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Device for measurement of high values of complex permittivity of low-impedance materials at microwave frequencies

Device for measurement of high values of complex permittivity of low-impedance materials at microwave frequencies
IPC classes for russian patent Device for measurement of high values of complex permittivity of low-impedance materials at microwave frequencies (RU 2247399):
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FIELD: radio measurements of low-impedance dielectric materials at microwave frequencies, in particular, measurement of the complex relative permittivity and the loss tangent of a dielectric of composite materials characterized by high values of complex relative permittivity and conductance.

SUBSTANCE: measurements are taken with the aid of a waveguide standing-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality factor.

EFFECT: enhanced precision of measurement of the value of the complex permittivity of low-impedance materials at microwave frequencies, having high values of complex permittivity .

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The invention relates to the field of radio parameters absorbing a low-impedance dielectric materials at microwave, in particular to the measurement of complex relative permittivity and tangent of dielectric loss angle of composite materials, characterized by large values of the complex relative permittivityand conductivity.

The closest to the technical nature of the claimed invention is selected as a prototype device for measuring complex permittivity of the indirect method, comprising: a microwave generator, a measuring device for measuring the complex reflection coefficient, rectangular waveguide, short-circuited at one end, with a longitudinal slit on the side, which in the measurement process closes the reference coreconnection or measured sample [see RF Patent №2199760, BI No. 6, 2003]. The measurement is carried out in two stages: first measurement of the complex reflection coefficient from the reference corodinates, then from the measured sample, the results of measurements of the complex reflection coefficients of the computation of the complex dielectric permittivity of the material being measured.

For reasons prepyatstvyy the achievement of specified following technical result when using the known device, taken as a prototype, is that in the known device is not sufficient to accurately define the value of complex permittivity of low-impedance dielectric materials. These limitations on the accuracy gives waveguide measurement method.

The invention consists in improving the accuracy of measuring the dielectric permittivity of the low impedance of composite materials. To do this in the waveguide path is created waveguide cavity standing wave, formed of a short-circuited waveguide with a longitudinal slit, separated from the waveguide path aperture, running on the reflection of electromagnetic waves. The measured parameters are the resonance frequency and the quality factor of the resonator.

The technical result - the possibility of more accurate measurement of complex permittivity of low-impedance dielectric materials at microwave with large values of complex dielectric permittivitywhat is needed in the production process of such materials when the monitoring technology and the design of microwave products from these materials, such as protective shelters.

This technical result in the implementation of the invention is achieved by the known is a device for measurement of complex permittivity of low impedance materials at microwave, containing a microwave generator, which is connected to the measuring device, connected to a short-circuited rectangular waveguide with a longitudinal slit on the side, which in the measurement process closes the reference coreconnection or measured sample.

The peculiarity lies in the fact that there is a standing wave resonator, made of a short-circuited waveguide with a longitudinal slit on the side, separated by the diaphragm from the waveguide path.

In addition, the peculiarity lies in the fact that as a measuring device of the complex reflection coefficient is used device for measuring the resonant frequency and quality factor of the resonator.

Conducted by the applicant's analysis of the prior art, including searching by the patent and scientific and technical information sources and identify sources that contain information about the equivalents of the claimed invention, has allowed to establish that the applicant had not discovered similar, characterized by signs, identical with all the essential features of the claimed invention.

The definition from the list of identified unique prototype, as the most similar in essential features analogue, has identified a set of essential towards perceived by the applicant to the technical result of the profile is part of the signs in the inventive device, set forth in the claims.

Therefore, the claimed invention meets the condition of “novelty”.

To verify compliance of the claimed invention the term “inventive step”, the applicant conducted an additional search of the known solutions, in order to identify signs consistent with a non-prototype features of the claimed device. The search results showed that the claimed invention not apparent to the expert in the obvious way from the prior art because the prior art defined by the applicant, not the influence provided the essential features of the claimed invention transformations on the achievement of the technical result, in particular, the claimed invention does not provide for the following requirements:

- addition of known means of any known part attached to it according to certain rules to achieve a technical result, in respect of which it is the effect of such additions;

- replacement of any part of the other known means known part to achieve a technical result, in respect of which it is the effect of such a change;

- the exclusion of any part of the funds while the exclusion of its functions and the achievement is due to f is a function and achievement with the usual result of such exclusion;

- increasing the number of identical elements to enhance the technical result due to the presence in the vehicle is of such elements;

- execution of a known drug or part of a known material to achieve a technical result due to the known properties of this material;

- creation of tools, consisting of well-known parts, the choice of which and the relationship between them is carried out on the basis of known rules, recommendations and achievable technical result is due only to the known properties of the parts of this tool and the relationships between others.

The described invention is not based on the change of the quantitative trait, the submission of such evidence in the relationship, or change its appearance. This refers to the case when the known fact of the influence of each of these features on the technical result, and the new values for these characteristics or their relationship could be obtained from the known dependency relationships.

Therefore, the claimed invention meets the condition of “inventive step”.

Information confirming the ability of the invention to provide the above technical result is the following.

The device comprises a microwave generator, a standing wave resonator, the implementation of the tion of the waveguide with a longitudinal slit on the side wall and the aperture in the waveguide path, device for measuring the resonant frequency and quality factor of the resonator, reference coreconnection and the measured sample [see Jaltman devices microwave. - M.: Publishing house “Mir”, 1968. - 231 S.].

The operation of the device is as follows. The cavity standing wave, consisting of the diaphragm and the short-circuited waveguide on the side wall of which is made a longitudinal slit long length, parallel to the axis of the waveguide, supplied with matching bevels, which in the measurement process closes the reference coreconnection or measured by the sample, is connected to the measuring circuit and the microwave generator, the measured resonance frequency and the quality factor of the resonator. From the microwave generator through the waveguide is served probing electromagnetic wave, which through hole connection aperture branches in the resonator. First measurement of resonant frequency and quality factor of the cavity standing wave with a reference coreconnection, then measurement of resonant frequency and quality factor of the cavity traveling wave with the measured sample, which is installed in place of the reference corodinates. The results of resonant frequency and quality factor of the resonator with the measured material and the reference coreconnection value is calculated complex dielectric permittivity and the measured material.

Thus, the above data confirm that the implementation of the use of the claimed device the following set of conditions:

the tool embodying the claimed device in its implementation, is intended for use in industry, namely in the measurement of complex permittivity of low impedance materials;

- for the claimed device as it is described in the independent clause sets out the claims, confirmed the possibility of its implementation using the steps described in the application or known before the priority date tools and methods;

the tool embodying the claimed invention in its implementation, is able to achieve perceived by the applicant of the technical result.

Therefore, the claimed invention meets the condition of “industrial applicability”.

1. Device for measuring complex permittivity of low impedance materials at microwave containing a microwave generator, which is connected to the measuring device, the reflectance of which is connected to the short-circuited rectangular waveguide with a longitudinal slit on the side, which in the measurement process closes the reference coreconnection or measured sample different is seesa fact, the use of a standing wave resonator, made of a short-circuited waveguide with a longitudinal slit on the side, separated by the diaphragm from the waveguide path.

2. The device according to claim 1, characterized in that a measuring device of the complex reflection coefficient is used device for measuring the resonant frequency and quality factor of the resonator.

 

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