Device for measurement of complex permittivity of low- impedance materials at microwave frequencies

FIELD: radio measurements of parameters of absorbing low-impedance dielectric materials at microwave frequencies, in particular, measur5ement of the complex relative permittivity and the loss tangent of a dielectric of composite materials characterized by high values of complex relative permittivity and conductance.

SUBSTANCE: measurements are taken with the aid of a waveguide traveling-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality of resonance frequency, attenuation and quality factor.

EFFECT: enhanced precision of measurement of the value of the complex permittivity of low-impedance dielect6ric materials at microwave frequencies, having high values of complex permittivity .

2 cl, 1 dwg

 

The invention relates to the field of radio parameters absorbing a low-impedance dielectric materials at microwave, in particular to the measurement of complex relative permittivity and tangent of dielectric loss angle of composite materials, characterized by large values of the complex relative permittivityand conductivity.

The closest to the technical nature of the claimed invention is selected as a prototype device for measuring complex permittivity of the indirect method, comprising: a microwave generator, a measuring device for measuring the complex reflection coefficient, a rectangular waveguide with a longitudinal slit on the side, which in the measurement process closes the reference coreconnection or measured sample [see RF Patent №2199760, B. I., No. 6, 2003]. The measurement is carried out in two stages: first is the complex reflection coefficient from the reference corodinates, then from the measured sample, the results of measurements of the complex reflection coefficients of the computation of the complex dielectric permittivity of the material being measured.

The obstacles to achieve specified below technical is one result of using a known device, taken as a prototype, is that in the known device is not sufficient to accurately define the value of complex permittivity of low-impedance dielectric materials. These limitations on the accuracy gives waveguide measurement method.

The invention consists in increasing the accuracy of measurement of complex permittivity of low-impedance composite dielectric materials. To improve the accuracy of measuring the dielectric permittivity of low impedance materials, waveguide with a longitudinal slit on the side wall is made of a ring, representing the waveguide traveling wave resonator that is connected to the waveguide path through the communication hole. The ring is made so that its surface had a linear plot, which installs a reference corodinates or the sample to be measured. The design of traveling wave resonator shown in the drawing. The resulting waveguide device implements resonance measuring method which is more accurate compared to the waveguide method. The measured parameters are the traveling wave resonators with reference coreconnection and the measured sample: the resonant frequency of the resonator.

The technical result - the possibility of more accurate, what about measuring the values of complex permittivity of low-impedance dielectric materials at microwave, with large values of complex dielectric permittivitywhat is needed in the production process of such materials when the monitoring technology and the design of microwave products from such materials, for example, protective shelters.

This technical result in the implementation of the invention is achieved in that in the known device for the measurement of complex permittivity of low impedance materials at microwave containing a microwave generator, which is connected to the measuring device for measuring the complex reflection coefficient of which is connected to the rectangular waveguide with a longitudinal slit on the side, which in the measurement process closes the reference coreconnection or measured sample.

The peculiarity lies in the fact that the waveguide with a longitudinal slit on the side wall is made circular and is connected to the waveguide path via hole connection.

In addition, the peculiarity lies in the fact that as a measuring device used device for measuring the resonant frequency and quality factor of the resonator.

The invention is illustrated in the drawing, which shows the structural diagram of the waveguide traveling wave resonator 1, on the side wall of which is made of longitudinal y is l, which in the measurement process closes the reference coreconnection or measured by the sample 2, the traveling wave resonator 1 through the communication hole 3 is connected to the waveguide path 4.

Information confirming the ability of the invention to provide the above technical result is the following.

The device comprises a microwave generator, a measuring device for measuring the resonant frequency and quality factor of the resonator, the waveguide traveling wave resonator 1 [see Jaltman. devices microwave. - M.: Publishing house “Mir”, 1968. - 234 S.], reference coreconnection and the sample to be measured 2.

The operation of the device is as follows. The traveling wave resonator 1, consisting of an annular waveguide on the side wall of which is made a longitudinal slit long length, parallel to the axis of the waveguide, supplied with matching bevels, which in the measurement process closes the reference coreconnection or measured by the sample 2, is connected to the measuring circuit and the microwave generator. From the microwave generator according to the waveguide path 4 is served probing electromagnetic wave, which through hole connection 3 branches in the resonator 1. First measurement of resonant frequency, quality factor of the cavity traveling wave and attenuation with reference coreconnection, then made what are the measurements of the resonance frequency, the resonator q factor of the traveling wave and the attenuation of the measured sample, which is installed in place of the reference corodinates. The resonance condition corresponds to the minimum field strength at the output of the resonator in the waveguide path, the condition of antiresonance is the maximum field strength at the output of the resonator in the waveguide path. The results of resonant frequency and quality factor of the cavity traveling wave with the measured material and the reference coreconnection computes the complex dielectric permittivity of the material being measured.

Thus, the above data confirm that the implementation of the use of the claimed device the following set of conditions:

the tool embodying the claimed device in its implementation, is intended for use in industry, namely in the measurement of complex permittivity of low impedance materials;

- for the claimed device as it is described in the independent clause sets out the claims, confirmed the possibility of its implementation using the steps described in the application or known before the priority date tools and methods;

the tool embodying the claimed invention in its implementation, is able to achieve a Usma is those by the applicant of the technical result.

Therefore, the claimed invention meets the condition of “industrial applicability”.

1. Device for measuring complex permittivity of low impedance materials at microwave containing a microwave generator, which is connected to the measuring device for measuring the complex reflection coefficient of which is connected to the rectangular waveguide with a longitudinal slit on the side, which in the measurement process closes the reference coreconnection or measured sample, characterized in that the waveguide with a longitudinal slit on the side wall is made circular and is connected to the waveguide path via hole connection.

2. The device according to claim 1, characterized in that as a measuring device used device for measuring the resonant frequency and quality factor of the resonator.



 

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