IPC classes for russian patent Composition for photoactivated etching of silicon dioxode films. RU patent 2513620. (RU 2513620):
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FIELD: chemistry.
SUBSTANCE: invention can be used in producing integrated microcircuits and other electronic devices which use a planar manufacturing technique based on photolithographic processes. The composition for photoactivated etching of silicon dioxide films includes a polymer base - polymethyl methacrylate, a photosensitive component - ammonium fluoride in trifluoroacetic acid solution, a solvent - acetone, a protophilic agent - diphenylamine.
EFFECT: invention simplifies the process of producing a photoetched pattern on a silicon layer, increases the rate of photoetching and significantly reduces defects in the obtained articles.
1 tbl, 4 ex
The invention relates to the field of microelectronics, in particular the production of integrated circuits and other electronic devices using planar photolithography.
Known photopolymerizable compositions for dry film photoresist, which are used to get the picture in the manufacture of printed circuit boards in electronic industry (RF patent №2163724, 7G03C 1/72, H01L 31/08, publ. 2001.02.27). Known composition includes a copolymer of styrene with mono-n-butylmalonate, disfunctionally acrylate, 1-chloro-2-hydroxy-3-methacryloyloxyethyl, inhibitor, photoinitiator, dye and compounds glycol. The disadvantage composition is its multi-component structure which requires the introduction of photoinitiators for the implementation of photochemical reactions.
Known photolithography process without the use phase of manifestation, which implements the dry transfer of the image to resist Si02 through a reaction between silicon dioxide with pairs of HF at temperatures above 100 degrees C. As catalysts in the process of etching compositions use organic bases and peroxide compounds affecting the mechanism of etching process (the Study of the reaction of etching on the border of silicon dioxide film resist in the photolithography process without the stage of manifestation. Studies on the interfacial etching reaction of development-free vapor photolithography/Hong Xiaoyin, Lu Jianping, Duan Shengquan, Chen Qidao, Wang Peiqing // J.Vac.Sci. and Technol. B. - 1999. - 17, 5. - C.2090-2095). For the process substrate covered with a film of photopolymer based cinnamate containing 5-nitroacenaphthene as photosensitive component and catalyst etching. The known method of lithography allows to exclude the operation of manifestation and zadabrivaniya photoresist.
The disadvantage of the composition is a need to introduce in its composition of catalysts, as well as the impossibility of using the composition for photolithography process to avoid a stage etching, which involves feeding into the system of toxic hydrogen fluoride HF at elevated temperatures.
Famous photo composition for etching films of silicon dioxide without using stages of manifestation, zadabrivaniya and etching, based on the reaction of donor-acceptor interaction in non-aqueous solvents using as photoactive light-sensitive component the ammonium fluoride and as profiling reagent and at the same time solvent for polymer base of poly used pyridine (Photo composition for etching films of silicon dioxide. RF patent №2330049). The song is selected as a prototype.
The disadvantage of the composition is a small etching rate (0,26 micron/min), and the use of toxic solvent - pyridine.
The objective of the invention is development of a composition for photo etching films of silicon dioxide SiO2 in the photolithography processes high speed etching, which leads to simplify the process of obtaining photolithographic figure in the silicon layer and a significant decrease in defects of the products obtained.
The problem is solved by the fact that, as in the prototype, a composition for photo etching films of silicon dioxide includes polymer base polymethylmethacrylate (PMMA) and photosensitive component, the ammonium fluoride in solution triperoxonane acid, but unlike the prototype as a solvent uses a secure acetone, and as profiling reagent - diphenylamine in the following ratio of components, mass%: polymethylmethacrylate of 5.6-6.5; ammonium fluoride 4,0-4,6; diphenylamine 16,6-19,2; acetone 45,3-52,2; triperoxonane acid 21,3-24,6.
The main feature of the new photo of the composition is the release of F-ions at the expense of donor-acceptor interaction NH 4 + -acid and profiling agent diphenylamine coming from ammonia emissions (equation 1):
Anion F - is released into the system in the future when the UV-irradiation formed active anion-radicals of fluorine, which poisoned the film silicon dioxide (equation 2, 3):
To carry out the invention take the components mass ratio presented in the claims.
Below is a staged preparation of solutions a, B and C that are required for obtaining a composition for photo etching.
Example 1. First, prepare a solution And for what take out a portion of about 0.50 g methyl methacrylate) PMMA and fill approximately 5.0 ml of acetone. Mix carefully mix with a glass rod and stand before full dissolution PMMA (about 24 hours). Then in the solution And injected approximately 1.50 g of diphenylamine, mixed with a glass rod about 30 minutes before full dissolution of diphenylamine and get a solution B.
For preparation of a solution To take a sample of approximately 0.34 g of ammonium fluoride NH 4 F, pour in 1,48 ml triperoxonane acid CF 3 COOH and carefully mix. Thus, there is a heating of the mixture, in 3-5 minutes there is the complete dissolution NH 4 F.
Solution B poured to the solution and mix. Thus there is little heating of the mixture and increases the viscosity of the solution. The resulting composition for photo etching stand for 1-2 hours before full dissolution of all components. The claimed composition for photo etching films of silicon dioxide when one of quantitative combinations of the components are ready. After cooking composition keeps its characteristics within a month.
The following are examples illustrating the use of the invention.
Example 2. On a silicon wafer with the SiO2 layer with thickness of 0,35 microns, cleansed in ethyl alcohol from dirt, put a pipette 1 drop by photo compositions, prepared according to example 1. The irradiated plate under the lamp DRL-250 to the full release of the film of silicon dioxide that is time-45 with irradiated spot wash with acetone using cotton swabs, watching the complete removal of SiO 2 .
The speed V photochemical etching in example 2 is 0.47 micron/min At the same time determine the velocity of chemical etching, going without UV-irradiation. She is negligible and is 0.02 mm/min In the future, the contribution of this component is ignored.
Example 3. Prepare solutions a and B in example 1. For preparation of a solution To weigh 0,32 g of ammonium fluoride NH 4 F and pour 1.5 ml triperoxonane acid CF 3 COOH, carefully mix. Thus, there is a heating of the mixture, in 3-5 minutes there is the complete dissolution NH 4 F. Solution B and C are mixed and incubated for 1-2 hours before full dissolution of all components. On a silicon wafer with the SiO2 layer with thickness of 0,35 microns, cleansed from impurities in alcohol, put a method of irrigation 3 ml obtained songs for photo etching. Then the plate is exposed under the lamp DRL-250 irradiated spot with a cotton swab wash with acetone to remove SiO 2 , which occurs for 37 seconds.
The speed V photochemical etching in example 3 is 0,56 microns/min
Example 4. Prepare solutions a and B in example 1. For preparation of a solution To weigh 0,34 g of ammonium fluoride NH 4 F, pour triperoxonane acid CF3COOH (1.5 ml), mix thoroughly. Thus, there is a heating of the mixture, in 3-5 minutes there is the complete dissolution NH 4 F. Cooked solution B poured to the solution, the solutions are mixed, maintain within 1-2 hours before full dissolution of all components. On a silicon wafer with the SiO2 layer with thickness of 0,35 microns, cleansed from impurities in alcohol, put a pipette 1 drop obtained songs for photo etching. The irradiated plate under the lamp DRL-250 to the full release of the film silicon dioxide, which occurs in 30 C. Irradiated spot wash with acetone using cotton swabs, watching the complete removal of SiO 2 .
The speed V photochemical etching in example 4 is 0,70 micron/min Table
Comparative data on speed etching of the invention and the prototype presented in the table.
The concentration of ammonium fluoride NH 4 F, g/ml 0,035 0,049 0,052
The etching rate V, mm/min
according to the invention
0,47 (example 2)
0,56 (example 3)
0,70 (example 4)
prototype 0,26 0,26
settling in sediment
The data show that the etching rate of the composition according to the invention in 2 and more times higher in comparison with the composition of the prototype, particularly at high concentrations, which for the composition of the prototype unattainable.
The main advantage of the claimed invention is a significant increase in the rate of photoetching, to 0,70 micron/min compared with 0,26 micron/min in the prototype, which allows to reduce time of photoexposure. The use of a composition according to the invention maintains the dignity of the prototype: completely excluded stage of manifestation, zadabrivaniya and etching, which account for the largest number of defects and distortion of the circuit pattern. Etching S1O2 and destruction of etching products takes place at the stage of exposure. Preventing the use of toxic solvents pyridine and its utilization. Thus, photoetching using the claimed composition more effectively in the field of microelectronics.
Sources of information
1. RF patent №2163724, publ. 27.02.2001.
2. J.Vac.Sci. and Technol. Century - 1999. - 17, 5. - S-2095.
3. RF patent №2330049, publ. 27.07.2008. The prototype.
Composition for photo etching films of silicon dioxide, including polymer base polymethylmethacrylate, photosensitive component ammonium fluoride, triperoxonane acid and protofile reagent, wherein as profiling reagent used diphenylamine, and as solvent - acetone, in the following ratio of components, mass%:
Polymethylmethacrylate 5,6-6,5
The ammonium fluoride 4,0-4,6
Diphenylamine
16,6-19,2 Acetone
45,3-52,2
Triperoxonane acid
21,3-24,6
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