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Device for inspecting surface roughness Device has, mounted on a board, a three-axis precision table on which there is an X-ray tube which emits in the soft X-ray range, and an ion source for cleaning the target, a monochromator chamber in which there is a monochromator and a probing beam intensity monitor, and a chamber for analysed samples in which there is a five-axis goniometer. The monochromator chamber and the chamber for analysed samples are connected to each other through a first gate; the monochromator used is a spherical Schwarzschild lens; the monochromator chamber is connected to an ion pump and the chamber for analysed samples is connected in series through a second gate to turbomolecular and forevacuum clean pumps, respectively. |
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Method of determining concentration of element in substance of complex chemical composition Sample of analysed substance is irradiated with monochromatic gamma- or X-ray radiation while simultaneously recording intensity of characteristic radiation and primary radiation non-coherently scattered by said sample, wherein concentration of the element is established based on an analytical parameter which takes into account the characteristic radiation background effect. |
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Improved security system for screening people Scanning system has two scanning modules that are placed in parallel, yet opposing positions relative to each other. The two modules are spaced to allow a subject, such as a person, to stand and pass between the two scanning modules. The first module and second module each include a radiation source (such as X-ray radiation) and a detector array. The person under inspection stands between the two modules such that the front side of the person faces one module and the back side of the person faces the other module. |
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Thermal processing of tested samples in carried out in vacuum or inert gas with further analysis, in which a degree of conversion of diamond-like forms of boron nitride into a graphite-like phase with a hexagonal structure is determined and used to assess a value of the product heat resistance, with the samples being crushed to a fraction size value of 100÷500 mcm before thermal processing and carrying out the sample analysis by an X-ray phase method. |
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Control over continuous heat treatment Invention relates to machine building and metallurgy. It aims at preventing the rejects of continuously annealed metal blank and allowing the maximum metal yield. Continuous thermal processing is continuously controlled by NDT testing of mechanical properties after thermal processing. Electric power intensity is used as a control record. Current power consumption is compared with power inputs derived from preset regression dependence of mechanical properties on power costs per unit for required mechanical properties. Blank heat treatment conditions are adjusted to make the magnitude of power inputs fall in the range of tolerable magnitudes. |
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Surface of an analysed object is irradiated with low-energy ions of inert gases; the energy spectrum of ions reflected from the surface is recorded; the energy position and values of peaks of adatoms of the subnanolayer film and peaks of atoms of the adsorbent (substrate) in the energy spectrum of the reflected ions are measured; the types of adatoms and atoms of the substrate are determined from the energy position of the peaks in the spectrum; said measurements are then taken on a test object with different concentrations of adatoms in the range from a pure surface of the adsorbent (substrate) to one monoatomic layer; the relationship between values of peaks of the test substrate and adatoms and the concentration of adatoms is then determined; concentration of adatoms on the surface of the analysed object is then determined from the ratios of the values of peaks of adatoms and the substrate of the analysed object and the test object, respectively. Spectra for pure bulk substrate materials and adatoms on linear extrapolation are then used to determine the values of peaks for the determined concentrations; the charge state of adatoms and atoms of the substrate (adsorbent) is then determined from the ratios of the measured peaks of adatoms and the substrate of the analysed object to the linearly extrapolated values of peaks. |
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Method for x-ray assessment of temperature conditions of operation of tubular elements of boilers Tube element sample is prepared, as well as a standard from a piece of a pipe that has not been operated in the boiler, having similar composition and method of manufacturing, X-ray study of the standard is carried out in the thermocycling mode in the cycle "heating - cooling down to room temperature", it is used to build dependence of ratios of integral intensities produced under room temperature for two strongest diffraction lines that are not superimposed with diffraction lines of other phases from thermocycle temperature, X-ray study of the tube element sample is carried out under room temperature, for which they determine the ratio of integral intensities of the same two diffraction lines, ratios of integral intensities of diffraction lines in the sample and the standard are compared, and the temperature of operation of the tube element section is defined, accepting it as equal to the standard temperature at this value of the ratio of integral intensities. |
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Scanning device using radiation beam for backscattering imaging and method thereof Scanning device includes a radiation source; a stationary shield plate and a rotary shield body positioned respectively between the radiation source and the subject to be scanned, wherein the stationary shield plate is fixed relative to the radiation source, and the rotary shield body rotates relative to the stationary shield plate. The beam passing area permitting beams from the radiation source to pass through the stationary shield plate is provided on the stationary shield plate, and a beam incidence area and a beam exit area are respectively provided on the rotary shield body. During the process of rotating and scanning of the rotary shield body, the beam passing area of the stationary shield plate intersects consecutively with the beam incidence area and the beam exit area of the rotary shield body to form scanning collimation holes. Further, a scanning method using a radiation beam for backscatter imaging is also provided. |
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Method and device for performance of x-ray analysis of sample Use: for performing X-ray analysis of the sample. The invention consists in the fact that irradiation is performed with X-rays from a sample source of polychromatic X-ray radiation, a combined device is used for recording of XRD and XRF, comprising a scanning wavelength selector and at least one X-ray detector dedicated for registration of X-rays selected by the wavelength selector, and performing XRD-analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample, using a scanning wavelength selector and recording the selected X-ray fixed wavelength (wavelengths) on one or more values of the angle of diffraction φ of the sample using the detector (s) of X-ray radiation, and/or performing XRF-analysis of a sample by scanning the wavelengths of X-rays emitted from the sample, using a scanning wavelength selector and registration of the scanned x-ray wavelengths, using the detector (s) of X-radiation. |
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Method for x-ray diffraction control of part X-ray picture is taken off a controlled part, a parameter is determined, which depends on part running time, at the same time X-ray picture taking off the controlled part on the suggested surface of damage is carried out from the reflecting plane (11.0) without background with usage of titanium radiation Ti-Kα and from the reflecting plane (01.3) without background with usage of titanium radiation Ti-Kβ, at the same time the parameter depending on running time is the integrated structural parameter Δ, defined as the product of the diffraction line width B parameter without background and diffraction line profile P parameter without background: Δ=B·P, besides, the part is of good quality, if the integrated structural parameter is more than 1: Δ>1. |
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Lithium-iron phosphate having olivine structure and method for analysis thereof Invention can be used in chemical industry. Lithium-iron phosphate having an olivine crystal structure has a composition expressed by the chemical formula (I) L1+aFe1-xMx(PO4-b)Xb (where M is selected from Al, Mg, Ti; X is selected from F, S, N; -0.5≤a≤+0.5; 0≤x≤0.5; and 0≤b≤0.1 ), contains 0.1-5 wt % Li3PO4 and does not contain or contains less than 0.25 wt % Li2CO3. Content of Li3PO4 in the lithium-iron phosphate increases electrochemical stability and ensures thermal safety and ion conductivity. |
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Method and apparatus for recording diffraction reflection curves Beam of X-ray radiation of a given range is directed onto an analysed crystal and intensity of X-ray radiation diffracted in the analysed crystal is determined using a detector, with successive measurement of parameters of diffraction conditions of the picked up X-ray reflection, wherein parameters of diffraction conditions are varied by modulating the interplanar distance of the picked up X-ray reflection through ultrasonic radiation. |
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Method of quantitative determination of portland cement clinker phase composition Polished section is premade from Portland cement clinker to reveal phase present in said section under microscope. Thereafter, phase compositions are compared to correct phase composition defined from X-ray diffraction spectrum of phases revealed in minor quantities. Then, relationship between two alite monoclinic modifications are defined. Said alite is contained in clinker in major amount. Said modifications are defined by analysing asymmetry of superimposed reflections in the range of angles 2θCu =31.5-33°. Then, Ritweld method is used to define quantitative content of all revealed phases by, first, one monoclinic modification. Then, it is defined by second monoclinic modification. Now, defined is quantitative content of all phases in the range of their mean content and that obtained from monoclinic modification present in major amount. |
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X-ray diffraction method of identifying batches of pharmaceutical products Sample is irradiated with monochromatic X-ray radiation; the diffraction pattern from the sample is recorded in form of a profile of intensity of the diffraction X-ray radiation at different diffraction angles; diffraction peaks are selected; characteristics of the selected diffraction peaks are compared with similar characteristics of reference samples, from where phase composition of the analysed sample is determined; wherein for analysis, a series of samples is collected from each batch of the pharmaceutical product, said samples being in solid form and having packaging; each sample of the series with an intact structure is scanned without breaching the packaging; diffraction peaks corresponding to the packaging material are selected on the diffraction pattern; the range of angles for analysing the diffracted radiation is set, within which diffraction peaks for the material of each sample are selected, from which, using statistical methods, the identity of the corresponding series of samples, one of which is the reference, to one batch of the pharmaceutical product is established, and by selecting a standard series of the pharmaceutical product of a given manufacturer as the reference series, the authenticity of the pharmaceutical product is determined, wherein the wavelength of the monochromatic X-ray radiation is selected based on characteristics of the packaging material. |
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Apparatus for carrying out both x-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis of a crystalline sample, comprising an evacuable chamber; a sample holder located in the evacuable chamber, for mounting the crystalline sample so that it can be analysed; an XRF tube mounted in the evacuable chamber, for illuminating the crystalline sample with x-rays; an XRF detection arrangement for detecting secondary x-rays emitted from the surface of the crystalline sample as a result of illumination by x-rays from the XRF tube; an XRD tube, also mounted in the evacuable chamber but separate from the XRF tube, for illuminating the crystalline sample with x-rays; an XRD detection arrangement for detecting x-rays of a characteristic wavelength which have been diffracted by the crystalline sample; and a moveable XRD support assembly, comprising a first part configured to mount the XRD tube for movement of the XRD tube relative the sample holder, and a second part configured to mount the XRD detection arrangement for movement of the XRD detection arrangement relative the sample holder. |
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X-ray installation for formation of image of examined object and its application Invention relates to medical equipment, namely to devices for formation of examined object images. X-ray installation contains at least one X-ray source, emitting polychromatic X-ray radiation, first receiver or first unit of receivers of determining values of first intensity of passing X-ray radiation, second receiver or second receiver or second unit of receivers of determining values of second intensity emitted by examined object of fluorescent X-ray radiation, correlation unit, as well as device of output for display of examined object on the basis of signals of image elements. Application of X-ray installation for formation of examined object image, which contains at least one radio-opaque chemical element is realised by X-ray radiation, passing through examined object, and fluorescent X-ray radiation, emitted by said object. |
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X-ray diffraction apparatus and x-ray diffraction method X-ray diffraction apparatus has a mirror (18), having a reflecting surface (19) which is formed such that the angle in the plane parallel to the diffraction plane between the tangential line (38) of the reflecting surface (19), at any point on the reflecting surface (19), and the linear section (36) which connects any point and a sample (26) becomes constant and the crystal lattice plane which causes reflection is parallel to the reflection surface (19) at any point on the reflection surface (19); the X-ray detector (20) is one-dimensional, position-sensitive in the plane parallel to the diffraction plane; and the relative position of the mirror (18) and the X-ray detector (20) is defined in the plane parallel to the diffraction plane such that reflected X-ray beams (40) from different points on the reflecting surface (19) of the mirror (18) reach different points on the X-ray detector (20), respectively. |
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Apparatus and method of inspecting objects Object is irradiated with penetrating radiation which is formed into a first beam; the vehicle is irradiated with penetrating radiation which is formed into a second beam; radiation of the first and second beams scattered by the object is picked up to generate a scattered radiation signal; an image is reproduced in the scattered radiation based on the scattered radiation signal and parameters of the object are determined based on the obtained image, wherein emission of penetrating radiation in the first beam is assigned a first time period and emission of penetrating radiation in the second beam is assigned a second time period, where the first and second time periods are shifted by a fixed phase ratio. |
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Method for structural inspection of semiconductor multilayer structure (variants) FIELD: structural diagnostics. SUBSTANCE: sample is scanned in the context of the Bragg reflection with the use of Ω-method in the roentgen diffractometry single-step mode, furthermore, for multilayer structures with heterogeneous composition AlGaN/GaN with nanometric layers the roentgen single-crystal diffractometry is used with the power of 5-15 W and heterochromatic quasiparallel X-ray beam and a position-sensitive detector with an angular width of 10°-15°. At first the X-ray tube is fixed in the position of Bragg reflection for the crystallographic plane (0002) of the layer GaNm the samples are scanned via inclining the X-ray tube in the angular range lying on the left and on the right from the main diffraction maximum (0002) of the GaN layer and including all diffraction maximums of AlxGa(1-x)N/GaN structures, where x ranges from 0,1 to 0,9, and the single-step scanning is carried out by setting the X-ray tube consequently in several angular positions which correspond to the maximum reflection of each minor peak point, while recording the diffractogram with the same exposition for all minor peak points, and the exposition time ranges from 30 to 100 seconds. EFFECT: resolution of interference peaks corresponding to separate nanometric layers of semiconductor structures; use of low-capacity devices becomes possible. 3 cl, 3 tbl, 6 dwg |
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With the help of c X-ray diffractometry using a grazing primary X-ray flux one obtains an asymmetric reflection from crystallographic planes forming the largest angle with the substrate - epitaxial layer interface surface and determines deformation in epitaxial layers by change of the distance between the diffraction maximums from the epitaxial layer and the subsrtrate; one applies single-chip X-ray diffractometry with a quasiparallel X-ray flux with the flux total divergence and convergence = 12'-24'; the maximum reflection is obtained by way of the heterostructure azimuth turn round a normal to the heterostructure surface; the angle of the X-ray flux drop onto the surface is within the range of 2.5-9°; then one proceeds with the Bragg angle correction by way of changing the angle of the primary X-ray flux drop onto the crystallographic plane coinciding with the heterostructure surface until obtainment of the maximum reflection; using the system of crystallographic planes of epitaxial layers growth one obtains a simultaneous reflection from similar systems of crystallographic planes of growing epitaxial layers and the substrate, among other things, recording existence of an intermediate layer between them. |
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Method of determining object characteristics Characteristics of an object are determined based on mean free path length of penetrating radiation. An incident beam of penetrating radiation is generated, said beam being characterised by direction of propagation and energy distribution. Groups of detector elements are placed in the zone of the penetrating radiation beam in which each detector element is characterised by a field of view. The field of view of each detector element is collimated. Radiation scattered by the group of voxels of the object under investigation is detected, where each voxel is the intersection the field of view of at least one detector element with the direction of propagation of the incident penetrating radiation beam. Attenuation of the scattered penetrating radiation between pairs of voxels is calculated, where each voxel from the said pair corresponds to at least one of two directions of propagation of the incident penetrating radiation beam. |
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Method and device for determining density of substance in bone tissue Invention relates to medicine, namely to radiodiagnostics of bone tissue state, and can be used in determination of such diseases as osteoporosis and osteopathy. Method includes irradiation of bone tissue by collimated beam of gamma-radiation, movement of gamma-radiation source and detector with movement of irradiation zone into bone tissue depth, registration of reversely dispersed irradiation with respect to falling beam and determination of substance density. Energy of gamma-irradiation photons is selected within the range from 50 keV to 1 MeV. Movement of gamma-irradiation source and detector is carried out by layer-by-layer displacement of zone of reversely dispersed irradiation. In addition, distribution of substance density along axis of probing is obtained by calculation of density in second measurement for second layer of substance and all following dimensions of layers to n-th one, by value of density, obtained in first measurement for first layer and all measurements for (n-1) layers. Device consists of patient's extremity fixer, gamma-irradiation source, collimator and detector of dispersed gamma-irradiation, combined into rigid assembly, moved by movement device along symmetry axis with displacement of irradiation zone into bone tissue depth. Movement device includes electric drive, connected by means of mechanic transmission links with rigid assembly. |
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Direction in which residual stress will be determined is selected on the surface of the inspected article, as well as crystallographic planes exposed to X-rays. The diffraction pattern is recorded. Angular positions of reflexes are determined, from the mutual alignment of which residual stress is determined. The method is characterised by that in order to determine residual stress in the selected direction and the direction perpendicular to the selected direction, crystallographic surfaces are used, reflexes from which lie in a precise region and normal projections to the surface of the inspected article of which have minimum angle of deviation from the selected direction. Further, the selected planes are successively brought into a reflecting position by turning and tilting the sample. The inspected article is exposed to an X-ray beam. Reflexes from the selected planes are recorded. The reflexes are processed in order to determine angular positions. True lattice constants of each of the phases which are not distorted by residual stress and then residual stress are determined using corresponding mathematical expressions. |
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Assayed steel samples are radiated with primary radiation of roentgen tube and there is measured intensity of secondary spectre. Also, before radiation there is additionally performed mono-chromatisation of roentgen radiation of the tube. Intensity of secondary spectre is measured by a reflected line of monochromatic roentgen radiation CuKα on lattice of iron carbides contained in assayed samples. On base of dependence obtained on standard samples there is determined content of carbon in assayed samples. |
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Method of coherent x-ray phase microscopy Solid object is irradiated by spatially coherent X-ray beam to detect diffraction 2D crosswise radiation intensity is far zone foe every discrete spatial position of object relative to sounding beam, 3D image is reconstructed by computer at spontaneous characteristics single-wave radiation to define mean contrast of 2D crosswise radiation spectrum field for every spatial position, coherence time τc of sounding radiation is decreased or radiation spectral line width Δvc is increased on changing from characteristic X-ray radiation to continuous decelerating X-ray radiation to magnitude corresponding to two-fold decrease in radiation spectrum filed contrast to define local phase lag τph from relation τph=τc=1/Δvc measured for every angle of object rotation so that 3D distribution of electron density and refractivity are reconstructed. |
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Device for remote detection of articles hidden in closed spaces of railway transport Proposed device comprises radiation source and detector mounted on transport facility connected via cable with power supply and computer. Note here that device is provided with plate conveyor. One plate of conveyor top branch chain supports carriage whereon arranged are radiation source and detector to perform limited reciprocation on conveyor guides from drive sprocket to driven sprocket mounted turned in horizontal plane relative to drive sprocket. Note that cable is fitted on drum to be wound up/off it with carriage reciprocating at constant tension. Note also that plate conveyor is arranged horizontally with its sprockets fitted on transport facility lateral walls. |
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Array of discrete X-ray sources based on carbon nanotubes is activated on a given time scheme for illuminating an object with a beam whose spatial orientation varies. X-rays are picked up after interaction with the object and signals are generated from sensors, after which an image of the object is constructed based on the time-varying signals from the sensors. |
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Adjustable device for irradiation and detecting radiation Adjustable device for irradiation and detecting radiation has a neutron source or a neutron source combined with other radiation sources, a system of robots and a mobile surface (10) connected to a main shaft (11) which is actuated mechanically, electrically or manually, and also raises and lowers a first platform (12) joined to it, on which a second platform (13) is mounted, wherein the second platform (13) can move by sliding relative the platform (12) in the direction of x and y axes through mechanical reducing gears and guides which are controlled manually or electrically, wherein the system of robots comprises three robots placed on the second platform (13) with possibility of moving on a given path and realisation of a virtual goniometre, wherein during movement of the robots on the given path, the system of robots creates conditions for viewing from different positions of radiation coming from the properly irradiated sample which is mobile or fixed. |
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Method for rapid x-ray spectral analysis of metallised iron-ore products Primary characteristic radiation of anode material of an X-ray tube is picked up on a series X-ray spectrometre with a chromium tube, where the said radiation is scattered by a sample prepared by pressing into a substrate made from boric acid. Intensity of the iron fluorescent line is also measured and the calibration curve is plotted as a function of the ratio of intensities of chromium and iron lines from the degree of metallisation, i.e. the ratio of metallic iron to total iron, wherein a pre-calibrated curve from 0 to 100% is present before obtaining the first production samples. Using the said calibration curve, the degree of metallisation of iron-ore metallised products is determined by direct measurement. |
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Method for ultrasonic gas protection of oil transformer Ultrasonic transducers are mounted on a transformer tank, which emit an ultrasonic signal and receive the reflected ultrasonic wave. The received signal is then transmitted to an ultrasound control unit, where it is processed and further transmitted to a signal digitisation unit and if the signal comes in distorted form, a relay protection instruction is generated for switching off the transformer. |
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Method of determining relative change in interplanar distance of perfect monocrystals Collimated beam of neutrons is directed at Bragg angle onto a system of two monocrystals: the first with interplanar distance d0 is standard and the second with interplanar distance d is the analysed monocrystal. Change in intensity of neutrons reflected from the standard crystal at Bragg angle 90° is determined using a detecting crystal with reflection coefficient of 50%. The beam is then directed into the analysed monocrystal and simultaneous fulfillment of Bragg condition is achieved at diffraction angle of 90° for the beam of neutrons reflected from the crystal in graphical planes of the standard and analysed crystals. Minimum reflection intensity from this crystal is then achieved by changing temperature of the standard crystal. The value of temperature difference between the standard and analysed crystals ΔT is determined at the minimum of the reflection curve which corresponds to change in interplanar distance of these crystals by a value Δd and, considering that angular dispersion at θd=90° is close to zero, relative change in interplanar distance of the analysed crystal is calculated using formula , where ξ is thermal coefficient of expansion of the standard crystal, ΔT is temperature difference between the standard and analysed crystals. |
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Method of determining local concentration of residual microstress in metals and alloys Method of determining local concentration of residual microstress in metals and alloys localised in micro-regions of the order of 1 micrometre involves obtaining an intensity distribution curve of the interference line of indices in long-range orders - large Vulf-Bragg angles on the X-ray diffractometre for the analysed material in point by point calculation mode or in diffractogram recording mode. The diffractogram is processed: drawing the background line, determination of the position of the 2θmax position and drawing the medial line. The area of cut off peripheral sections (S1 and S2) and the total area (Stot) of the diffractogram are measured. The local concentration value of residual microstress ratio (δ%) is then determined using the expression |
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Using: for determination of residual and operative surface tensions of polycrystalline materials and parametres of their crystal latitude. Investigated object is irradiated by narrow beam of radiac or X-ray radiation, M sections are separated from stream of reflected quanta, the quanta which hit each section within radiation period are recorded, reflected quanta distribution pattern is generated and value of determined parametre is calculated. Herewith, each of M separated from reflected quanta stream sections is assigned individual position code uniquely determined by its spatial coordinates among the rest separated sections. This code (when reflected quantum section is hit) is converted into code of its coordinates and immediately used to generate distribution pattern of reflected quanta and subsequent calculation of residual and operative surface tensions of polycrystalline materials and parametres of their crystal latitude. |
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Method for detection of criterion of metal and alloy resistance to brittle fracture Application: to detect criterion of metal and alloy resistance to brittle fracture. Detection of criterion of metal and alloy resistance to brittle fracture is carried out by assessment of values of local concentration of residual microstresses, which are localised in microareas of order 1 mc, for this purpose curve of long-range orders - high angles of Wulff-Bragg interferential line intensity distribution is obtained on X-ray diffractometre, background line is marked, 2θmax of curve is defined, and height of maximum is built, middle line is marked at the middle of height 2θmax, which defines width of interferential line, upper side branches are continued from the point of their crossing with middle line to line of background, areas of cut peripheral sections (S1 and S2) are measured, as well as overall area of diffraction pattern Soverall, ratios (δ%) are defined between sum of cut sections to overall area , which characterise value of local concentration of microstresses, which is a structural-sensitive characteristic, besides value of local concentration of microstresses δ% is detected previously for reference condition of material, and material inclination to brittle fracture is identified by comparison of produced values, and criterion of investigated material resistance to brittle fracture is accepted as minimum value δ%, which characterises most balanced structural condition of material. |
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Method of determining mosaic structure of crystal Invention can be used to determine mosaic structure of a crystal. A sample is put into a vacuum chamber. The sample is exposed to a narrow beam of X-ray radiation and the characteristic value of mean mosaic angle of the analysed sample η0 is evaluated from the characteristic width of the diffraction peak. The mosaic structure of the crystal is determined from distribution functions of micro-units of the mosaic crystal from mosaic angles η⊥,η// in two mutually perpendicular directions, for which the sample is put into a vacuum target chamber, which is fitted with a goniometre, exposed to a stream of broadband X-ray radiation, value of scattering angle of radiation χ is determined such that, Bragg frequency ωg=g/2sin(χ/2), in the neighbourhood of which is concentrated the radiation spectrum scattered by the crystal plane, recorded by the reciprocal lattice vector g, falls on the most flat section of the spectrum of primary radiation. After evaluation of the mean mosaic angle η0 a radiation detector with angular dimension Δϑ is fitted, where the angular dimension is equal to the ratio of the dimension of the detector to the distance between the detector and the target, at a distance which satisfies the equation Δϑ=η0. Using the goniometre, the orientation dependence of the number of scattered quanta Ng((φ') is determined, where φ' is angle of deviation of the crystal from the position of Bragg resonance, and the distribution function of micro-units of the mosaic crystal in a fixed plane is determined. The crystal is then turned 90 degrees about the average direction of the reciprocal lattice vector and orientation dependency is measured again using the goniometre, which enables determination of the distribution function of micro-units of the mosaic crystal in the perpendicular plane. |
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Method for determination of crystallographic texture of axisymmetric billets Application: to determine crystallographic texture of axisymmetric billets. Preparatory stage is carried out to produce calibration dependences, which includes stage of X-ray analysis that consists of sampling, pickup of three reverse pole figures on sites of samples characterised by normal lines directed along radius, along chord and along axis of billet, calculation is carried out by produced descriptions of pole figures for three parameters of anisotropy fz, fr, fφ where r, φ, z characterise radial, chord and axial directions of normal lines, measurement of hardness on sites with normal lines directed along radius, along chord HVφ, along axis HVz, calculation of dimensionless coefficients KHVr=HVr/HVz, KHVφ,=HVφ/HVz, for building of calibration dependences formulas in the form of fr=1/3-br(l-KHVr), fφ=1/3-bφ (1-KHVφ), where br and bφ are empirical coefficients, afterwards the main stage is realised, consisting of sampling, measurement of hardness in three orthogonal directions on sites with normal lines directed along radius HVr, along chord HVφ, along longitudinal axis HVz, calculation of dimensionless coefficients KHVr=HVr/HVz, KHVφ,=HVφ/HVz, calculation of two anisotropy parametres by formulas of calibration dependences produced at preparatory stage, and calculation of the third anisotropy parametre by formula fz=1-fr-fφ. |
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Way and device for measurement, orientation and fixing of at least one monocrystal Use for measurements, orientation and fixing of at least one monocrystal. A monocrystal is positioned for determination of crystal lattice orientation with alignment on a twirled table, and angles of planes normals of a crystal lattice to an axis of a twirled table are installed, in a time of at least one turn of a twirled table, by means of radio examination; then orientation of a monocrystal concerning an axis of a twirled table is carried out by means of the installed angles, serving as a main route before fixing of a monocrystal and fastening on the carrying agent oriented in a main route. |
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Invention can be used for determining concentration of an element and phase of the said element in a substance with complex chemical composition. A sample of analysed substance is exposed to monochromatic gamma- or X-rays. The following intensities are simultaneously recorded: primary radiation coherently scattered by the determined phase and primary radiation non-coherently scattered by the same sample. Concentration of the determined phase is established with respect to the said intensities. The said intensities are recorded at the same time as intensity of characteristic radiation of the determined element. Concentration of the determined element in the analysed sample is established from the ratio of intensity of characteristic radiation of the determined element to the intensity of radiation non-coherently scattered by the same sample. |
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Invention relates to metallurgy field and can be used for manufacturing of tanks of liquefied gas, low-temperature and cryogenic equipment, facilities for receiving of liquefied gas, rocket envelopes and tanks for keeping of propellant from steel 01X18H9T. Steel sheet is subject to effect of penetrating radiation. Integral width X-ray line 111, measured on characteristic radiation CoKα with overlapping probability 2.18·10-5, is 0.204±0.003 angular degree. |
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Method of determining magnetic and structural characteristics of nanometer spatialy-ordered systems Proposed invention is intended for defining the magnetic and structural characteristics of nanometre spatially-ordered systems. The proposed method consists in that, on defining the said characteristics, an external magnetic field is applied, at the point the specimen interacts with neutron beam, either parallel with or perpendicular to the neutron beam propagation direction. The external magnetic field magnitude is varied from zero to maximum and visa versa. The dependence of neutron scatter intensity upon the angle of scatter in external magnetic field is measured with the help of position-sensitive detector. The total and differential dependencies of the opposite-spin-orientation neutron scatter angular intensities upon external magnetic field magnitude are determined for parallel and perpendicular components relative to scatter intensity without external magnetic field. Now, the hysteresis shape of the aforesaid dependencies is used to determine the specimen magnetic properties and reversal magnetisation character. |
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Device and method for visualisation of objects in pipe that conducts fluid medium Application: for visualization of objects in pipe that conducts fluid medium. Substance: consists in the fact that high energy photons (2) are released in direction of target object (3) by means of controlled source of radiation (1), photons of backward scattering (4) coming from target object (3) are registered by means of sensor module (1a), which is equipped with diaphragm (5) for limitation of scattering, amplifier (6) and device (7) for registration of images, in cells of which electronic charges are created, which are transmitted to unit (8) for control and display via buffer memory inbuilt in device (7) for registration of images, image is formed on screen with application of registered signals, and then data of selected image section is compared to information on materials contained in data base, for definition of target object (3) composition by means of spectral analysis of backward photons. |
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Method for focusing of synchrotron radiation Application: for focusing of synchrotron radiation. Substance: consists in the fact that serial Bragg reflection of SR beam is carried out from crystalline monochromator, and full external reflection (FER) is realised from focusing mirror with permanent radius of cylindrical surface R and distance between mirror and focus q during installation of monochromator at Bragg angle θm to beam, of mirror - at an angle α, which does not exceed critical angle of mirror FER, at that angle α of mirror incline to beam and Bragg angle of monochromator θm are established according to the following formulas: α=2q/R[1+q(P0/b+l0)-1], tgθm=qtgθ0(p0/b+l0)-1, where p0 is distance between source of radiation and monochromator, l0 is distance between monochromator and mirror, b is factor of monochromator asymmetry, θ0 is Bragg angle that corresponds to selected reflex of investigated sample. |
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Another patent 2528639.