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The wavefront sensor

The wavefront sensor
IPC classes for russian patent The wavefront sensor (RU 2046382):
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(57) Abstract:

The invention relates to the optical instrument and is intended for measurement of aberrations of optical systems. The inventive sensor, the wavefront containing a dispersing element in the form of diffraction gratings, they are anharmonic, the phase profile which is set depending on the form of a fixed aberration. 3 S. p. f-crystals, 5 Il.

The invention relates to measuring technique and can be used for measuring aberrations of optical systems. When the light beam passing through the optical system (or the track distribution) there is a need to assess the effects of the optical system (or tracks) on the phase profile of the beam, for example, to compensate for this influence.

Known wavefront sensor based on the measurement of the energy of the radiation passing through the airy disk [1] the Criterion for the quality of the beam in this case is the ratio of the magnitude of the intensity at a point aperture in the presence of aberrations to the intensity in their absence. This criterion is called factor of acted.

However, the sensor has acted as a significant drawback it does not give the number of the second entity to the present invention is the Hartmann sensor [2] In this sensor, the entire aperture of the light beam through the element, representing a bitmap of N2holes in a thin opaque plate is divided into N2subaperture. Diffracted on the raster, the radiation is focused by a lens on a matrix of four (quadrant) photodetectors, so that each hole has its own photodetector. The local slope of the wavefront at each subaperture leads to change the position of the focal spot on the quadrant photodetector. The magnitude of the photocurrent from each element of the quadrant photodetector estimated value of the slope.

In the Hartmann sensor used 4N2measuring channels, information from which is interpolated to the entire aperture. Then carried out the calculation of the coefficients in the decomposition of the phase profile with respect to orthogonal Zernike polynomials by the method of least squares. The coefficients of the decomposition is the main result, which gives an idea about the phase aberrations in the common form.

The large number of measuring channels and complex mathematical processing leads to time-consuming for the calculation of the coecients in the expansion phase aberration, which reduces the efficiency of the measurements.

Ceago front, including an element carrying out the decomposition of the light beam, a lens, a set of photodetectors with diaphragms and the servo system, the element carrying out the decomposition of the light beam, made in the form of anharmonic phase diffraction grating, providing a diffraction light beam in the N2orders and making a set of different (compensating) phase aberrations, the magnitude and sign of which is determined by the number of order of diffraction, while the number of measuring channels is reduced 4 times.

In Fig. 1 shows an optical diagram of the wavefront sensor of Fig. 2 shows the numbering of the sensors; Fig. 3 illustrates the principle of operation of the device of Fig. 4 shows the dependence of the values of the center of gravity of the intensity measured at the +1 and -1 orders of diffraction, the amount of phase distortion (x= X2); Fig. 5 is an optical diagram of a wavefront sensor with a correction on the slopes.

The wavefront sensor includes a specially made diffraction grating 1, the lens 2, set 3 photodetectors with diaphragms, servo system 4.

The sensor operates as follows (Fig. 1).

The light beam falls on the phase grating 1, after which A radiation. The signal from a single-element photodetectors (photodiodes) in the servo system 4 is amplified, digitized and processed by the microprocessor before submission to the desired shape of the expansion coefficients of the phase aberrations by Zernike polynomials. In measuring systems that can be numbers, and, therefore, the servo system includes a display device information copropagate or digital indicator. In automatic control systems (adaptive systems) that control the wavefront corrector voltage, which are formed in the servo system using amplitude amplifiers.

The phase diffraction grating is manufactured in accordance with the expected set of aberrations. So, to measure astigmatism (x2-y2and defocusing you can use the phase grating profile sin (ax2+ bx) + sin (ay2+ by), where a and b lattice constant. For example, the wave front is astigmatic type X2where an unknown factor. The result of the wavefront sensor such aberration manifests itself in the redistribution of intensities in orders of diffraction (Fig. 3b) in relation to the case of the absence of aberrations, i.e., when 0 (Fig. 3A). This is because cow, where this aberration leads to polvocasero adding with a complex conjugate of the aberration caused by the phase grating (in this case, the plane of focus of the position P is shifted to the P position'). The value of the coefficient is calculated from the position of the center of gravity of the maxima of the intensities Im,nin the diffraction orders
xywhere n and m the number of the column and row of the matrix of photodetectors; N2the number of photodetectors. The dependence of the phase distortion from the position of the center of gravity of the intensity maximum is monotonous character. An example of such dependence for the two photodetectors shown in Fig. 4. For the measurement of spherical aberration and defocusing you can use the phase grating profile sin [a(x2+ y2)2+ bx]+ + sin [a (x2+ y2) + by] for measuring astigmatism any orientation: sin [a (x2y2)+ + bx] + sin (axy + b).

The accuracy of the measurement of the aberrations of the wave front corresponds to the precision specified by the factor of acted (for example, for the standard deviation of the wave front in 0.1 from the plane factor of acted reduced to 60%). The measurement range of the phase aberrations is limited by the lattice parameters and the h wave front position of the diffraction orders is changed, i.e., the operation of the sensor is critical to the change in the slope. This can be eliminated by introducing into the servo system control channel tilt mirror 5 that connects the mirror to peoplewatch with the quadrant photodetector installed in the zero diffraction order (Fig. 5). The change in the slope of the wave front leads to the displacement of the focal spot on segments of a sensor and a corresponding change of the photocurrent from each segment. Subtracting the signals from opposite segments of the photodetector, get information about the tilt of the wave front. For ease of presentation, these signals can be calibrated. After measuring the slope if the slope required) differential signals are amplified and fed to piezodrive mirrors. Piezodrive are made of bimorph piezoceramic plates (piezoplates, glued opposite polarization, which is due to the inverse piezoelectric effect when connecting to spray on them to contacts of an electrical voltage curve, because one plate is lengthened and the other shortened the resulting bending moment). These piezodrive one end attached to the frame and the other to the edge of the mirror. Depending on the magnitude and sign of applications to the grid. The choice of the gain in the control channel tilt mirror servo-system is made so that the management was sustainable and mirror perform the correction of the tilt of the wave front.

The wavefront sensor is to be used for measurement of the astigmatism of the semiconductor laser for the manufacture of expansion joints. Another important use of adaptive optical system for optical communication through the atmosphere and intracavity correction in technological lasers.

1. The wavefront SENSOR, including associated optical dispersive element in the form of a diffraction grating, a lens, a set of photodetectors with diaphragms connected to the servo system, characterized in that, for the purpose of measuring astigmatism and defocus, diffraction grating made anharmonic phase profile sin(ax2+ bx) + sin(ay2+ by), where a and b lattice constant.

2. The wavefront sensor, including associated optical dispersive element in the form of a diffraction grating, a lens, a set of photodetectors with diaphragms connected to the servo system, characterized in that, for the purpose of measuring spherical aberration and defocus, difraction the/SUP>) + by] where a and b lattice constant.

3. The wavefront sensor, including associated optical dispersive element in the form of a diffraction grating, a lens, a set of photodetectors with diaphragms connected to the servo system, characterized in that, for the purpose of measuring astigmatism any orientation, diffraction grating made anharmonic phase profile sin[a(x2y2) + bx] + sin(axy + bx), where a and b lattice constant.

 

 

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