Device for x-ray inspection of thickness of sheet items

FIELD: non-destructive inspection; X-ray technology.

SUBSTANCE: device has X-ray radiation source, first and second radiation detectors, processing circuit and registrar. Detectors with different spectral sensitivities are used. The detectors are disposed one after another in such a way to make contact to each other at the side being opposite to where X-ray source is located.

EFFECT: improved precision of measurement; improved sensitivity.

1 dwg

 

The invention relates to measurement techniques, in particular, to x-ray thickness gauging, and can be used to control the thickness of the sheet blanks of various materials directly in their production in the presence in the ambient air zone control sediment, contaminants of industrial origin, including abrasive and other impurities.

Known devices for x-ray measurement of thickness of sheet products containing the x-ray source, for example the x-ray tube, a controlled product and consistently connected to the detector, the processing circuit comprising two amplifier and a divider, and the Registrar [SU Patent No. 718700, G 01 15/02, 28.02.80].

Precision control such devices are unsatisfactory because of the high-frequency fluctuation noise, even with little change in thickness of the test object, and the amount of interference may be commensurate with the magnitude of the useful signal, and in the area of the x-ray UX foreign matter (dust and metal suspension), released during the production of sheet products, which also weakens the x-ray stream.

The closest technical solution to the claimed appears to be a device for x-ray control of the thickness of the sheet is of steli, contains the x-ray source, a controlled product, two detector placed on the opposite side of the product along the axis of the x-ray UX, and consistently connected to the processing circuit, which includes two amplifiers, myCitadel, the adder and divider inputs connected to the outputs of vicites and adder, respectively, and the first inputs of vicites and adder connected to the output of the first amplifier, the second input vicites and adder connected to the output of the second amplifier, and the Registrar, and the outputs of the detectors are connected to the inputs of the amplifiers pattern [RU Patent No. 2179706, CL G 01 15/02, BI No. 5, 2002 - the prototype].

In this technical solution, the fluctuation component of error is eliminated technical solution is incorporated in the processing circuit. On the other hand, the detector is placed between the radiation source and product, as well as foreign inclusions in the air gap between the detectors, are an additional filter, weakening the x-ray beam, which leads to lowering the potential sensitivity. In this case, the control of products of small thickness is substantial absorption of soft x-ray spectral component of the radiation, which lowers the sensitivity of the device. The accuracy of the device is also insufficient because of the error the spine, associated with the change in the spectral distribution of the recorded x-ray flux.

The essence of the invention consists in that the device for x-ray measurement of thickness of sheet products containing the x-ray source, a controlled product, the first and second detectors of x-ray radiation along the axis of the x-ray UX, the processing circuit including first and second amplifiers and the divider inputs connected to the outputs of the first and second amplifiers, respectively, and the Registrar, the input connected to the output of the divider circuit processing, the outputs of the detectors are connected to the inputs of the first and second amplifiers of the processing circuit, the first and second x-ray detectors made with different spectral sensitivity and hosted contact each other from the product, the opposite side of the location of the x-ray source.

A positive result of the invention is a high sensitivity and precision control in the sphere of small and large thickness of the test object achieved by eliminating the error associated with the change in the spectral distribution of the detected x-ray flux within a solid angle of its beam, which is due to one-sided from siteline controlled products and contact-sequential arrangement along the flow axis x-ray detectors, made with different spectral sensitivity, it eliminates the need to use blocks subtraction and summation in the processing circuit, which generally increases the reliability of the device.

The drawing shows a structural block diagram of the device.

The device comprises a source 1 of x-ray radiation, for example x-ray tube, a controlled product (car, tape, strip) 2, the first and second detectors 3, 4 x-rays, scheme 5 processing the electrical signals of the detectors 3 and 4 and the Registrar 9. The processing circuit 5 includes first and second amplifiers 6 and 7, the inputs connected to the outputs of the detectors 3 and 4, and the divider 8, the inputs connected to the outputs of the amplifiers 6, 7, respectively, and output to the input of Registrar 9.

Both detector 3 and 4 are placed along the axis of the x-ray radiation flux on one side relative to the test object 2, i.e. the side opposite to the placement of the radiation source 1, and made contact with each other and with different spectral sensitivity. The first and second detectors 3, 4 are used to convert x-rays into electrical signals I1and I2. The difference between the spectral sensitivity of the detectors 3, 4 is provided with a choice of effective atomic number Z of the transformative elements of detector is 3, 4. For example, one of them is Z transformative element of small magnitude - order Z=6-13 (Al - aluminum), and the other detector Z transformative element of large magnitude - order Z=80-90 (Bi - bi) (see Beverages. Stabilization of the spectrum and flux of the source of probing radiation for x-ray thickness gauging. // Control. Diagnosis. No. 5. - 2003. - p.14-15). Different spectral sensitivity of the detectors 3, 4 under the control of the thickness of the product provides a high sensitivity device, in this case, the larger the discrepancy in the values of the atomic number Z, the higher the sensitivity. For increasing values of the ratio of useful signal to noise first to the product it is advisable to place the detector with a low atomic number Z.

Contact detectors 3 and 4 removes contaminated air gap between them, and therefore, provides simultaneous sending electrical signals I1and I2in the amplifiers 6 and 7 of the processing circuit 5. This is important because the test object 2 when the car is in motion, and through contacts of the detectors 3, 4 to be controlled thickness in a single cross-section of the product 2, i.e. in a single point, thereby increasing the accuracy of control. Pollution of the air gap from the source 1 to the detectors 3, 4 will naturally weaken the x-ray flux, but this donkey is the consumption will be the same for detectors 3 and 4.

In the process control of product thickness 2 anode voltage UAthe source 1 of x-ray radiation is kept constant (not shown).

The technical result to the control device thickness d products 2 provide different spectral sensitivity of the detectors 3, 4 and their contact-sequential placement along the axis of the x-ray flux from the product 2, the opposite side, where the x-ray emitter 1 (in the drawing, the x-ray flow depicted by arrows).

The operation of the device is as follows.

X-flow radiator 1 is directed to a controlled product 2. Skylight product 2, the stream is first detector 3, then the second detector 4, in which x-ray radiation is converted into electrical signals I1and I2. These signals are simultaneously amplified in the amplifiers 6, 7 and fed to the first and second inputs of the divider 8, respectively, where is the division signals of the I1/I2to ensure the compensation of the errors inherent in the prototype. Change the values of I1/I2judge the current value of d of a controlled product, a physical value which is displayed on the recorder 9.

A positive result of the invention are the high sensitivity, the accuracy and reliability of control of the thickness of the sheet product in the dynamics, which is achieved by double-detection of x-ray flux transmitted through the wall of the test material and the contact-sequential arrangement of the detectors along the axis of the x-ray stream, and the need to use blocks subtraction and summation as in the prototype in this case eliminated.

Device for x-ray control of the thickness of sheet products containing the x-ray source, a controlled product, the first and second x-ray detectors placed along the axis of the x-ray UX, the processing circuit including first and second amplifiers and the divider inputs connected to the outputs of the first and second amplifiers, respectively, and the Registrar, the input connected to the output of the divider circuit processing, the outputs of the detectors are connected to the inputs of the first and second amplifiers of the processing circuit, wherein the first and second detectors are made with different spectral sensitivity and hosted contact each other with the surface of the test material, the opposite the side location of the x-ray source.



 

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