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easuring inductance or capacitance; measuring quality factor, e.g. by using the resonance method; measuring loss factor; measuring dielectric constants (G01R27/26)

G
Physics
(45413)
G01
easuring; testing
(27186)
G01R
easuring electric variables; measuring magnetic variables (measuring physical variables of any kind by conversion into electric variables, see note (4) following the title of class g01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis, g01n; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods g01n; indicating correct tuning of resonant circuits h03j0003120000; monitoring electronic pulse counters h03k0021400000; monitoring operation of communication systems h04)
(2324)
G01R27
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
(368)
G01R27/26
easuring inductance or capacitance; measuring quality factor, e.g. by using the resonance method; measuring loss factor; measuring dielectric constants
(99)


Method to measure dielectric permeability of materials and device for its realisation

Method to measure dielectric permeability of materials and device for its realisation

Method is based on measurement of complex ratio of reflection of electromagnetic waves from a section of a transmission line, at the end of which they install calibration measures, and a tested material sample, with subsequent processing of materials. At the section of the transmission line with wave resistance Zw in parallel to it they connect a resistive element with resistance R=(0.1-0.2)Zw, using results of calibration measurements they determine parameters of scattering of a circuit that connects plane of measurement of reflection ratio with plane of connection of the tested section of the line with the tested sample. By processing of data array they find dielectric permeability and tangent of angle of losses of the tested material. The device is proposed for method realisation.

Microcontroller device for diagnosing of turn-to-turn isolation of electric motor winding

Microcontroller device for diagnosing of turn-to-turn isolation of electric motor winding

Microcontroller device for diagnosing of turn-to-turn insulation of an electric motor winding comprises (Fig.) MC 1, a voltage divider 2, a reference voltage controlled source 3, the first controlled key 4, an indicator 5, a direct voltage source 6, a winding of an electric motor 7 to be diagnosed, the second key 8 and a sample inductance coil 9. The first output of the direct voltage source 6 is connected to the first outputs of the inductance coils 7 (winding of the electric motor to be diagnosed) and 9 (sample inductance coil), the second outputs are connected to the second output of the second key, which can be placed either in the upper (connected inductance coil 7) or in the lower (connected sample inductance coil 9) position. The first output of the second key is connected to the second outputs of the first controlled key and voltage divider. A control output of the first key is connected to MC 1, a control input of the voltage reference source 3 to the output of a pulse-width modulator (not specified in Fig.) of MC 1, an output of the voltage reference source 3 is connected to the first input of an analogue comparator (not specified in Fig.) of MC1, the middle output of the voltage divider 2 is connected to the second input of the analogue comparator of MC1, the first outermost output of the voltage divider 2 is connected to the first outputs of the controlled key 4 and the direct voltage source 6, the indicator 5 is connected to the output of the respective port of MC 1.

Resonant frequency measurement method

Resonant frequency measurement method

Vibrations with a frequency changing discretely at the specified pitch in direct and reverse direction as per a symmetrical law in the range of variation of the measured resonant frequency are supplied regularly to a resonator input. A random signal is shaped, by means of which vibrations are modulated, which are supplied to the resonator input; an extreme value of amplitude-frequency response of the resonator and frequency corresponding to this extreme value is fixed during each half-period of these changes, and resonant frequency is determined as an average value of fixed frequencies of extreme values for n periods of the specified changes, which is calculated by the formula: n≥(Δf/δa)2/8, where Δf - a frequency tuning step of vibrations supplied to the resonator input; δa - required absolute error of determination of a resonant frequency. With that, a random signal is used for modulation of amplitude of vibrations supplied to the resonator input.

Device to measure parameters of dielectrics at ultrahigh frequencies

Device to measure parameters of dielectrics at ultrahigh frequencies

Device comprises a microwave waveguide, a resonator with a cylindrical part limited at one side by the end wall of the microwave waveguide, and at the other side with a shorting piston with the ability of axial displacement inside the resonator, a piston displacement mechanism and a unit of radio measurement equipment. At the same time the microwave waveguide, the resonator cylinder and the displacement mechanism are installed in a single cylindrical body. The resonator cylinder is installed inside the body with the possibility of axial displacement and is equipped with clamps for fixation in the body, and the piston by means of the stem is fixed on the platform of the axial displacement module with a drive from a servomotor combined with the metre of linear displacement. The servometer is equipped with a system of automatic control connected with a radiometric block of fixation of resonant position of the piston.

Device to measure parameters of dielectrics at heating

Device to measure parameters of dielectrics at heating

Device comprises a cylindrical resonator limited by the SHF waveguide end wall at one side and by a displaceable piston with rod at the other side, a charging door for mounting of the tested material sample, a temperature-measuring instrument, shielding gas feed, rod and piston travelling mechanism. At that the SHF waveguide end wall is made water cooled and the heater comprises a row of tubular graphite elements with one-way output to current leads. The piston is installed at a split rod, which heated part is made as a thin-wall tube of heat-resisting material, while the other part is made as a water-cooled tube equipped with a flange with a sealing gasket. At that an optical pyrometer is connected hermetically to the water-cooled part of the rod and the rod is fixed at the platform of a linear module. The rod and piston travelling mechanism includes two serial-operated linear modules with electromechanical drives combined with the common displacement-measuring sensor and shielding gas feed is placed in the pyrometer ocular zone.

Tester with storage of dissipative cg two-terminal networks

Tester with storage of dissipative cg two-terminal networks

Device contains the first and second sources of reference voltage, electronic switch, measured CG two-terminal network. The novice is in the use for measuring of parameters of CG two-terminal networks of the electronic key, integrator, variable resistor R, operational amplifier, inverting Schmitt trigger, time interval measurement device and voltage measurement device.

Resonant device for near-field microwave inspection of parameters of materials

Resonant device for near-field microwave inspection of parameters of materials

Device comprises a microwave generator with a rectangular waveguide connected to it, having a measuring device with a waveguide resonance system as a terminal device, wherein the terminal device includes a capacitive metal diaphragm. According to the solution, the capacitive metal diaphragm is superimposed with a plane-parallel dielectric sample with an area equal to the area of the waveguide flange, and the dielectric sample is superimposed with a probe in the form of a metal wire with length of 12-20 mm and diameter of 0.1-0.5 mm with a sharp end, bent at a right angle; the longer section of the probe lies on a dielectric plate perpendicular to the slit in the diaphragm, and the shorter section of the probe with the sharp end is perpendicular to the plane of the dielectric sample, wherein the thickness of the plane-parallel dielectric sample t is selected based on the condition t ε 〈 〈 λ v , where λv is the fundamental wavelength in the waveguide, ε is the permittivity of the plate.

Device for measurement of property of dielectric material

Device for measurement of property of dielectric material

Device for measurement of a property of a dielectric material comprises a generator of electromagnetic oscillations, the first isolating element connected by an outlet with an inlet of a phase changer, a transmitting and a receiving antennas, a detector connected with its outlet to a unit of processing of information and an attenuator. To achieve the technical result, the first and second waveguide tees are introduced, as well as the second isolating element. The outlet of the generator of electromagnet oscillations is connected with the first arm of the first waveguide tee, the second arm of which is connected to the inlet of the first isolating element, the outlet of the phase changer via the attenuator is connected with the first arm of the second waveguide tee, the second arm of which is connected to the receiving antenna, the third arm of the second waveguide tee is connected to the inlet of the detector, the third arm of the first waveguide tee via the second isolating element is connected to the transmitting antenna.

Microcontroller measurement converter with balancing of resistive wheatstone by method of width-pulse modulation

Microcontroller measurement converter with balancing of resistive wheatstone by method of width-pulse modulation

Invention relates to measurement equipment, in particular, to devices for measurement of active resistance, and may be used in facilities for measurement and control of non-electric values by resistive sensors. A microcontroller measuring converter with balancing of a resistive Wheatstone bridge by the method of width-pulse modulation comprises the first resistor 1, the second resistor 2 (which is also the resistive sensor), the third resistor 3, the fourth resistor 4, the fifth resistor 5, the sixth resistor 6, an RC-filter 7 and a microcontroller 8. Resistors 1 and 2 by the first outputs are connected to the inlet of the RC-filter 7, the output of which is connected to the first AK input of the microcontroller 8, the first output of the resistor 5 is connected to the second output of the resistor 2 and to the first output of the resistor 6, the second output of the resistor 5 is connected to the WPM output of the microcontroller 8, the first outputs of the resistors 3 and 4 are connected to the second AK input of the microcontroller 8, the second outputs of the resistors 1, 3, 4 and 6 are connected accordingly to the first, second, third and fourth discrete outputs of the microcontroller 8.

Method to measure complex dielectric permeability of liquid and loose substances

Method to measure complex dielectric permeability of liquid and loose substances

In the method to measure complex dielectric permeability of liquid and loose substances in wide range of frequencies in one cell used in the range of frequencies of higher than 100 MHz as a section of a coaxial line, and in the range below 1 MHz as a cylindrical condenser. In the range of frequencies above 100 MHz the dielectric permeability is calculated via measured values of the complex coefficient of transfer of electromagnetic wave (parameter of scattering matrix S12), and in the range of frequencies below 1 MHz - via measurement of full conductivity, the novelty is the fact that for measurements in the frequency range of 0.3-100 MHz an additional section of the coaxial line is used with wave resistance of 50 Ohm and section larger than in a cell, the inner diameter of the external conductor of which is determined in accordance with the formula D 1 = d 1 exp ( Z 01 60 ) , where d1 - external diameter of the cell body; Z01 - wave resistance of the additional section of the coaxial line, in which the cell is placed, at the same time the cell is connected as the cylindrical capacitor into the gap of the internal conductor of the additional section of the coaxial line, having two microwave slots, to central conductors of which a central conductor of the cell is connected at one side, and at the other side - the cell body via the matching adapter in the form of a section of the conical line with wave resistance 50 Ohm, and its calibration is carried out, for this purpose they determine parameters of the equivalent circuit of the additional section of the coaxial line with an empty cell arranged in it. Then the cell is filled with the investigated substance, and in the range of frequencies of 0.3-100 MHz they measure the complex coefficient of transfer (parameter of scattering matrix S12), and using the formulas that relate CDP with the S12 parameter, they determine CDP.

Microcontroller metering converter of resistance into binary code with voltage-controlled generator

Microcontroller metering converter of resistance into binary code with voltage-controlled generator

Microcontroller metering converter of resistance into a binary code with a voltage-controlled generator comprises the first resistor 1 (R1), the second resistor 2 (R2), the third resistor 3 (R3), the fourth resistor 4 (R4), and a generator 5 controlled by voltage and equipped with an inlet of generation permit and an MC 6. The first outputs of resistors 1, 2, 3 and 4 are connected accordingly to the first, second, third and fourth outputs of the MC 6, the second outputs of resistors 1, 2, 3 and 4 are connected to the inlet of control of generator 5 voltage, the output of which is connected to the count input of the binary counter built into the MC 6, the fifth output of the MC 6 is connected to the input of generator 5 generation permit.

Method for determination of loss coefficient for tg tgδ dielectric

Method for determination of loss coefficient for tg tgδ dielectric

Sample of measured dielectric is placed into the area of maximum electric field of the resonator excited at E010 mode; Q-factor of resonator is measured with sample and without it and tgδ value of dielectric is evaluated by measurement results. The method is characterised by use of Q-factor increase effect for the system of resonator-dielectric when a sample of dielectric is introduced. If Q-factor of the system is improved with introduction of the sample, intrinsic Q of the resonator is increased up to the maximum Q value at which Q factor of the system remains unchanged and tgδ of the measured dielectric sample is defined by the following ratio: tgδ=(ε-1)/εQ, where ε is dielectric constant of the dielectric sample; Q is intrinsic Q of the resonator at which Q factor of the system remains unchanged; if Q-factor of the system is decreased at introduction of the dielectric sample, Q-factor of the resonator is decreased up to the value when Q-factor of the system increases and then measurements are made in compliance with the above procedure.

Microcontroller device for diagnostics of turn-to-turn insulation of electric motor winding against self-induction voltage

Microcontroller device for diagnostics of turn-to-turn insulation of electric motor winding against self-induction voltage

Microcontroller device for diagnostics of turn-to-turn insulation of electric motor winding against self-induction voltage contains microcontroller 1, voltage divider 2, the first RC-filter 3, controlled electronic switch 4, indicator 5, the second RC-filter 6, controlled power source 7 and electric motor winding 8 subjected to diagnostics. At that output of the second microcontroller of pulse-length modulation is connected to the output of the second RC-filter 6 which output is connected to control input of the current source 7, which first terminal is connected to the second output of the switch 4 while its second terminal is connected to the second output of winding 8 subjected for diagnostics.

Method to determine resistance and inductance of scattering of primary winding of voltage transformer

Method to determine resistance and inductance of scattering of primary winding of voltage transformer

In the available method of measurement of inductance of scattering of the primary winding of the voltage transformer as product of the time constant of the transition process τ and active resistance of the oscillographed Rc, circuit Lσ2bh=τ·R11, consisting in measurement of parameters of the second section of the transition process of current as output voltage jumps on one of phases, according to the invention the secondary winding of the same phase is shorted, the voltage surge is sent from the voltage source with negligible resistance to the primary winding, inductance of scattering is determined, as well as resistance of the primary winding of the voltage transformer, the transition process is considered in the form of three exponents, in accordance with the expression i 1 ( t ) = U 1 ( 1 2 R m ( 1 − e − t τ 1 ) + ( 1 2 R a − 1 R m ) ( 1 − e − t τ 2 ) + ( 1 2 R a + 1 2 R m ) ( 1 − e − t τ 3 ) ) .

Scanning meter of cg-dipole parameters

Scanning meter of cg-dipole parameters

Scanning metre of CG-dipole parameters comprises an amplitude detector, conductivity and capacitance indicators, an integrator, a comparator, a high frequency generator, connected via a voltage-current converter with a metering circuit, to a signal input of which and to a common wire there is a metered dipole connected. Additionally the following components are introduced: a peak detector, a differentiator, a timer, a square ware generator, a solving device, a modulating capacitor. A conductivity indicator is connected to the output of the metering circuit via the peak detector, the first input of the comparator - via the amplitude detector and the differentiator, the second input of the comparator is connected to the common wire, the output - with the first input of the timer, the second input of which is connected with the first output of the square ware generator, the output - with the input of the solving device, the first output of the solving device is connected to the control input of the metering circuit, the second one - with the capacitance indicator, and the second output of the square ware generator is connected via an integrator to the control input of the modulating capacitor.

Method and apparatus for capacitive detection of objects

Method and apparatus for capacitive detection of objects

Apparatus for capacitive detection of objects has a capacitive sensor, having a sensitive capacitor formed between first and second capacitive elements, a voltage source, first and second switches, a storage capacitor, a switch control unit, a unit for controlling voltage across storage capacitors, a controller which facilitates measurement based on the rate of change of voltage across a storage capacitor and determining the position of the object. The sensor is a matrix containing multiple capacitive elements. The method for capacitive detection of objects involves performing steps for charging the sensitive capacitor by connecting to the voltage source with the storage capacitor disconnected from the voltage source; transferring charge from the sensitive capacitor to the storage capacitor; periodically repeating the processes of charging and transferring the accumulated charge; controlling voltage across the storage capacitor; determining at least one parameter which depends on the rate of change of voltage across the storage capacitor; determining the position of the object; determining the difference between the first measurement, which corresponds to the first capacitance value of the sensitive capacitor, and the second measurement, which corresponds to the second capacitance value of the sensitive capacitor. The sensitive capacitor is placed such that the distance between its surface and the floor surface is less than or equal to 50 mm.

Measuring method of attenuation factor of acoustic waves in resonance structure and its quality

Measuring method of attenuation factor of acoustic waves in resonance structure and its quality

Measuring method of attenuation factor of acoustic waves in resonance structure and its quality is based on measurement of frequency dependence of impedance of resonance structure. Frequency dependence of imaginary part of electric impedance of the structure is measured for the chosen number of obertone. Positions of extreme values are fixed on the measured dependence. Difference between frequencies of extreme values Δfn(Imz) is calculated. Then, value of attenuation factor αn and quality factor Qn is calculated at frequency fn of obertone with n number.

Method to measure comprehensive dielectric permeability of liquid and loose substances in wide range of frequencies

Method to measure comprehensive dielectric permeability of liquid and loose substances in wide range of frequencies

In the method to measure comprehensive dielectric permeability (CDP) of liquid and loose bodies in a wide range of frequencies within one cell filled with a tested substances, used in the frequency range of 100-4000 MHz as a section of a coaxial line, and in the frequency range of 1 kHz - 1 MHz as a cylindrical capacitor. At the same time in the frequency range of 100-4000 MHz the comprehensive dielectric permeability is calculated via measured values of the complex coefficient of electromagnet wave transmission, and in the frequency range of 100 Hz-1 MHz - via measurement of full conductivity, the novelty is the fact that prior to measurement of CDP an empty cell is placed into the additional section of the coaxial line (dwg.1), the inner diameter of the external conductor of which is determined on the basis of the following formula: where: d - external diameter of the cell body; Z01 - wave resistance of an additional section of a coaxial line, in which a cell is placed, at the same time the cell is connected as a cylindrical capacitor into an opening of an inner conductor of the additional section of the coaxial line shorted at the outlet, and its calibration is carried out, for this purpose parameters of an equivalent electric circuit of the additional section of the coaxial line are determined with the empty cell arranged in it, then the cell is filled with the tested substance, and in the frequency range of 1 MHz-100 MHz CDP is determined using formulas that connect S11 with parameters of the equivalent circuit.

Method of measuring physical quantity

Method of measuring physical quantity

Method of measuring a physical quantity involves exciting electromagnetic waves in a waveguide resonator, placing the measured object in the wave field of one of the end sections of the waveguide resonator and determining one standing wave characteristic in the object. An identical object with a reference value of the measured physical quantity is placed in the wave field of another end section. The waveguide resonator used can be a section of a long line and its end sections can be identical measuring cells.

Method of diagnosing machine assemblies based on operating oil parameters

Method of diagnosing machine assemblies based on operating oil parameters

Result is achieved by determining change in sensor capacitance depending on the degree and quality of contamination of operating oil. The change is detected using a frequency technique. Also, the degree and quality of contamination of the operating oil are determined from deviation of the frequency of pulses of a tunable generator from a reference value obtained for fresh oil. Comparison is carried out based on an arbitrary pulse indicator defined by the formula where K1 is the frequency division coefficient of the reference frequency generator; T1 is the oscillation period of the reference frequency generator; K2 is the frequency division coefficient of the tunable frequency generator; T2 is the oscillation period of the tunable frequency generator.

Microcontroller metering converter of gas and liquid flow speed

Microcontroller metering converter of gas and liquid flow speed

Microcontroller metering converter of gas or liquid flow speed comprises a microcontroller 1, the first resistor 2, the second resistor 3, a thermistor 4, a capacitance sensor 5, a controlled source of reference voltage 6, the first outputs of two resistors 2 and 3 are connected accordingly to the first and second outputs of the microcontroller, the second outputs of resistors 2 and 3 are connected to the first cover of the capacitance sensor 5 and to the first input of the analog comparator of the microcontroller 1, the second cover of the capacitance sensor 5 is connected to a minus terminal of a source of power supply of the microcontroller 1, the first output of the thermistor 4 is connected to the second outputs of resistors 2 and 3, the second output of the thermistor is connected to the third output of the microcontroller 1, to the output of the first width-pulse modulator of the microcontroller 1 an input of the controlled source of reference voltage 6 is connected, the output of which is connected to the second input of the analog comparator of the microcontroller 1, the output of the second width-pulse modulator of the microcontroller 1 is connected to the first input of the analog comparator of the microcontroller 1.

Method for determination of volt-farad characteristics of semiconductor power devices

Method for determination of volt-farad characteristics of semiconductor power devices

Connected to the circuit setting the generator oscillation frequency is a reference capacitor with a known capacity value Cm. One determines the generator period value T1. Then one disconnects the reference capacitor an determines the generator period value T2. By the Cm, T1 and T2 one determines the generator circuit capacity value Cc. Then a device being verified is connected to the circuit. Applied thereto is increasing reverse bias voltage. At moments of time in the process of the reverse bias voltage increase one measures and memorises discrete values of reverse bias voltage and discrete values of the generator alternating voltage. One determines the generator nth period value T1. One determines and memorises the mean value of reverse bias voltage within the nth measurement interval. By the Cc, T2 and Tn values one determines and memorises he value of total capacity of the device being verified within the nth measurement interval. By the values and the corresponding mean values of reverse bias voltage one determines the volt-farad characteristic of the device being verified.

Device for determining dielectric capacity of material specimen under external effects

Device for determining dielectric capacity of material specimen under external effects

Device includes emissive generator, transmitting linearly polarised antennae, chamber for placing flat specimen of the tested material, receiving linearly polarised antennae, receiver, recorder, and is specific for the chamber being provided with flat RF windows for radiation input and output, as well as with either mechanisms or sensors of specimen rotation in the plain of radiation incidence or perpendicular to it. The transmitting antennae is directed with reference to radiation input window under Brewster angle so that the vector of its electrical field is in the plain of radiation to input window, while receiving antennae is directed with regard to the radiation output window under Brewster angle so that its electrical field vector is in the plain of radiation incidence to output window.

Method of identifying and classifying pollution of freshwater environment and apparatus for realising said method

Method of identifying and classifying pollution of freshwater environment and apparatus for realising said method

Method of identifying and classifying pollution of a freshwater environment involves measuring temperature, classifying contaminants into groups based on analysis of a combination of measured factors, collecting samples for further laboratory analysis, sending information on the investigated facility obtained from several points to a single receiving system. Components σx of the complex permittivity of the medium are measured. Pollution of the freshwater environment is determined based on deviation of values reduced to temperature T0 for σ≈σfon from background σfon. Contaminants of the freshwater environment are classified using the following relationships: σ>σfon - electrolytes, for σ≈σfon - non-polar and weakly polar organic compounds, for σ≈σfon - polar organic compounds, frequency dispersion ε', σ - suspensions, films, colloids. Standard temperature dielectric characteristics of the investigated freshwater environment ε'(T0) and σ(T) are plotted. By averaging the values of ε'(T0) and σ(T0) reduced to temperature T0 over a time interval Δt greater than a single measurement Δt0 the background characteristics σfon are determined. Background characteristics σfon are used as the temperature T0. The average annual temperature of the investigated freshwater environment is used as the temperature T0, and the time interval Δt is defined as (104…108)·Δt0. Apparatus for identifying and classifying pollution of a freshwater environment is disclosed to realise the disclosed method.

Method for material dielectric permeability determination

Method for material dielectric permeability determination

Resonator is intended for measuring rods with radius of inertia where R - radius of empty resonator, r1max - maximum allowable radius of rod at given frequency, r - radius of the rod being measured. Determination of dielectric permeability of support rods for traveling-wave tubes is carried out using two fixed resonators tuned for the same frequency f0 and detuning Δf0, and two calibration rods with "embracing" measured rods radii of interia S1 of the first resonator and S2 of the second resonator.

Method of non-contact measurement of the dielectric constant

Method of non-contact measurement of the dielectric constant

FIELD: electrical measurements. SUBSTANCE: invention relates to electrical measurements, namely to measure the dielectric constant of solid dielectric materials. The test sample that having the form of a plate placed near the surface of the sensor. Sensor is a piezoelectric plate with two counter-interdigital transducers. Sensor is provided with a continuous high-frequency electromagnetic signal, which is converted into a homogeneous piezoelectric active acoustic wave that propagating along a piezoelectric plate. Electric field of this wave penetrating into the sample, its speed changing and the phase of the output signal is also changing. The unknown value is determined from the measured phase with using the calibration curve which constructed by means of a reference samples set. The sample must have a fixed length and width, superior aperture of the wave. The thickness of the sample must be greater than half the thickness of the piezoelectric plate, and on the upper surface does not overlap any conditions (which may be irregular, not parallel to the bottom surface, a non-planar). EFFECT: simplify the process and improve the accuracy of measurement for piezoelectric materials and materials with a relative permittivity above 8. 5 dwg, 1 ex

Method and device to measure capacitance of capacitor

Method and device to measure capacitance of capacitor

Method used to measure capacitance of capacitor (21) is characterised by the fact that digital bridge with two arms generates the first signal (B1) representing sequence of measured pulses (M) with frequency (f1) depending on unknown measured capacitance and the second signal (B2) representing sequence of measured pulses (L) with frequency (f2) depending on known reference capacitance (CREF); then difference (ΔT) is calculated between time intervals (T1, T2) required for two digital bridge arms to generate equal number of pulses (Th1, Th2); difference (ΔC) is calculated between unknown and reference capacitance (CREF) in the form of time difference (ΔT); unknown capacitance of capacitor (21) is calculated on the basis of reference capacitance (CREF) difference (ΔC) in capacitance values.

Apparatus for measuring physical properties of liquids

Apparatus for measuring physical properties of liquids

Apparatus for measuring physical properties of a liquid has a piece of a long line connected by communication lines and coupling elements to an electronic unit, said piece of long line being in form of a plurality of sections formed by a central metal core and at least two metallic cylinders which are coaxial with the core and nested and also successively shorted and opened at one of their ends, wherein the outer metallic cylinder is closed on both butt-ends by a first and a second metal plane, and the central metal core, which is shorted on of the ends by the first metal plane or open, has a length which is equal to the length of the outer metallic cylinder, and its other end is shorted with the second metal plane. In the disclosed apparatus, the surface of the central metal core and the outer surface of each of the coaxial nested metallic cylinders is covered on the entire length by a corresponding dielectric shell.

Method of engineering measurement of liquid electrolytes and dielectric liquids

Method of engineering measurement of liquid electrolytes and dielectric liquids

Measurement cell with an analysed liquid is series connected with ohmic resistances to an electric circuit. A required voltage of the measurement cell is set, while a voltage of a segment between the measurement cell and a first standard resistance, as well as an input voltage of a measuring circuit are measured and related to the measurement cell voltage to calculate the parameters of liquid electrolytes and dielectric liquids. Simultaneous measurement of said voltages and use of the values related to the measurement cell voltage for appropriate engineering measurements eliminates an error caused by supply voltage and frequency instability and variations of electric field intensity, and allows simplifying the measurement process. The measurement cell grounding reduces external electric field influence on the measurement results. The measurement cell voltage stability during the measurement process allows examining engineering parameters of the controlled liquid versus electric field strength.

Method for dielectric spectroscopy of thin layer on solid surface in infrared range

Method for dielectric spectroscopy of thin layer on solid surface in infrared range

Dielectric spectroscopy method involves exposing a layer to probe radiation, for which material of the body has known permittivity with a negative real part, converting radiation to a surface electromagnetic wave (SEW), measuring intensity of the SEW field after traversing different microscopic distances, determining the complex refractive index of the SEW from measurement results and known layer thickness, calculating permittivity of the material of the layer by solving SEW dispersion equations for the waveguide structure containing the surface and the layer. The selected radiation has a continuous or discrete spectrum and said radiation is converted to a set of SEW, frequency values of which are equal to radiation component frequencies.

Method and apparatus for measuring electrical characteristics of liquid electrolytes and dielectric materials

Method and apparatus for measuring electrical characteristics of liquid electrolytes and dielectric materials

Measuring cell with the analysed liquid is connected in an electric circuit in series with two standard active resistances, each of which is in turn connected to the cell. Voltage is applied across the cell where measurement is to be carried out. Constancy of this voltage when switching standard resistances is maintained by adjusting common voltage. Voltage across the cell and the common voltage are simultaneously measured, the ratio of which is used when calculating parameters of liquid electrolytes and dielectric materials using mathematical expressions. Simultaneous measurement of said voltages and use of their ratio when calculating values of certain parameters prevents errors due to instability of voltage and frequency of the power supply. The invention also discloses a device which realises this method.

Method for determining dynamic inductance of reactor and device for its implementation

Method for determining dynamic inductance of reactor and device for its implementation

Method for determining dynamic inductance of reactor consists in the fact that inductance is calculated in increase and decrease sections as per measured values; one of the values is k instantaneous voltage values on reactor, and the other one is k instantaneous current values of reactor, as ratio of product of section duration by average voltage value of reactor, after deduction of voltage drop on its active resistance, to current increase in increase and decrease sections; then, arithmetical average of two inductances of reactor is determined. The device implementing this method is also proposed.

Method of determining induction motor stator winding phase dissipation and device to this end

Method of determining induction motor stator winding phase dissipation and device to this end

Constant voltage U0 and stator winding current connected in three-phase circuit are measured. Stator winding is short-circuited with rotor stationary. Stator decaying current derivative (di1/dt)t=0 is measured at transition process beginning. Induction motor stator winding phase inductivity Lf=-k·U0·(di1/dt)-1 t=0 is calculated where k is factor defined by stator winding phase connection circuit. Device to implement said method is also covered by proposed invention.

Method and device to measure parameters of multiple dipoles

Method and device to measure parameters of multiple dipoles

Parameters of multiple dipoles are measured on supplying measurement circuit comprising standard simple dipole and measured article connected in series therewith by voltage pulses varying by law of time Nth-power function via N-fold differentiation of supply pulse voltage and voltage across multiple dipole, measuring supply pulse voltage during pulse termination and voltage across measured dipole, as well as voltages at outputs of differentiating cascades in both channels, calculating quotients of magnitudes measured at relevant points of both differentiators, determining generalised parameters of measured multiple dipole and calculating electrical parameters of its components. Device to implement said method is also covered by proposed invention.

Device for measuring relative permittivity and loss-angle tangent of liquid

Device for measuring relative permittivity and loss-angle tangent of liquid

In a device for measuring permittivity and loss-angle tangent of a liquid, having a photonic crystal with periodicity of variation of the wave impedance in the direction of propagation of electromagnetic radiation, having an area with violation of periodicity, according to the solution, the photonic crystal is in form of alternating sections of a microstrip transmission line with different wave impedance values. The device also has a measuring cell for the analysed liquid in form of a section of the microstrip transmission line filled with air, lying on the area with violation of periodicity.

Method and apparatus for tomographic measurement of multiphase flow

Method and apparatus for tomographic measurement of multiphase flow

At step (a) a Venturi tube is used to create conditions for generating a stream with symmetrical gas concentration in a stream of a multi-component mixture. At step (b) density distribution and/or permittivity on the cross-section of the pipe is determined in the said symmetrical stream. At step (c) a function which describes radial distribution of density and/or permittivity is determined. At step (d), the Venturi tube is used to determine the velocity of the multi-component mixture. At step (e), temperature and pressure are measured. Based on information obtained at steps (a), (b), (d) and (e), and a mathematical function which describes radial distribution of density and/or radial distribution of permittivity, as well as knowledge of density and/or permittivity of components of the fluid mixture, volumetric and/or mass flow of gas and liquid components of the mixture is determined.

Resonance near-field device for microwave microscope

Resonance near-field device for microwave microscope

Device is a rectangular waveguide to which a microwave generator and a measurement device is connected. The device has an inductive diaphragm 2 fitted in the waveguide 1, perpendicular to the wide wall of the waveguide. A capacitive diaphragm 3 is fitted at a distance Λ/10 (Λ is the fundamental wavelength), the connection plane of which is parallel to the connection plane of the inductive diaphragm. Two rectangular metal projections 4, 5 are fitted in the space between the diaphragms in a single plane perpendicular the wide wall of the waveguide and parallel the narrow wall, where one of the projections is attached to the top half of the capacitive diaphragm and the second to the bottom half of the capacitive diaphragm. The projection 4 has ohmic contact with the top half of the capacitive diaphragm 5 with the top. The distance between the edges of the projections and the plane of the inductive diaphragm is approximately Λ/100. The distance between edges of the projections and the plane of the inductive diaphragm is selected based on the condition for resonance with low reflection coefficient arising.

Method of detecting synergetic effect in composite corrosion inhibitors via low-frequency measurements

Method of detecting synergetic effect in composite corrosion inhibitors via low-frequency measurements

Method involves using solenoid inductance coils of the same size (L cells), working in the 10 kHz - 50 MHz frequency range. The inductance coils are connected the an oscillatory circuit of a Q-metre and the Q-factor and the resonance capacitance of the mixture of reagents is measured before and after adding corrosion inhibitors into the L cells of Q5, C1 and Q2, C2 respectively. The measured Q1, C1, Q2, C2 are then used to determine parameters which characterise dielectric properties of the analysed mixture, which indicate the degree of the synergetic effect of the analysed corrosion inhibitors, and the said parametres which characterise dielectric properties of corrosion inhibitors are real ε' and imaginary ε'' components of complex permittivity.

Fluid physical properties metre

Fluid physical properties metre

Proposed device comprises metal cylinder arranged in controlled fluid flow to accommodate internal U-shape conductor with generator connected thereto to excite oscillations in aforesaid cylinder, and unit to measure resonance frequency of aforesaid cylinder. Note here that frequency-modulated oscillation generator is connected to one end of said cylinder via high-frequency transformer, while resonance frequency metre is connected to opposite end of said cylinder via second HF transformer.

Microcontroller device to analyse dielectric properties of biological objects and insulation materials

Microcontroller device to analyse dielectric properties of biological objects and insulation materials

Proposed device comprises microcontroller 1, first resistor 2 with known resistance (R1), capacity transducer 3 of measured capacity (Cx), second resistor 4 with known resistance (R2), third resistor 5 of measured resistance (Rx), integrating RC-component 6, and digital indicator 7. Resistors 2, 4 and 5 have their first outputs connected to first input of analog comparator of microcontroller 1 and first plate of transducer 3, input of RC-component 6 is connected to first input of analog comparator built in microcontroller 1, output of RC-component 6 is connected to output of pulse-width modulator built in microcontroller 1, second outputs of resistors 2, 4 and 5 are connected to first, second and third outputs of microcontroller 1, respectively. Second plate of transducer 3 is connected to common wire, indicator 7 is connected to microcontroller in a known circuit.

Method of measuring resistance, inductance and capacitance (versions)

Method of measuring resistance, inductance and capacitance (versions)

Four successive cycles are made for measuring oscillation frequency where in the first cycle, the measured value is created. In the second cycle, which is carried out at a fixed time interval after the beginning of the first cycle, a measured value is created. In the third cycle, a measured value is created. In the fourth cycle, a measured value is created and the unknown value of the measured passive electric element is determined using the formula .

Method of measuring resistance, inductance and capacitance and devices for realising said method

Method of measuring resistance, inductance and capacitance and devices for realising said method

Three successive cycles are made for measuring oscillation frequency at different configuration of a frequency sensitive circuit. In the fist cycle, a measured value is created, where Zst1 is a first standard passive electric element which is homogenous with the measured electric element. In the second cycle, a measured value is created, where Zst2 is a second standard passive electric element which is homogenous with the measured electric element. In the third conversion cycle, a measured value is created, where Zst3 is third standard passive electric element which is homogenous with the measured electric element. The unknown value of the measured electric element is determined using the formula where N1, N2, N3 are results of the first, second and third conversion cycles respectively.

Microcontroller device for capacity and resistance measurement

Microcontroller device for capacity and resistance measurement

Invention relates to measurement equipment, in particular - to devices for measurement of capacity and active resistance. The measurement transducer of capacity and resistance into a binary code contains a microcontroller, a reference resistor, a capacity sensor, a reference capacity capacitor and the measured resistance resistor. The first outputs of the resistors of the reference and measured resistance are connected to the first plates of the capacity sensor and the reference capacity capacitor accordingly. Additionally introduced into the measurement transducer is a resistive voltage divider. The fist and second outputs of the voltage divider resistors are connected to the first input of the microcontroller comparator and the microcontroller power supply accordingly.

Microcontroller metering transducer of capacitance and resistance into binary code

Microcontroller metering transducer of capacitance and resistance into binary code

Metering transducer of capacitance and resistance into binary code comprises microcontroller, reference resistor, capacitance sensor, capacitor of reference capacitance and resistor of measured resistance. Resistors of reference and measured resistance by the first terminals are connected to the first plates, accordingly, of capacitance sensor and capacitor of reference capacitance. Additionally resistive divider of voltage is added into metering transducer. The first terminals of voltage divider resistors are connected to the first input of analogue comparator of microcontroller, and the second ones - to terminals of microcontroller supply.

Device for measurement of chemical current sources inductance

Device for measurement of chemical current sources inductance

Device for measurement of chemical current sources inductance contains non-discharge breaker, measuring capacitor bank, stabilitron, commutator and time-domain voltmetre. Non-discharge breaker is made as switch bypassed by stabilitron; one switch output is connected to common output of measuring capacitor bank and the first output of time-domain voltmetre, and the second switch output is connected to the second output of time-domain voltmetre and to commutator output the second output of which is connected to branch outputs of measuring capacitor bank.

Microcontroller for measuring shaft rotation frequency

Microcontroller for measuring shaft rotation frequency

Invention relates to measurement technology particularly to the devices for measuring shaft rotation frequency using a capacitance sensor and can be used in automatic process control systems to measure nonelectrical quantities. The microcontroller for measuring shaft rotation frequency contains a microcontroller, an indicator, a capacitance sensor and two resistors. The indicator is connected to one of the microcontroller ports. The first plates of the sensor and the capacitor are connected to the common wire, the second plates of the sensor and the capacitor are connected to the first and second ports of the analog comparator of the microcontroller respectively, as well as to the first terminals of the resistors whose second terminals are connected to the microcontroller terminals.

Method of determinating scattered inductance of three-phase high voltage winding of power transformer

Method of determinating scattered inductance of three-phase high voltage winding of power transformer

Invention refers to measuring technology and can be used for determination of scattered inductance of high-voltage winding of power transformers with installed thereon fast-response regulators under load. The essence of the invention is as follows: oscillography of transient phase currents is performed in the mode of turning a switching device from one branch of winding to another. Also direct current is simultaneously and symmetrically fed to its three phase outputs. Low voltage winding is in the idle mode. Obtained curves of transient phase currents are represented analytically on negative-going intervals of current values in form of sum of direct component of balanced current and exponential free component of transient current. Scattered inductance of high-voltage winding of each phase (LσBH) is calculated by formula: LσBH=Rc·τ, where Rc is summary resistance of circuit elements of high-voltage winding of transformer, τ is time constant calculated as difference of time t2 and t1 where instantaneous values of currents are determined with experimental curve of transient current.

Device for measurement of material parametres

Device for measurement of material parametres

Invention is related to the field of radio engineering and electronics and may be used both independently for measurement of electrophysical parametres of materials and as more complex functional devices: complex measurement systems, complex systems for production and control of material parametres, automated measurement, production and production-measurement complexes, etc. Device, according to invention, represents a rectangular wave guide with connected SHF generator, having shorting device 2, measurement device. Device comprises pin 3, installed in central part on one of wide walls of wave guide 1 parallel to shorting device 2. Height of pin h is less than size of wave guide b, so that between pin and other wide wall there is a gap. Shorting device 2 has a semicircular indent 4 on surface inverted inside wave guide, being parallel to pin along the whole width, and hole 5, probe in the form of needle 6 is coaxially installed in indent, being galvanically connected by means of connection loop 7 to shorting device 2, protruding beyond limits of wave guide 1. Distance from pin 3 to shorting device 2 and value of gap are selected on the basis of resonance appearance with low reflection ratio.

Method for detection of dielectric permeability of conducting mediums in optical and infrared range of spectrum

Method for detection of dielectric permeability of conducting mediums in optical and infrared range of spectrum

Invention is related to the field of optics of condensed mediums and may be used to detect optical constants of conducting mediums. Method for detection of dielectric permeability of conducting mediums in optical and infrared range of spectrum includes action of pulse of monochromatic laser radiation with p-polarisation at flat surface of sample, registration of photoelectric signal on sample surface and angle of laser radiation beam fall, corresponding to generation of photoelectric signal of maximum value and calculation of dielectric permeability according to suggested formula.

Method for measurement of resonance frequency and device for its realisation

Method for measurement of resonance frequency and device for its realisation

Invention is related to measurement equipment and may be used for high-precision remote detection of resonance frequency of resonators applied in different fields of engineering and scientific research. In particular, it may be used in radio-wave resonant sensors of moisture content and level of oil products. In suggested method measurement of resonant frequency based on excitation of electromagnet oscillations with alternating frequency at the inlet, fixation of maximum amplitude of oscillations at the outlet of resonator and measurement of oscillations frequency f1 corresponding to this maximum amplitude, is achieved by the fact that at the inlet and outlet of resonator they periodically alternate sign of reactive resistance of external circuits connected to resonator, in case of each variation of this sign frequency f2 is measured, which corresponds to maximum amplitude of oscillations at the outlet of resonator, and resonance frequency is detected as average value of frequencies f1 and f2. Also device is suggested for realisation of above described method for measurement of resonant frequency.

Another patent 2545887.

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