Automated device for testing microprocessor systems

FIELD: physics, computer engineering.

SUBSTANCE: invention relates to micro- and nanotechnology and can be used when controlling and diagnosing microprocessor systems. The automated device for testing microprocessor systems contains the following: a testing module (1), units for permanent (2) and on-line storage of data, a unit for processing results and information (5), a control unit (4) which is a switch, a setting device (8), first (6) and second (7) interfaces. The units for permanent (2) and on-line (3) storage of data and the control unit (4) can be made as part of the tested object.

EFFECT: broader functional capabilities of the automated device due to possibility of detecting undocumented units and commands in a microprocessor system.

1 dwg

 

The invention relates to micro - and nanotechnology and can be used for control and diagnostics of microprocessor systems. Most effectively be used to identify undocumented elements and opportunities for implementation of undocumented commands with the test object.

Known automated testing device for microprocessor systems containing block of the fault simulation, the reference unit, the control unit, the random number generator block bitwise comparison, the first register, the second register block comparison and display device information, and a random number generator connected to the diagnostic object and the reference block, block bitwise comparison is connected to the outputs of the diagnostic object and the reference block, to the first and second registers, a control unit connected to the first register, the second register block comparison, the unit display information, the first register is connected to the AC simulation of the fault, the block information is displayed and the unit control, the second register is connected to the power comparison unit comparing connected to the first register and the random number generator block simulation of faults connected to the random number generator and a reference unit (RU 2109329, G06F 11/22, 1998).

Another trend intercept is mirovaniya is to provide automated devices for testing microprocessor-based system controller configuration software unit is defective condition of one or more functional elements of the system and its state analyzer (WO 2005/029329, G01F 11/00, H01L 21/66, G01R 31/3185, 2005).

It is also known a device for testing a processing system containing a processor, equipped with an external bus I / o data transfer, the processor emulator and two identical processor system connected to internal data buses for software testing and debugging (SA 2271338, G06F 15/17; G06F 11/30, 1999).

Closest to the claimed is automated device for testing microprocessor-based systems, including the testing module, DC and online data storage, management, processing of results and information, the first and second interfaces and the generator, where the first output unit connected with the first information input unit of processing results and information, the second output unit is connected with the input of the test unit through the first interface and the control unit, the second input of the processing unit results and information connected to the output of the second interface, the information input unit of the operational data storage connected with the information output module testing, and control output of the test unit is connected with control inputs of blocks of constant and rapid storage of data is x (US 2007/0168735, G06F 11/00, 2007).

However, the known devices do not provide the possibility of finding undocumented elements in the tested objects.

The technical objective of the proposed device is to provide the possibility of finding undocumented items when checked.

The solution to this technical problem consists in that in a device for testing microprocessor-based systems, including the testing module, DC and online data storage, management, processing of results and information, the first and second interfaces and the generator, where the first output unit connected with the first information input unit of processing results and information, the second output unit is connected with the input of the test unit through the first interface and the control unit, the second input of the processing unit results and information connected to the output of the second interface, the information input unit of the operational data storage connected with the information output module testing, and control output testing module connected with the control inputs of blocks is constant and online data storage, is amended as follows:

1) as a control unit used switch, while the first information input of the switch is connected to the output of the block RAM XP is tion data, the second information input of the switch is connected to the output of the unit permanent storage of data, the third information input of the switch is connected to the output of the first interface, the first output switch connected to the input module testing with alternate connection of the outputs of the block RAM data storage unit permanent storage of data or the first interface to the input of the testing module, the second output switch connected to the input of the second interface with the ability to connect the output of the block RAM data storage to the input of the second interface;

2) control output of the test unit is additionally connected with control inputs of the unit and processing unit results and information;

3) block permanent storage of information contains a program change data registers testing of a microprocessor system, formed by the test unit, control units, operational and permanent data storage.

The blocks of constant and rapid data storage and management can be external or formed in the test of a microprocessor system.

A causal relationship between changes in design and achieved technical result is that implemented so the new device is technically what Kim means of implementation-defined unit program goal-seeking is not only possible failure of the test object, but the alleged connection of unauthorized items, the presence of which is judged from the analysis of the aggregate differences between the specified and actual States of the registers of the test object, fixed unit processing results and information. Obviously, the quality of testing in terms of reliability of detection of undocumented elements depends on the programs written in the block of constant data storage and control.

With the technical implementation of the device as the control unit can be used the switch is made on the basis of the Atmega128 chip. However, the more appropriate is its software implementation using dedicated for this region testing module.

Figure 1 shows a functional diagram of the device. Here the double arrows indicate the passage of information signals, and single-arrow - control signals.

Device for testing microprocessor-based systems includes module 1 test a units 2 and 3 permanent and operational data store, respectively, the control unit 4, is made in the form of switch unit 5 processing of results and information, the first and second interfaces (pos.6 and 7, respectively) and unit 8. The first output unit 8 is connected with the first information input unit 5, the processing of results and in the information; the second output unit 8 is connected to the input of the module 1 test via the first interface 6 and the control unit 4; a second input unit 5, the processing of results and information connected to the output of the second interface 7; an information input unit 3 operational data storage connected with the information output module 1 test; control output module 1 test connected with control inputs of the blocks 2 and 3 permanent and operational data storage, respectively. The first information input of switch 4 is connected to the output of block 3 operational data storage; a second information input of switch 4 is connected to the output of block 2 persistent storage of data; a third information input of switch 4 is connected to the output of the first interface 6; the first output of switch 4 is connected to the input of the module 1 test with the alternate connection of the outputs of block 3 operational data storage unit 2 permanent storage of data or the first interface 6 to the input of the module 1 test; the second output of switch 4 is connected to the input of the second interface 7 with the ability to connect the output of block 3 operational data storage to the input of the second interface 7; control output module 1 further testing is connected with control inputs of the unit 8 and unit 5 processing of results and information. Block 2 constant the wounds of information contains a program change data registers testing of microprocessor-based systems.

The device is carrying out the following steps and sub cycles. Switching nested loops and teams within them is the signal at the output of the control module 1 test. In the first cycle recording a program of block 2 permanent storage of data through the control unit 4 and the module 1 test in block 3 operational data storage (team # 1 and # 2, signed fine print in italics in figure 1). After program entry, the device moves to the second round of testing. In this cycle unit 8 transmits the second output of the program is the first step of the test via the first interface 6 and the control unit 4 (team # 3) in the module 1 test. Recording registers control module 1 test (team # 4), and the state of all registers of the module 1 test shall be deposited in the unit 3. In the third cycle in accordance with the management team No. 5 module 1 test stored in block 3, the data is transferred via the control unit 4 and the second interface 7 in block 5 of the processing results and information, which compares the received values with standard transmitted from the first output unit 8. The result of the comparison is recorded in the testing Protocol and stored by the block 5. Further, the cycles repeat the are.

Tests of the proposed device for testing microprocessor-based systems have confirmed the possibility of identifying with it, unauthorized connections the following elements and nodes: block write data; simulation "hang"; undocumented data storage; undocumented registers of the microprocessor control system; the "secret" bits for a limited access program memory and data; unauthorized transfer of data. In addition, the use of the device revealed the following defects and faults of the test objects: lock the Chip or its individual components; removing memory protection read; changes over time (including cyclic) characteristics of the circuits beyond the limits indicated in the technical documentation.

Automated device for testing microprocessor-based systems, including the testing module, DC and online data storage, management, processing of results and information, the first and second interfaces and the generator, where the first output unit connected with the first information input unit of processing results and information, the second output unit is connected with the input of the test unit through the first interface and the control unit, the second input of the processing unit results and information is otklyuchen to the output of the second interface, the information input unit of the operational data storage connected with the information output module testing, and control output of the test unit is connected with control inputs of blocks is constant and the operational data store, wherein the control unit is a switch, while the first switch input coupled to the output unit operative to store data, the second information input of the switch is connected to the output of the unit permanent storage of data, the third information input of the switch is connected to the output of the first interface, the first output switch connected to the input module testing with alternate connection of the outputs of the block RAM data storage unit permanent storage of data or the first interface to the input of the testing module, the second output switch connected to the input of the second interface with the ability to connect the output of the block RAM data storage to the input of the second interface, the control output of the test unit is additionally connected with control inputs of the unit and processing unit results and information, and the block of permanent storage of information contains a program change data registers testing of a microprocessor system, formed by the test unit, control units, on Arutyunova and permanent data storage.



 

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