Method for measuring complex dielectric penetrability of low-impedance materials on uhf and device for realization of said method |
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IPC classes for russian patent Method for measuring complex dielectric penetrability of low-impedance materials on uhf and device for realization of said method (RU 2253123):
 Method of measuring permittivity of dielectrics / 2251706
Method comprises determining permittivity of petrol. The permittivity of petrol is measured in the identification numbers. The reference points of the liner scale of a measuring instrument are assumed to be the values of the permittivity of chemically pure heptane and toluene. The measurements are performed by submerging the sensor of the measuring instrument into the study petrol. The value of permittivity is determined from the formula proposed.
 Device for measuring permittivity of dielectrics / 2251705
Device comprises indication unit, electronic measuring unit, sensor, and control members. The indication unit and measuring electronic unit are mounted in a single housing. The sensor is a cylindrical plate-type capacitor.
 Microwave method of measurement of magneto-dielectric parameters and thickness of spin coatings on surface of metal / 2251073
Device is proposed for measurement of dielectric and magnetic permeability as well as thickness of spin coatings on surface of metal and can be used in chemical industry for inspecting composition and properties of liquid and solid media. Electro-magnetic field is induced in body of dielectric material to be inspected which material is applied onto dielectric substrate, by means of sequent excitation of slow surface waves: two E-waves are excited at different, but having almost the same value, wavelengths λr1 and λr2 and one H-wave having wavelength of λr3. Attenuation of field intensity is measured t normal plane in relation to direction of wave propagation by means of receiving vibrators system for different values of base d between them. Normal attenuation factors αE1,αE2 and αH are found from ratio of E(y)= E0 exp[-α(y) y]. Magnetic and dielectric permeability and thickness of magneto-dielectric coating are found from relations of
 Super-high frequency method of measurement of dielectric permeability and thickness of dielectric plates / 2249178
Electromagnet wave is induced by means of directed aerial. The wave is incident to dielectric plate. Brusterain angle of incident wave is defined from minimum value of reflected wave and value of dielectric permeability is calculated. Power of incident and reflected waves are measured and the value of reflectivity and specific conductivity are calculated as well as value of dielectric loss of dielectric plate. Then incident angle of electromagnet wave is increased till achieving value providing total internal reflection of electromagnet wave and attenuation of intensity is measured at normal plane relatively direction of wave propagation. Factors of normal attenuation and thickness of dielectric plate are calculated. Method allows to find complex dielectric permeability and thickness of dielectric plates free of dielectric substrates.
 Device for transformation of parameters of variable- induction pickups / 2247401
The device has a pulse generator, whose output is connected to the measuring and reference arms connected to the measuring and reference arms of the variable-induction pickup, circuit providing for separation of the pulse of mismatch between the durations of the transparent processes in the measuring and reference arms. The duration of the mismatch pulse is determined by the difference of the parameters of the inductance coils of the measuring and reference arms. Each arm of the pickup has an inductance coil, transistor and a capacitor. The transistor bases are connected to the output of the pulse generator. The signal ends of the inductance coils are connected to the transistor emitters and to the comparison inputs of the comparators. The other ends of the coils are connected to a common bus. Capacitors are cut in between the transistor collectors and emitters. The collectors of both transistors are connected to the voltage source.
 Device for measurement of complex permittivity of low- impedance materials at microwave frequencies / 2247400
Measurements are taken with the aid of a waveguide traveling-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality of resonance frequency, attenuation and quality factor.
 Device for measurement of high values of complex permittivity of low-impedance materials at microwave frequencies / 2247399
Measurements are taken with the aid of a waveguide standing-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality factor.
 Device for measuring concentration in mixture / 2246118
Device has long line whose end is connected with a sensor which is in a contact with the mixture. The sensor is connected to the circuit of generator which is connected with frequency meter. The sensor is made of a capacitor which is connected to the line through the main inductive coils and to the generator through the two additional coils. The line can be made of coaxial line or shielded two-wire line provided with the capacitive sensor made of cylindrical capacitor or shielded flat capacitor, respectively. The surface of at least one of the wires of the sensor which is in a contact with the mixture can be covered with a dielectric shell.
 Disturbing electric meter / 2243571
The invention relates to non-invasive control of materials, substances, products, and may be used for study of their physico-mechanical properties, and processes for assessing their quality (availability) on the magnitude of the dielectric parameter
 Device for precision measurement of electrical capacitance / 2239200
The invention relates to the field of electrical equipment, namely, devices for precision measurements of electric tanks
Device for measuring concentration in mixture / 2246118
Device has long line whose end is connected with a sensor which is in a contact with the mixture. The sensor is connected to the circuit of generator which is connected with frequency meter. The sensor is made of a capacitor which is connected to the line through the main inductive coils and to the generator through the two additional coils. The line can be made of coaxial line or shielded two-wire line provided with the capacitive sensor made of cylindrical capacitor or shielded flat capacitor, respectively. The surface of at least one of the wires of the sensor which is in a contact with the mixture can be covered with a dielectric shell.
Device for measurement of high values of complex permittivity of low-impedance materials at microwave frequencies / 2247399
Measurements are taken with the aid of a waveguide standing-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality factor.
Device for measurement of complex permittivity of low- impedance materials at microwave frequencies / 2247400
Measurements are taken with the aid of a waveguide traveling-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality of resonance frequency, attenuation and quality factor.
Device for transformation of parameters of variable- induction pickups / 2247401
The device has a pulse generator, whose output is connected to the measuring and reference arms connected to the measuring and reference arms of the variable-induction pickup, circuit providing for separation of the pulse of mismatch between the durations of the transparent processes in the measuring and reference arms. The duration of the mismatch pulse is determined by the difference of the parameters of the inductance coils of the measuring and reference arms. Each arm of the pickup has an inductance coil, transistor and a capacitor. The transistor bases are connected to the output of the pulse generator. The signal ends of the inductance coils are connected to the transistor emitters and to the comparison inputs of the comparators. The other ends of the coils are connected to a common bus. Capacitors are cut in between the transistor collectors and emitters. The collectors of both transistors are connected to the voltage source.
Super-high frequency method of measurement of dielectric permeability and thickness of dielectric plates / 2249178
Electromagnet wave is induced by means of directed aerial. The wave is incident to dielectric plate. Brusterain angle of incident wave is defined from minimum value of reflected wave and value of dielectric permeability is calculated. Power of incident and reflected waves are measured and the value of reflectivity and specific conductivity are calculated as well as value of dielectric loss of dielectric plate. Then incident angle of electromagnet wave is increased till achieving value providing total internal reflection of electromagnet wave and attenuation of intensity is measured at normal plane relatively direction of wave propagation. Factors of normal attenuation and thickness of dielectric plate are calculated. Method allows to find complex dielectric permeability and thickness of dielectric plates free of dielectric substrates.
Microwave method of measurement of magneto-dielectric parameters and thickness of spin coatings on surface of metal / 2251073
Device is proposed for measurement of dielectric and magnetic permeability as well as thickness of spin coatings on surface of metal and can be used in chemical industry for inspecting composition and properties of liquid and solid media. Electro-magnetic field is induced in body of dielectric material to be inspected which material is applied onto dielectric substrate, by means of sequent excitation of slow surface waves: two E-waves are excited at different, but having almost the same value, wavelengths λr1 and λr2 and one H-wave having wavelength of λr3. Attenuation of field intensity is measured t normal plane in relation to direction of wave propagation by means of receiving vibrators system for different values of base d between them. Normal attenuation factors αE1,αE2 and αH are found from ratio of E(y)= E0 exp[-α(y) y]. Magnetic and dielectric permeability and thickness of magneto-dielectric coating are found from relations of
Device for measuring permittivity of dielectrics / 2251705
Device comprises indication unit, electronic measuring unit, sensor, and control members. The indication unit and measuring electronic unit are mounted in a single housing. The sensor is a cylindrical plate-type capacitor.
Method of measuring permittivity of dielectrics / 2251706
Method comprises determining permittivity of petrol. The permittivity of petrol is measured in the identification numbers. The reference points of the liner scale of a measuring instrument are assumed to be the values of the permittivity of chemically pure heptane and toluene. The measurements are performed by submerging the sensor of the measuring instrument into the study petrol. The value of permittivity is determined from the formula proposed.
Method for measuring complex dielectric penetrability of low-impedance materials on uhf and device for realization of said method / 2253123
Method and device are used for performing measurements of complex dielectric penetrability of low-impedance materials, having rough surface, by resonator method. According to inventive method, standard short circuit locker and two additional standard short circuit lockers are used, smooth one and rough one, then resonance frequency and Q-factor of resonator are measured with standard short circuit lockers and measured material sample, on basis of received results values of complex dielectric penetrability are calculated.
 Dielectric moisture meter / 2254569
Dielectric moisture meter comprises two frequency dividers, recording pulse generators, and AND/OR elements. The output of the reference generator is connected with the first input of the AND/OR element, input of the recording pulse generator, and input of the first frequency divider. The first output of the first divider is connected with the input of the pulse generator. The second output is connected with the second input of the AND/OR element through the phase frequency self-adjusting unit, automatic controllable generator and second frequency divider and input of the recording pulse generator. The first output of the pulse recording generator is connected to the input of the digital voltmeter through the cadence input of the pulse generator. The output of the subtracting device is connected with the second output. The cadence output of the subtracting device of scaling is connected with the outputs of the digital voltmeter through the subtracting device. The cadence input of the subtracting device is connected with the output of the AND/NOT element. The outputs of the scaling device are connected with the inputs of the digital voltmeter through subtracting device.
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FIELD: electric engineering. SUBSTANCE: method and device are used for performing measurements of complex dielectric penetrability of low-impedance materials, having rough surface, by resonator method. According to inventive method, standard short circuit locker and two additional standard short circuit lockers are used, smooth one and rough one, then resonance frequency and Q-factor of resonator are measured with standard short circuit lockers and measured material sample, on basis of received results values of complex dielectric penetrability are calculated. EFFECT: higher precision. 2 cl
The invention relates to the field of measurement of electrical quantities and can be used in the production of existing and new absorbing low impedance materials such as carbon fibre reinforced plastics used in the microwave range, as well as to control the electrical parameters of the dielectric constant and tangent of dielectric loss angle. The closest to the technical nature of the claimed invention is selected as a prototype method for measuring complex permittivity of the indirect method [cm.. Brandt A.A. Investigation of dielectrics at microwave frequencies. - M.: Fizmatgiz, 1963. - 120 S.]. The measurements are performed in two stages, first measure the resonant frequency and q-factor of the hollow detachable tunable cylindrical resonator, in which a movable piston is one of the end walls of the cavity and plays the role of reference corodinates. From the microwave generator through the waveguide is served probing electromagnetic wave, measure the resonant frequency and q-factor of the hollow cavity. Then in a cylindrical resonator was placed a sample of the material being measured on the piston and measure the resonant frequency and quality factor of the resonator material. Information about the parameters of the material is in resonance h is h and q of the resonator. The processing results produced by the methodology described [see Brandt A.A. Investigation of dielectrics at microwave frequencies. - M.: Fizmatgiz, 1963. - 117 C.]. One drawback of the prototype are large measurement error ε tgδ for low impedance materials having simultaneously high values of dielectric permittivity ε and tangent of dielectric loss angle tgδ and characterized by large coefficients of reflection from the sample and the presence of rough working surface. The closest to the technical nature of the claimed invention is selected as a prototype device for measuring complex permittivity of the indirect method, comprising a microwave generator, a measuring device resonant frequency of the resonator, tunable split cylindrical resonator and measured material [see Brandt A.A. Investigation of dielectrics at microwave frequencies. - M.: Fizmatgiz, 1963. - 120 S.]. The measurements are performed in two stages, first measure the resonant frequency and q-factor of the hollow detachable tunable cylindrical resonator, in which a movable piston is one of the end walls of the cavity and plays the role of reference corodinates. From the microwave generator through the waveguide is served probing power is agnita wave, measure the resonant frequency and q-factor of the hollow cavity. Then in a cylindrical resonator was placed a sample of the material being measured on the piston and measure the resonant frequency and quality factor of the resonator material. Information about the parameters of the material is the resonant frequency and quality factor of the resonator. The processing results produced by the method described [see Brandt A.A. Investigation of dielectrics at microwave frequencies. - M.: Fizmatgiz, 1963. - 117 C.]. One drawback of the prototype are large measurement error ε tgδ for low impedance materials having simultaneously high values of dielectric permittivity ε and tangent of dielectric loss angle tgδ and characterized by large coefficients of reflection from the sample and the presence of rough working surface. For reasons that impede the achievement of specified following technical result when using the known method, taken as a prototype, is that the known method has low accuracy measurement of low impedance materials with large values of complex dielectric permittivity. This instrumental and methodical error of the method lead to large measurement errors ε tgδ. One of the reasons pogresno the TEI is the difference in the magnitude of the surface roughness of the reference corodinates and the sample being measured. The invention consists in the following. In the process of measurement and processing of measurement results is not taken into account the difference of the roughness of the surfaces of the sample of the material being measured and the reference corodinates, with which comparison is made, which leads to measurement errors. Therefore, to improve the accuracy of phase measurement as a reference it is proposed to use an intermediate coreconnection having the same surface roughness as measured material, rough coreconnection can be made from a sample of the material being measured, which caused the metal reflecting coating, for example, by vacuum deposition. Rough coreconnection repeats the relief of the rough surface of the investigated material and eliminates the error caused by the difference in the roughness of the surfaces of the sample of the material being measured and the reference corodinates. But in the process of measurement and processing of measurement results is not taken into account the difference of the reflective properties of the deposited metal coating on the reflective properties of the material of the reference corodinates. To assess the reflective properties of the deposited metal coating rough corodinates produce its comparison with the reference coreconnection. To do this, take the reference Corot is cosmically and put on him a reflective metal coating, as on rough korotkozamknutyh. The result is a sample of the material being measured and three reference corodinates: 1 coreconnection - reference coreconnection recommended Standards for measurement of dielectric materials [GOST 8.358-GE. The method of measurement of relative permittivity and tangent of dielectric loss in the frequency range from 0.2 to 1 GHz. - M.: Publishing house of standards, 1979. - 12 S.]; 2 coreconnection - smooth coreconnection with the frequency of surface treatment, as a reference coreconnection 1, one of the reference shorts coated with a reflective metallic coating; 3 coreconnection - rough coreconnection with the frequency of surface treatment as the sample to be measured, one of the measured samples coated with a reflective metallic coating, as in the reference korotkozamknutyh 2. The measured resonant frequencies and dobrotnost resonator from a renovation (fRESfRESfRES, Q1, Q2, Q3) and the measured sample (frazor, Qarr) processing of measurement results and calculation of complex dielectric permittivity. The values of the resonant frequencies and dobrotnosti (fRESfRES , Q1, Q2) evaluate and Refine the reflective properties of the metal coating deposited on the surface of the reference corodinates with reference coreconnection. According to the adjusted values of the resonant frequent and q-switched (fRESfRESthat) evaluate and Refine the reflective properties of the metal coating deposited on the surface of the reference corodinates with a metal coating deposited on the roughened surface of one sample of the measured material. With the revised parameters resonant frequency and q-factor calculate the complex permittivity of the sample of the material being measured according to the method [see Brandt A.A. Investigation of dielectrics at microwave frequencies. - M.: Fizmatgiz, 1963.]. The technical result is a more accurate measurement of complex permittivity of composite materials with a rough surface. This technical result in the implementation of the method is achieved by the known method of measuring the complex permittivity of low impedance materials at microwave consisting in the measurement of resonance frequency and q-factor of the hollow detachable tunable resonator, and then placed in it a sample of the material being measured, with sleduyushei processing of measurement results. The feature of the method lies in the fact that measure the resonant frequency and quality factor of the resonator with reference coreconnection, then with a smooth reference coreconnection, calculate the updated value of the resonant frequency and quality factor of the resonator with a smooth reference coreconnection, then measure the resonant frequency and quality factor of the resonator with a rough reference coreconnection, calculate the updated value of the resonant frequency and quality factor of the resonator with a rough reference coreconnection, then measure the resonant frequency and quality factor of the resonator with the sample of the material being measured, then the values of resonant frequency and quality factor of the resonator with the measured sample and the updated value of the resonant frequency and quality factor of the resonator with a rough reference coreconnection determine the values of complex dielectric permittivity of the material being measured. This technical result in the implementation of the device for measurement of complex permittivity of low impedance materials at microwave containing a microwave generator, which is connected to the measuring device, the resonant frequency of the resonator, to the opposite end of the measuring device is connected detachable peristeri aemy cylindrical resonator, in which is set a reference coreconnection, and then a sample of the material being measured. Feature of the device lies in the fact that we have introduced two reference corodinates, and one of them, a smooth reference coreconnection having such a surface roughness, as a reference coreconnection coated with a reflective metal coating, and the second coarse reference coreconnection having the same surface roughness as measured material coated with a reflective metallic coating. Information confirming the ability of the invention to provide the above technical result. The method is implemented using the device. First make a rough reference coreconnection with roughness, repeating the roughness of the measured sample, and then made a smooth reference coreconnection repeating the roughness of the reference corodinates to assess the reflective properties of the metallic coating has a rough reference corodinates. After producing the measured resonant frequency and quality factor of the resonator with reference coreconnection, then with a smooth reference coreconnection, then with a rough reference coreconnection and sample changes aemula material, then make processing of measurement results, calculating the complex dielectric constant. For measurements of complex permittivity of low impedance materials produce a measurement of resonant frequency and quality factor of the resonator with the sample measured material having a rough surface. Take two samples of the material being measured and the two reference corodinates. One sample of the material being measured and a reference coreconnection put a metal with high reflective properties, such as silver, these samples are used as rough and smooth reference shorts. A second sample of the material being measured is used as measured. The measurements are carried out in four stages: with reference coreconnection, with a smooth reference coreconnection, with a rough reference coreconnection and a sample of the material being measured. From the microwave generator to split tunable cylindrical resonator is served probing electromagnetic wave. First measurement of resonant frequency and quality factor of the resonator with reference coreconnection, then with a smooth reference coreconnection, then with a rough reference coreconnection and a sample of the material being measured. P is the measured resonant frequencies and dobrotnost resonator from a renovation (f RESfRESfRES, Q1, Q2, Q3) and the measured sample (frazor, Qarr) processing of measurement results and calculation of complex dielectric permittivity. The values of the resonant frequencies and dobrotnosti (fRESfRES, Q1, Q2) evaluate and Refine the reflective properties of the metal coating deposited on the surface of the reference corodinates with reference coreconnection. According to the adjusted values of the resonant frequent and q-switched (fRESfRES) evaluate and Refine the reflective properties of the metal coating deposited on the surface of the reference corodinates with a metal coating deposited on the roughened surface of one sample of the measured material. Information about the parameters of the material is the resonant frequency and quality factor of the resonator with the sample of the material being measured. With the revised parameters resonant frequency and q-factor calculate the complex permittivity of the sample of the material being measured. Thus, the presented data suggest the implementation of the use of the claimed invention the following cumulative conditions: - a means of embodying the claimed method in its implementation is tuleniy, approved for use in industry, namely in the measurement of dielectric parameters of materials; for the inventive method, it is described in the independent clause sets out the claims, confirmed the possibility of its implementation using the steps described in the application or known before the priority date tools and methods. Therefore, the claimed invention meets the condition of “industrial applicability”. 1. The method of measurement of complex permittivity of low impedance materials at microwave consisting in the measurement of resonance frequency and q-factor of the hollow detachable tunable resonator, and then placed in it a sample of the material being measured, with the subsequent processing of the measurement results, wherein the measure of the resonant frequency and quality factor of the resonator with reference coreconnection, then with a smooth reference coreconnection, calculate the updated value of the resonant frequency and quality factor of the resonator with a smooth reference coreconnection, then measure the resonant frequency and quality factor of the resonator with a rough reference coreconnection, calculate the updated value of the resonant frequency and quality factor of the resonator with a rough reference coreconnection,then produce measurement of resonant frequency and quality factor of the resonator with the sample of the material being measured, then by the values of resonant frequency and quality factor of the resonator with the measured sample and the updated value of the resonant frequency and quality factor of the resonator with a rough reference coreconnection determine the values of complex dielectric permittivity of the material being measured. 2. Device for measuring complex permittivity of low impedance materials at microwave containing microwave generator, which is connected to the measuring device, the resonant frequency of the resonator, to the opposite end of the measuring device is connected detachable tunable cylindrical cavity in which is mounted a reference coreconnection, and then a sample of the material being measured, characterized in that it introduced two additional reference corodinates, and one of them, a smooth reference coreconnection having the same surface roughness as the reference coreconnection coated with a reflective metal coating, and the second coarse reference coreconnection having the same surface roughness as measured material, with put a reflective metal coating.
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