Method of deflecting light beam

IPC classes for russian patent Method of deflecting light beam (RU 2512597):

G02F1/29 - for the control of the position or the direction of light beams, i.e. deflection

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SUBSTANCE: invention relates to quantum electronics and specifically to devices for controlling optical radiation parameters, and can be used in computer and control system devices. The method of deflecting a light beam involves passing a light beam through a plate made of electrooptical material on whose surface there are control electrodes which are connected to different potentials, which generate a deflecting quasitriangular step phase function, mounting a second plate made of electrooptical material which is in contact with the control electrodes, and passing the light beam through both plates. The direction of propagation of the light beam is inclined to the surface of the plates.

EFFECT: high deflection angles.

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The invention relates to the field of quantum electronics, namely, devices of the control parameters of optical radiation, and can be used in computer equipment and control systems.

There is a method of deflection of the light beam (U.S. Patent No. 4639091, IPC G02F 1/137, publ. 27.01.1987), namely, that the light beam passed through the electro-optic material in the form of a flat layer of liquid crystal material coated on one or both surfaces of the control electrodes connected to different potentials to form a deflecting speed quasidiagonal phase function.

The disadvantage of this method deviations are small inclination angles, which are equal in magnitude arcsin(λ/(Nd)), where λ is the wavelength of the light beam, m; N is the number of gradations of the phase function, is equal to the number of electrodes forming period deflecting step quasidiagonal phase function; d is the period of the electrodes, m for Example, for d=10 µm, N=3, λ=0,633 μm, the deflection angle is just 1,21°, which limits the application of this method of deviation.

The closest in technical essence to the present invention is a method of deflection of the light beam (U.S. Patent No. 5093747, IPC H01Q 19/06, publ. 03.03.1992), namely, that the light beam passed through the plate from electrohop the ical material coated on the surface of the control electrode, connected to different potentials, forming the deflecting step quasidiagonal phase function.

The disadvantage of this method deviations, as in the previous case, are small angles of deviation in tenths of a few degrees, which limits the application of this method of deviation.

The aim of the invention is to increase the angles of deflection of the light beam.

This goal is achieved due to the fact that in the way that the deflection of the light beam, which light beam is passed through a plate of electro-optic material coated on its surface control electrodes connected to different potentials, forming the deflecting step quasidiagonal phase function, in accordance with the proposed technical solution, it is additionally establish the second plate of the electro-optic material in contact with the control electrodes, and the light beam passed through both plates, and the direction of propagation of the light beam pick inclined to the surface of the wafer.

The way of deviation of the light beam is illustrated by drawings,

which figure 1 shows a side view of an apparatus for implementing the proposed method, where 1 - light beam, 2 - plate of the electro-optic material coated on its surface control is their electrodes, 3 - the control electrodes 4 to the second plate of the electro-optic material 5 deflected light beam.

figure 2 shows the phase functions generated by oblique incidence of the light beam, polarized in the yz-plane, a plate of electro-optical material is a z-cut crystal niobate, barium strontium Ba_{of 0.25}Si_0,75Nb₂O₆and the angles of incidence is equal to: 1 - 4π/16,

2 - 5π/16, 3 - 6π/16, 4 - 7π/16, interelectrode gap a=5 μm, the width of the electrode b=5 μm, the thickness of the electrodes h=0.1 ám, and the control electrodes parallel to x-axis of the crystal,

figure 3 shows the phase functions generated by the proposed technical solution is the case of oblique incidence of a light beam polarized in the yz-plane, on both plates of the electro-optic material is z-cut crystal niobate, barium strontium Ba_{of 0.25}Sr_0,75Nb₂O₆and the angles of incidence is equal to: 1 - 4π/16,

The method is as follows.

The light beam 1 is passed through a plate of electro-optical material 2 coated on the surface of the control electrodes 3 and the second plate of the electro-optic material 4 in contact with the control E. what ectrode 3. When the direction of propagation of the light beam 1 is chosen inclined to the surface of the plates 2, 4. The control electrodes 3 are connected to different potentials, for example,..., U, 0, 0, U, ..., forming the deflecting step quasidiagonal phase function with multiple gradations phase, causing the deviation of the light beam 1.

Example. Consider the deflecting element on the basis of z-cut electro-optic crystal of Ba_{of 0.25}Sr_0,75Nb₂O₆. On the plate surface of the electro-optic material parallel to the axis x of the crystal caused the control electrodes in the form of a one-dimensional rectangular lattice. The width of the electrode is b=5 μm, the thickness of the electrodes h=0.1 ám, electrode gap=5 μm. On the control electrodes filed potentials of the form ..., U, 0, 0, U, ..., forming a stepped quasidiagonal phase function with three gradations phase N=3. The potential difference between adjacent electrodes forms in the interelectrode gap of an inhomogeneous electric field with the z - and y-components of E_zand E_ychanging the refractive index of the electro-optic material. The equation of the ellipsoid of the refractive indices for the case in question is:

$(\frac{1}{n_{0}^{2}} + r_{13 /msub> E_{z}}) x^{2} + (\frac{1}{n_{0}^{2}} + r_{13} E_{z}) y^{2} + (\frac{1}{n_{e}^{2}} + r_{33} E_{z}) z^{2} + 2 y z r_{51} E_{y} = 1, (1)$

where n₀n_eordinary and extraordinary refractive indices, respectively; r₁₃, r₃₃, r₅₁- electro-optic coefficients, for λ=0,633 μm, respectively 67·10^-12, 1340·10^-12, 42·10^-12m/V for frequencies of the order of units - tens of kHz (Dr. Yariv A., uh P. Optical waves in crystals: TRANS. from English. - M.: Mir, 1987. - 616 C.). Let us write the equation of the indicatrix in the yz-plane, assuming that the angle β=0° corresponds to the normal fall of the y-polarized radiation in plane yz:

${\begin{cases} (\frac{1}{n_{0}^{2}} + r_{13} E_{z}) y2 + (\frac{1}{n_{e}^{2}} + r_{33} E_{z}) z^{2} + 2 y z r_{51} E_{y} = 1, (2) \\ z = y \cdot t g (β) . \end{cases}$

where β is the angle of incidence of the light beam on the surface of the electro-optical material, which is applied to the control electrodes.

Express from (2) the refractive index of the optical radiation polarized in the yz-plane:

$n_{y z} = \frac{n_{0} n_{e}}{c o s (β) \sqrt{t g^{2} (β) n_{0}^{2} + n_{0}^{2} n_{e}^{2} r_{13} E_{z} + n_{e}^{2} + t g^{2} (β) n_{0}^{2} n_{e}^{2} r_{33 E_{z} + 2 t g (β) n_{0}^{2} n_{e}^{2} r_{51} E_{y}}}}, (3)$

According to (3) at β=0° and F_yE_z=0, the refractive index of n_yr=n₀and when β→90° n_yr→n_ethat confirms the correctness of the output of the formula (3).

Figure 2 shows the phase functions calculated on the basis of formulas (3) and non-uniform distribution of electric field E_yE_z. On the plate surface parallel to the x-axis of the crystal caused the control electrodes in the form of a one-dimensional rectangular lattice. The width of the electrode is b=5 μm, the thickness of the electrodes h=0.1 ám, electrode gap=5 μm. The control electrodes are connected to potentials of the form ..., U, 0, 0, U, ..., forming a stepped quasidiagonal phase function with three gradations phase N=3. Curve 1 in figure 2 corresponds to the angle of incidence of the light beam β=4π/16, curve 2 - β=5π/16, curve 3 - β=6π/16, curve 4 - 7π/16. Phase function characteristic for the case of only one plate of electro-optical material. Data from Figure 2 it follows that the use of oblique incidence leads to disruption of the IDA deflecting step chitrabhanuji phase function and therefore, the violation of deflection of the light beam.

Figure 3 shows the phase functions generated by the proposed technical solution for the case of z-cut crystal of Ba_{of 0.25}Sr_0,75Nb₂O₆and a light beam polarized in the yz-plane. On the plate surface parallel to the x-axis of the crystal caused the control electrodes in the form of a one-dimensional rectangular lattice. The width of the electrode is b=5 μm, the thickness of the electrodes h=0.1 ám, electrode gap=5 μm. The control electrodes are connected to potentials of the form ..., U, 0, 0, U, ..., forming the deflecting step quasidiagonal phase function with three gradations phase N=3. Curve 1 in Figure 3 corresponds to the angle of incidence of the light beam β=4π/16, curve 2 - β=5π/16, curve 3 - 6π/16, curve 4 - 7π/16. From the data of Figure 3 suggests that, while the use of oblique incidence of the light beam and the second plate of the electro-optic material is stored speed quasidiagonal view deflecting phase function. Therefore, the implemented deviation of the light beam. Thus due to the oblique incidence increases, the angle α=arcsin(-λ/(N*d)+sin(β)) (-1 diffraction maximum), where β is the angle of incidence of the light beam, grad.; λ is the wavelength of the light beam, m; N is the number of electrodes forming element aperture with step quasidiagonal phase function d - the period of the electrodes, m For z-cut crystal of Ba_{of 0.25}Sr_0,75Nb₂O₆and a light beam polarized in the yz-plane at angles of incidence β=6π/16...7π/16 (67,5...78,8°), λ=0,633 μm, a=b=5 μm, d=10 µm, N=3 deviation angles increase 1.7...6 times compared with the normal fall of a light beam and at the same potentials of the control electrodes.

The way of deviation of the light beam, which light beam is passed through a plate of electro-optic material coated on its surface control electrodes connected to different potentials, forming the deflecting step quasidiagonal phase function, characterized in that it further establish the second plate of the electro-optic material in contact with the control electrodes, and the light beam passed through both plates, and the direction of propagation of the light beam pick inclined to the surface of the wafer.