X-ray meter of parameters of rolled stock out of metallic alloy

FIELD: the invention refers to the field of non-destructive control of objects with using of x-ray radiation.

SUBSTANCE: the arrangement has a source of x-ray radiation, three detectors of radiation and a scheme of processing. The characteristic feature of the arrangement is using of detectors with three-sectional converting elements with different spectral sensitivity. The technical result of the invention is increasing of energetic resolution expanding functional possibilities conditioned simultaneous measuring of the thickness of sheet material out of ferrous and non-ferrous metals.

EFFECT: the invention provides high metrological parameters.

1 dwg

 

The invention relates to the field of measuring techniques, in particular x-ray method of measuring thickness distribution and chemical composition of the material, and can be used to control sheet, pipe and other rental directly to the mills for cold and hot rolling in the dynamics.

Known x-ray measuring parameters rental of a metal alloy containing the x-ray source, consistently located in the radiation flux of the first and second detectors x-ray test object placed between the first and second detectors, the controller and the Registrar of patents of the Russian Federation No. 2179706, 2159408, CL G 01 15/02, US No. 4803715 A, 1989].

A disadvantage of the known x-ray gauges are limited functionality, consisting in control only of the thickness of the rolled stock with a fixed chemical composition and in need of a set of model measures the reference thickness of each rolled material to achieve the specified accuracy of the probes.

The closest technical solution to the claimed represented the x-ray measurement unit rental of a metal alloy containing the x-ray source, first, second and third detectors x-ray test object, R is smeshannoe between the first and second detectors, x-ray protection screen located between the emitter and the third detector, the processor and the Registrar, and the first and third detectors made two [RF patent № 2221220, CL G 01 B 15/02 - prototype].

The disadvantage of this technical solution is insufficient energy resolution, reducing the metrological characteristics of the measuring instrument.

The essence of the proposed technical solution is that in x-ray measurement unit rental of a metal alloy containing the x-ray source, first, second and third detectors x-ray test object located between the first and second detectors, x-ray protection screen, placed between the radiation source and the third detector, the first, second and third analog-to-digital converters, processor, inputs connected to the outputs of the first, second and third analog-to-digital converters, x-ray protection screen placed between the emitter and third detectors, and the logger associated with the input output processor, and the first the detector is converted to a controlled product transformative element from a material with high atomic number, and the third detector is facing as a transforming element for the controlled product from a material with a lower atomic number is m, introduced digital to analog Converter, an output connected to the input source x-ray emitter and the input to another output of the processor, the first, second and third detectors made three materials transforming elements which have the largest variety atomic number and alternate sequentially from smaller to larger or Vice versa, while the second detector is converted to a controlled product as a transforming element of a material with a lower atomic number, and layers of materials transforming elements of the three detectors are connected to the inputs of a three-channel analog-to-digital converters, respectively.

The technical result of the invention is to improve energy resolution, functionality, due to the simultaneous measurement of the thickness of the sheet material from both black and non-ferrous alloy, and providing high metrological performance.

The drawing shows a structural block diagram of the x-ray meter. It contains the source 1 of x-rays, consistently placed in the flow of direct x-ray radiation (shown through arrows) of the first and second detectors 2, 3, the third detector 4 x-rays, located parallel to the first detector 2, a controlled product , located between the first and second detectors 2 and 3, x-ray protection screen 6, the first, second and third analog-to-digital converters 7, 8, 9, a d / a Converter 10, a processor 11 and 12 Registrar.

All three detectors 2, 3 and 4 are three-section, in which the materials transforming elements have different value of the atomic number (number) Z, for example, Al (aluminum), TL (tantalum) and Bi (bismuth). Transforming elements placed in the detectors sequentially with increasing atomic number Z of their material, the signal of each section is converted to a separate channel analog-to-digital Converter. The detector 4 is placed in parallel to the first detector 2, but outside of the primary x-ray flux (shown through arrows), and is isolated from the direct flow of the radiation source 1 and the first detector 2 screen 6 of the x-ray shielding material such as lead. The first detector 2 is turned to the controlled product 5 transformative element of the material bismuth (Z=80-90), and the second and third detectors 3 and 4 are directed to a controlled product 5 transformative element of aluminum (Z=10-14). Intermediate transformative element in the detectors has an atomic number of order Z=70-75. The signals from the transforming elements of the detectors 2, 3, 4 is fed to the input of the processor 11 through the analog-to-digital converters 7, 8, 9. For the management of the current and voltage of the radiating chamber 1 is entered d / a Converter 10, which is controlled in turn from the CPU 11. The inspection results are displayed on the monitor 12 connected to the output processor 11.

Different sizes of the atomic number Z of the material transforming elements of the detectors 2, 3 and 4 provide high energy resolution, which improves the spectral sensitivity of the detectors 2, 3 and 4. To increase the value of the signal-to-noise and reduce distortion of the spectrum of radiation.

The detectors 2, 3, 4 are used to convert x-ray radiation into analog electrical signals that are digitized in analog-to-digital converters 7, 8, 9. D / a Converter 10 connected between the processor 11 and the emitter 1 and is designed to regulate the current and voltage of the emitter 1, which allows to manage the effective energy of the flow of the probing radiation. The CPU 11 performs the functions of processing the electrical signals of the detectors 2, 3, 4, convert (addition, subtraction, division) in the format suitable for playback on the recorder 12, the control mode of the emitter 1 and remembering information that is displayed on the recorder 12.

Effective energy is determined as a function of the relationship of the currents of the first and second, and second and third sections of the detectors 2, 3, 4, which covered a wider range of e is ergy quanta probe radiation and the spectral change during the passage of radiation through the test object more precisely determined the chemical composition of the material.

The operation of the meter.

In the process control products 5 to stabilize the metrological characteristics of measuring instrument constant support efficient energy flow probe radiation and its intensity. Effective energy is determined as a function of the relationship of the currents of the first and second, and second and third sections of the detectors. The primary x-ray flux is directed towards the first detector 2, which then transmits the product of 5 and gets to the second detector 3, while the reflected x-ray flux from the material of the test object 5 hits the detector 4. Electrical signals from the detectors 2, 3, 4 digitized in blocks 7, 8, 9 and fed to the processor 11 for processing and then to the recorder 12 in a suitable manner (for example, in physical units) for the operator. Electric signals from the detectors 2 and 3 are compared in the processor 11 and the change compared signals can judge the thickness of the test object. Simultaneously with this procedure are compared in the processor 11, the electrical signals of the detector 2 and detector 4, receiving the reflected x-ray flux from the material of the test object 5, and the change compared signals of these detectors 2 and 4 is judged on the value of the effective atomic number Zeffthe material of the test object.

The technical result of the invention is to improve the Metrology and expansion of the functionality of the meter, due to the simultaneous measurement of the thickness of the material and its effective atomic number due to the high energy resolution, which is provided by sensing the controlled product in two non-overlapping energy ranges.

X-ray measurement unit rental of a metal alloy containing the x-ray source placed in the radiation flux of the first, second and third detectors x-ray test object located between the first and second detectors, x-ray protection screen placed between the first and third detectors, first, second and third analog-to-digital converters, processor, inputs connected to the outputs of the first, second and third analog-to-digital converters, x-ray protection screen placed between the emitter and the third detector, and the logger associated with the input output processor, and the first detector facing the controlled product transformative element from a material with high atomic number, and the third detector is facing as a transforming element for the controlled product from a material with a lower atomic number, different is eat, that it introduced digital to analog Converter, an output connected to the input source x-ray emitter and the input to another output of the processor, the first, second and third detectors made three materials transforming elements which have the largest variety atomic number and alternate sequentially from smaller to larger, while the second detector is converted to a controlled product as a transforming element of a material with a lower atomic number, and layers of materials transforming elements of the three detectors are connected to the inputs of the processor through three analog-to-digital Converter, respectively.



 

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