Apparatus for controlling and monitoring broadband noiseproof systems

IPC classes for russian patent Apparatus for controlling and monitoring broadband noiseproof systems (RU 2477874):

G05B13 - Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion (G05B0019000000 takes precedence;details of the computer G06F0015180000)

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FIELD: information technology.

SUBSTANCE: apparatus has a control computer (1) and a hardware component (2), having an intelligent controller (3) which has a digital input/output serial interface (31), a multifunctional highly integrated data processing system (32), a digital input/output parallel interface (33), an intelligent module (4), having a control and monitoring processor module (5), an input/output port (9) and a test signal generator (12), a data access and storage module (6), a buffer amplifier/attenuator module (7), a local imaging module (8), an internal local bus (10), a block of digital input/output devices (11), an external data reading module (13), a voltage metre (14), an analogue signal frequency metre (15), a protection device (16), a built-in, digitally controlled independent power supply (17), a high-speed serial interface module (18), an external connector unit (19), a test device (20) and a control panel (21).

EFFECT: broader functional capabilities consisting in the possibility of checking sensitivity and noise-immunity of an information processing and receiving unit.

3 dwg

The invention relates to the field of process automation control and monitoring of complex radio systems and may find application in a broadband noise-immune systems.

It is known that the system of receiving and processing information (LUT) are one of the most important parts of any radio systems (PC) for various purposes and serve an important function in ensuring the required level of intra - and intersystem communication, with direct effects on the main quality indicators of the functioning of the entire system. Today, as one of the most common types of PC, allowing to realize a new level of information exchange due to the higher (compared to other PC) indicators spectral efficiency and noise immunity, it is possible to allocate a very widespread broadband immune system (PSS). At the same time appeared a steady increase automation radiophysical systems associated with the expansion capacity and hardware implementation of intelligent algorithms for digital signal processing, leads to the creation of more complex structures, using various methods of adapting to constantly changing noise conditions. When the volume of the peculiarities of functioning of modern radio equipment, aimed at ensuring the timely delivery of messages in all conditions of use and reliability of the system as a whole, lead to the creation within the system of complex information structures, aimed at the management of information and its processing. This leads to the necessity of development of new technological means to effectively detect faults and to assess quantitatively the performance of the whole system in accordance with the constantly changing requirements of the functioning of the PC.

A device for diagnosing electrical, described in [1], providing the possibility of functional diagnostics directly in the operation mode by forming input and control output signals, which can be both analog and digital signals. Detection of faults in the diagnostic object is to detect a specific element and is provided in the inventive system the mathematical algorithm of diagnostics contained in the PC.

The disadvantage of this device [1] is the restriction of functionality due to the lack of the possibility of forming complex signals with variable parameters. Also the device does not measure current, voltage and frequency needed what's for testing and control of wireless devices in real time.

It is also known a device for Troubleshooting, described in [2]to find fault in the dynamic system with an arbitrary connection blocks in the form of deviations of the parameters of the transfer functions of the blocks of arbitrary patterns. The device operation is based on the use of pilot deviations of continuous dynamical systems with nominal characteristics on the parameters of the controlled system. Trial deviation of the parameter that minimizes the value of the diagnostic sign indicates the presence of a defect in this parameter.

As disadvantages of the aforementioned devices [2] it can be noted, the functionality is limited due to the lack of the possibility to modernize the algorithm test influences and lack of funds to change the operational data to test to the limit the managed system.

The closest in technical essence of the claimed invention is an automated repair stand, described in [3], adopted for the prototype.

Functional diagram of the device of the prototype is shown in figure 1, where the following notation:

1 - the management computer;

2 - hardware;

3 - intelligent controller;

9 - port I / o;

10 - internal local bus;

11 - digital input devices-is Yoda;

17 - built-in independent power supply with digital control;

19 is a block external connections;

20 - test device;

22 analog generator;

23 synthesizer harmonic signals;

24 - synth pulse signals;

25 - logic analyzer;

the 26 - block control relay;

27 - the bus arbiter;

28 - digital oscilloscope;

29 - USB;

30 - 32-bit processor on a chip NIOS-processor;

31 - random access memory;

32 - address port.

The device prototype consists of a control computer 1 and hardware 2.

Part hardware part 2 includes:

- intelligent controller 3 that contains the USB bus 29, 32-bit processor on a chip (NIOS-processor) 30, random access memory 31, the bus arbiter 27, the address port 32 and port I / o 9;

- internal local bus 10;

- digital I / o 11;

analog generator 22, in the form of synthesizer harmonic signals 23 and synth pulse signals 24;

- logic analyzer 25;

control unit relay 26;

- built-in independent power supply 17 with digital control;

- digital storage oscilloscope 28;

block external connectors for connection of the test device 19;

- the test device 20.

The disadvantages of the prototype [3] are the OTF is reduced functionality does not ensure the formation of complex signals required for testing and control of broadband noise-LUT, the absence of controlled noise generator, necessary to measure the sensitivity and noise immunity LUT, and the lack of measures current, voltage and frequency required to control the operation of wireless devices in real time.

The problem to which the invention is directed, is to develop a device that provides the ability to verify the sensitivity and noise immunity LUT (test device), the ability to measure voltage and frequency control of the analog signal, the possibility of the formation of a complex signal for FSO systems with a significant level of a priori uncertainty of parameters in order to provide additional information security system.

Technical result achieved - extension of functional capabilities, which are as follows:

- ability to test the sensitivity of the LUT;

- the ability to verify the noise LUT;

- the ability to generate in advance of the unknown complex test signal is injected into the computers known to the operator settings before performing the task.

- the possibility of which of eklow continuous functional and load testing without the presence of the operator to record the history of testing in the event log (the method of "one-button");

- the possibility of stepping through any of the test influences with the purpose of finding faulty nodes and blocks by setting certain parameters necessary to obtain feedback on the impact of the required block;

the choice of the control algorithm from a list of possible actions and choice of algorithm parameters;

- the option of adjusting the control actions or parameter passing without stopping the main process;

- with an opportunity to update the control programs of the functional nodes that contain highly integrated data processing system, including high performance h-compatible kernel, Flash memory and FPGA ALTERA, without changes in the circuitry of the device;

- automatic change of parameters of the signal and/or signal-to-noise ratio in the process of passing periodic inspections by a predetermined algorithm;

- automatic registration of frequency-time parameters of the event entry in the event log;

- automatic registration of deviations from the Protocol entry in the event log with the aim of preserving and further analysis of deviations;

- measurement of the voltages of the secondary power supply;

- measurement of the power value with a precision of 0.1 ampere;

- measurement of frequency analog signal is La with a precision of 10 ^-7from the nominal frequency.

To solve the problem stated, the device management and monitoring wideband failsafe systems containing computer software and hardware, interconnected bidirectional communication via module high-speed serial interface, while the hardware part includes:

- intelligent controller containing serially connected bi-directional connections serial interface digital I / o, multi-functional, highly integrated data processing system and a parallel interface digital I / o;

the intelligent module containing the processor module control and monitoring, test signal generator and port I / o; and the processor module control and monitoring includes serially connected bi-directional connections serial interface I / o, multi-function processor interface and the parallel interface input / output; a test signal generator includes multi-function processor interface, as well as the shapers of the digital signal and the digital noise whose inputs are connected to respective outputs of the multi-function processor interface;

block external connections, with whom containing a series of high-frequency interface, multi-channel bi-directional serial interface and multi-channel bi-directional tractability parallel interface;

measurement of voltage, connected to the respective bidirectional connections with parallel interface I / o processor module of the control and monitoring through multi-channel bi-directional tractability parallel interface with the test device;

- measuring the frequency of the analog signal connected to the respective bidirectional connections with parallel interface I / o processor module of the control and monitoring through multi-channel bi-directional tractability parallel interface with the test device;

unit digital input / output connected to the respective bidirectional connections through the input port-output - parallel I / o processor module control and monitoring, and through multi-channel bi-directional tractability parallel interface with the test device;

module access and data storage, connected to respective bidirectional connections through the internal local bus parallel interface digital I / o intelligent controller and parallel I / o processor mo is Ulya management and monitoring;

- local module the visualization module reading external data and the control panel, the relevant United bidirectional connections through port I / o parallel I / o processor module of the control and monitoring;

- built-in independent power supply with digital control, connected to respective bidirectional connections through port I / o parallel I / o processor module control and monitoring, and through the protection device from the test device;

module buffer amplifiers/attenuators, the inputs of which are connected respectively to the outputs of the shapers of the digital signal and digital noise, and output through the RF interface is connected to a tester device;

when this serial interface I / o processor module of the control and monitoring connected to the test signal generator, and the corresponding bi-directional links with module high-speed serial interface serial interface digital I / o intelligent controller; parallel interface I / o processor module of the control and monitoring bidirectional connections through multi-channel bi-directional serial interface connected to the test the subject device.

Functional diagram of the inventive device shown in figure 2, where the following notation:

1 - the management computer;

2 - hardware;

3 - intelligent controller:

31 - serial interface digital I / o;

32 is a multifunctional integrated data processing system;

33 is a parallel interface digital I / o;

4 - intelligent module (IM);

5 - the processor module control and monitoring:

51 - serial interface I / o;

52 - multi-function processor interface;

53 - parallel interface input / output;

6 - module access and storage of data;

7 module buffer amplifiers/attenuators;

8 - module local visualization;

9 - port I / o;

10 - internal local bus;

11 - block digital input / output;

12 - test signal generator:

121 - multi-function processor interface;

122 - shaper digital signal;

123 - digital noise shaper;

13 - module reading external data;

14 - measuring voltages;

15 - meter frequency analog signal;

16 - device protection;

17 - built-in independent power supply with digital control;

18 - module high-speed serial interface;

19 is a block vneshniaia to connect:

191 - high-frequency interface;

192 - multi-channel bi-directional serial interface;

193 - multichannel bidirectional tractability parallel interface;

20 - test device;

21 control panel.

The inventive device comprises a control computer 1 and the hardware part 2, which are interconnected with the module high-speed serial interface 18.

Part hardware, part 2, the device includes:

- intelligent controller 3, intended for processing control commands associated with a specific device protocols and/or algorithms containing serially connected bi-directional links functional modules: serial interface digital I / o 31, the second input-output which is the first input-output intelligent controller 3, multi-functional, highly integrated data processing system 32 and parallel interface digital I / o 33, the second input-output which is the second entrance-exit intelligent controller 3;

the intelligent module 4 that exchange information with the computer via module high-speed serial interface 18 to form and transfer the necessary test influences and receiving response signals from the test device is STV 20 and includes a processor module control and monitoring 5, the test signal generator 12 and the port I / o 9;

module access and data storage 6 for storing transmitted and/or received data, input-output through an internal local bus 10 is connected with the second output is an intelligent controller 3 and the eighth output input processor module of the control and monitoring 5;

module buffer amplifiers/attenuators 7, intended for submission to the test device, the analog signal of variable amplitude and phase in a mixture with noise that is generated based on the settings received from the test signal generator 12;

module local visualization 8, its input-output connected to the third output input port I / o 9 and intended to render the control information obtained in the course of the test results, if necessary, Autonomous operation without control Board;

module reading external data 13, its input-output connected to the fourth output-input port I / o 9 and designed to connect and read the external non-volatile data that can be used to set test parameters and settings generate a test signal;

the protection device 16 that is designed to disable the hardware interface and the test device is the STV from sources of supply in case of exceeding the permissible threshold voltages;

- built-in independent power supply with digital control 17, the first input-output of which is connected to the sixth output input port input / output 9, and the second input-output through the protection device 16 is connected to the fourth output-input of the test device 20;

block external connections 19, containing high-frequency interface 191, multi-channel bi-directional serial interface 192 and multichannel bidirectional tractability parallel interface 193;

control panel 21, its input-output connected to the fifth output-input port I / o 9 and designed for Autonomous operation of the device without control computer 1.

While the test signal generator 12 includes a multi-function processor interface 121, the input of which is the input of the test signal generator 12, the imaging unit of the digital signal 122 and the digital noise shaper 123, the outputs of which are respectively the first and second outputs of the test signal generator. While the first and second outputs of the multi-function processor interface 121 through the respective shapers digital signal 122 and digital noise 123 are connected respectively with the first and second inputs of the module buffer amplifiers/attenuators 7, the output of which through high frequency interface 191 is connected to the first input of the test device 20.

The processor module control and monitoring 5 includes: sequentially interconnected by bidirectional links functional modules: serial interface I / o 51, multi-function processor interface 52 and the parallel interface input / output 53. The second output serial I / o 51, which is the second output of the processor module of the control and monitoring 5, is connected to the input of the test signal generator 12; a third input / output serial I / o 51, which is the first input-output processor module of the control and monitoring 5, is connected with the second output of the input module high-speed serial interface 18, the fourth input-output serial I / o 51, which is the third input / output processor module of the control and monitoring 5, is connected with the second output input serial interface digital I / o 31. The second input-output parallel I / o 53, the fourth input-output processor module of the control and monitoring 5, through multi-channel bi-directional serial interface 192 is connected with the second output-input of the test device; a third input-output parallel I / o 53, which is the fifth exit and entrance is rocessing module control and monitoring 5, through a voltage meter 14 is connected to the first output of the input multi-channel bi-directional transtable parallel 193; the fourth input-output parallel I / o 53, which is the sixth input-output processor module of the control and monitoring 5, through measuring the frequency of the analog signal 15 is connected with the second output-input multi-channel bi-directional transtable parallel 193; the fifth input-output parallel I / o 53, which is the seventh input-output processor module of the control and monitoring 5, is connected with the second output input port input / output 9, the first input-output through which unit digital input / output 11 is connected with the third output-input multi-channel bi-directional transtable parallel 193, the fourth input-output of which is connected to the third output is the input of the test device 20; the sixth input-output parallel I / o 53, which is the eighth input-output processor module of the control and monitoring 5, is connected with the third output input internal local bus 10.

The inventive device operates as follows.

The management computer 1 through module high-speed serial interface 18 transmits to the processor module control the population and monitoring 5 starting data required for configuration of the test parameters and enable the required for the selected mode interfaces. Serial interface I / o 51 control actions from the management computer 1 serves on the smart controller 3, the text generator signal 12 and the multi-function processor interface 52, based on the embedded 32-bit processor on a chip NIOS, which generates control commands organization of the routing interfaces and supplies them to the parallel interface input / output 53, which serves for the formation and transfer of control from the multi-function processor interface 52 to the port I / o 9, a voltage meter 14 and the measuring frequency of the analog signal 15.

Further, depending on the selected mode, the processor module control and monitoring 5 generates commands for the sample data test influences either from the module reading external data 13 or from the module data access and storage 6. Also, the processor module control and monitoring 5 generates control commands for the test device 20, the test signal generator 12, the voltage meter 14 meter frequency analog signal 15. In accordance with the Protocol of the test influences the smart controller 3 generates nepreryvnyi the output stream (according to the selected Protocol) for transmission to the test device 20 and provides the processing flow of the input data according to the selected Protocol), taken from the test device 20.

Serial interface digital I / o 31 intelligent controller 3 communicates (according to another Protocol other than the first) with processor module control and monitoring 5.

Multifunctional integrated data processing system 32, including high performance h-compatible kernel and Flash memory, provides the formation of a periodic control commands and to control the time elapsed between sending the command from the device and receive the command from the test device 20; next, the processed data from the intelligent controller 3 through an internal local bus 10 is served in the module data access and storage 6.

In addition, the processing results of the smart controller 3 are transmitted to the processor module control and monitoring 5 for issuing to the control computer 1. Simultaneously, the processor module control and monitoring 5 receives data from the meter voltage 14 and measuring the frequency of the analog signal 15 for issuing to the control computer 1. In addition, the processor module control and monitoring 5 communicates directly with the test device 20 for bidirectional serial interface 192, and the results obtained passes in charge of the General computer 1.

To test the sensitivity on the test device 20 is supplied test signal of a certain magnitude generated by the test signal generator 12, which has a multi-function processor interface 121 based on the embedded 32-bit processor on a chip NIOS issuing control commands shapers digital signal 122 and digital noise 123, based on the commands received from the processor module of the control and monitoring 5. Module buffer amplifiers attenuators 7 is used to convert a digital signal and noise in analog form for filing through the high-frequency interface 191 on the test device 20.

Next, the management computer 1 generates control commands, so that at each step cycle of the measurement signal level is decreased by a predefined amount. The operator has the opportunity to choose the initial signal level.

To test the noise on the test device 20 is supplied test signal of a certain magnitude generated by the test signal generator 12 (same as above); next, the management computer 1 generates control commands, so that at each step of the measurement cycle the level of the signal-to-noise ratio was decreased by a predefined amount. The operator has the opportunity to choose the initial level of signal and noise.

Master al is orithm work multi-function processor interface 52 is illustrated using figure 3.

When the block 52.1 happen initializing device and check the connection with the control computer 1. Next, in block 52.2 by the operator selects the test devices from a list of all supported devices and select the mode: "step-by-step tuning" or "auto scan".

In block 52.3 by the operator selects the load test settings of the following features:

52.3.1 - automatic configuration (default);

52.3.2 - loading installations some of the previous session (stored in the module access and data storage 6 and/or module, read external data 13);

52.3.3 - manual input.

If in block 52.4 was the need to change previous configuration settings in the block 52.5 can dynamically configuring a programmable logic processor module of the control and monitoring 5 and text generator signal 12 from the intelligent controller 3, and if there is no necessary changes to the previous configuration settings, then proceeds to the block 52.6.

In block 52.6 is necessary algorithm impacts in accordance with the selected operation mode and the test device 20 until the scan is completed, or until operator intervention.

Periodic management team, consisting of a sequence is eljnosti codes and generated in the automatic mode, is passed through the module high-speed serial interface 18 in the intelligent module 4 for control and/or adjustment of an applied impact. Each periodic team is formed either on the basis of the previously known algorithm of functioning of the test device, or if necessary, may be formed at the direction of the operator. Some combination of control commands, in accordance with one or more variants of the implementation of the control algorithm for the test device can be done in any order and/or concurrently with other combinations. Periodic control commands can be suspended if necessary, the use of the correction control in response to received periodic signals. Regular periodic control command can be either a response to the appropriate signal from the test device 20, or when you need to be formed at the direction of the operator.

When a test exchange with the test device 20 of the inventive device checks the correctness of each received command according to the following criteria:

the time elapsed between the transmission of commands from the claimed device and receive the command from the test device 20;

is that all parameters of the accepted command;

- the presence of signal is, expected according to the validation algorithm.

Measured scanning time and the number of error-free sessions. Documented successful and unsuccessful sessions with reference to time, and data can simultaneously be stored in the module access and data storage 6 and the control computer 1.

Intelligent controller 3 may be configured on the basis of a specialized digital item, including high performance h-compatible kernel and Flash memory [6, 9].

Intelligent module 4 can be configured based on FPGA company ALTERA containing an embedded 32-bit processor on a chip [6, 9].

Module data access and storage 6 may be made on the basis of volatile and/or nonvolatile storage devices [4-7].

Module buffer amplifiers/attenuators 7, port I / o 9 digital input / output 11, the module reads the external data 13 can be made on the basis of digital logic elements [4].

The visualization module 8 can be performed on the basis of the led segment and indicators [10].

Measuring voltages 14 and measuring the frequency of the analog signal 15 can be made of specialized digital elements [4-6].

The protection device 16 may be made of current sensors and specialized digital elements (chips), the purpose is the R for protection against overcurrent [4, 7].

Built-in independent power supply with digital control 17 may be made of specialized digital elements, which allows us to generate from the input voltage to the desired output voltage [4, 5].

High-speed serial interface 18 may be implemented as one of the standard joints RS 232/422/485 or USB on the basis of specialized digital elements [5, 6].

The panel 21 may be made of switching elements using indicators and LEDs [10].

Thus, the introduction of the proposed device, the new units and relationships enables us to provide the technical result consists in extending the functionality of a device designed for monitoring and control of broadband noise-immune systems. Furthermore, the presence of an intelligent controller that is configured on the basis of multifunctional integrated data processing systems, including high performance h-compatible kernel and Flash memory, and intellectual module configured based on FPGA company ALTERA containing an embedded 32-bit processor on a chip, allows the processing of data at different time scales in accordance with the target function of the test device.

Sources of information

1. Patent of the Russian Federation on the image is the group No. 2430406 "Automated diagnosis of digital devices. / Aleshin V.E., Spassky, NV, Cancer SJ - 2009.

2. RF patent for the invention №2429518 "Method of Troubleshooting a dynamic block in a continuous system. / Shalamanov S. - 2010.

3. RF patent for the invention №2421787 Automated repair stand (snow LEOPARD)". / Borovik M.M., Krinitsky, GV, Zhdanov V.E., Nadelson A.M. - 2009.

4. http://www.analog.com/ru/allProducts.html - electronic Components company "Analog Devices"

5. http://russia.maxim-ic.com/products/ - electronic Components company "MAXIM"

6. http://www.altera.ru/cgi-bin/go?38 - electronic Components company "ALTERA"

7. http://www.ti.com/ww/ru/ - electronic Components company "Texas Instruments"

8. http://www.murata.com/ - electronic Components company "Murata Manufacturing Company, Ltd.

9. http://www.atmel.com/products/ - electronic Components company "ATMEL"

http://www.silabs.com/products/pages/default.aspx - electronic Components company "Silicon Labs"

10. http://www.kingbright.com/

The device management and monitoring wideband failsafe systems, characterized in that it comprises computer software and hardware, interconnected bidirectional communication via module high-speed serial interface, while the hardware part includes:
intelligent controller containing serially connected bi-directional connections serial interface digital input you the ode, multifunctional integrated data processing system and a parallel interface digital I / o;
intelligent module containing the processor module control and monitoring, test signal generator and port I / o; and the processor module control and monitoring includes serially connected bi-directional connections serial interface I / o, multi-function processor interface and the parallel interface input / output; a test signal generator includes multi-function processor interface, as well as the shapers of the digital signal and the digital noise whose inputs are connected to respective outputs of the multi-function processor interface;
block external connections containing high-frequency interface, multi-channel bi-directional serial interface and multi-channel bi-directional tractability parallel interface;
the voltage meter connected to the respective bi-directional connections: parallel I / o processor module control and monitoring, and through multi-channel bi-directional tractability parallel interface with the test device;
measuring the frequency of the analog signal connected to line the existing bi-directional connections: parallel I / o processor module control and monitoring and through multi-channel bi-directional tractability parallel interface with the test device;
unit digital input / output connected to the respective bi-directional connections: port I / o parallel I / o processor module control and monitoring, and through multi-channel bi-directional tractability parallel interface with the test device;
module access and data storage, connected to respective bidirectional connections through the internal local bus: parallel digital I / o intelligent controller and parallel I / o processor module of the control and monitoring;
the local module the visualization module reading external data and the control panel, the relevant United bidirectional connections through port I / o parallel I / o processor module of the control and monitoring;
built-in independent power supply with digital control, connected to the respective bi-directional connections: port I / o parallel I / o processor module control and monitoring, and through the protection device from the test device;
module buffer amplifiers/Atta is Gutorov, the inputs of which are connected respectively to the outputs of the shapers of the digital signal and digital noise, and out - through the RF interface is connected to a tester device;
in this case, the serial I / o processor module of the control and monitoring connected to the test signal generator, and the corresponding bi-directional links with module high-speed serial interface serial interface digital I / o intelligent controller; parallel interface I / o processor module of the control and monitoring bidirectional connections through multi-channel bi-directional serial interface is connected with the test device.