrective capacitor.

2. Ultrahigh-speed parallel analog-to-digital Converter with a differential input according to claim 1, characterized in that the second (10) the reference current is made in the form of the second (16) of the current mirror that is consistent with the first of the (13) bus power supply, and second (17) auxiliary reference current connected to the input of the second (16) of the current mirror, and the output of the second (16) of the current mirror is the output of the second (10) reference current, and (3) the source of input voltage connected to the input of the second (16) of the current mirror via a second (18) the correction capacitor.

3. Ultrahigh-speed parallel analog-to-digital Converter with a differential input according to claim 2, characterized in that in series with each correction capacitor (15) and (18) includes additional resistors.

 

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