Method for detection of semiconductor devices placed in rooms for unsanctioned recording of speech and visual information

FIELD: espionage protection techniques.

SUBSTANCE: method includes serial scanning of target surface by nonlinear locator, recording and processing received response in PC with displaying of positions of semiconductor devices. In case of appearance of response on target surface on command from PC visible laser is enabled, response points are lighted by it, pictured using digital camera and recorded in PC. Responses are process in conjunction with target surface image and integral picture of responses is built. On basis of received picture additionally visually detected are potentially possible places for placing semiconductor devices, and also trajectories of tracing of communications on target surface, structures of inbuilt metal construction and anomalies in said structures.

EFFECT: higher precision, higher efficiency, broader functional capabilities.

1 dwg

 

The invention relates to techniques for combating commercial and industrial espionage.

For identifying covertly embedded in the walls of the premises electronic “eavesdropping” and “obvious” devices became widespread nonlinear pulse locators. The principle of nonlinear locators based on the electromagnetic radiation of objects containing semiconductor nonlinear elements (transition metal-oxide-metal, p-n junction and others) and the reception of reflected higher multiples of harmonics of the excitation signal.

There is a method of identifying and assessing places bookmarks in the areas of semiconductor devices for unauthorized removal of verbal and visual information, which consists in the sequential scanning of the target surface nonlinear locator, fixing and processing received from her responses in the PC showing the location of semiconductor devices (US 6049301 A, G 01 S 13/06, 11.04.2000; WO 02/39140 A2, G 01 S 13/00, 16.05.2005; EN 2166769 C1, G 01 S 13/02, 10.05.2001; EN 22119669 C1, H 04 To 3/00, 20.12.2003; EN 2205419 C2, G 01 S 13/00, 27.05.2003 - prototype).

The disadvantage of this method is the low fidelity of spatial coordinates of semiconductor devices, due to poor recording of responses from the target surface and the lack of expressive integral is Noah pattern of responses. In addition, the known method does not allow to detect potential locations for placing semiconductor devices, and to determine the trajectory trace communications on the subject surface structure built structures and abnormalities in these structures.

The essence of the invention is expressed in a set of key characteristics, sufficient to achieve provided by the invention technical result, which is expressed in increasing the accuracy of detection and quality assessment places bookmarks semiconductor devices, and in expanding the range of tasks.

This technical result is achieved in that in the method of identification and assessment of places bookmarks in the areas of semiconductor devices for unauthorized removal of verbal and visual information, which consists in the sequential scanning of the target surface nonlinear locator, fixing and processing received from her responses in the PC showing the location of the semiconductor device, in the case of responses from the target surface at the command of the PC include working in the visible range laser, illuminating them feedback, produce their photography with a digital camera and record in PC, while processing response PR is vyzyvaet to the image of the subject surface and build integrated picture of the responses, which additionally visually detect potential locations for placing semiconductor devices, as well as determine the trajectory trace communications on the subject surface structure built structures and abnormalities in these structures.

A comparison of the claimed technical solution with the closest analogue has allowed to establish compliance with a criterion of "novelty", as it is not known from the prior art.

The proposed method is industrially applicable with existing hardware and meets the criterion of "inventive step", because it is not obvious from the prior art. This last does not suggest any action, characterized by distinctive features of the prototype substantial evidence on the achievement of the technical result.

Thus, the proposed technical solution meets the conditions of patentability of an invention.

The figure schematically presents the instrumental complex for realization of the proposed method.

The complex includes the device 1 scan 2 blocks radiation and 3 receiving electromagnetic waves (conventionally shown only one such unit), the illumination laser 4, unit 5 control, telemetry unit 6 interface 7, mounted on the tripod digital camera 8 and the portable PC 9 and channel 10 data transmission (radio or IR channel). Items 11.1, 11.2 marked incorporated in the target surface (wall, window frames, chairs, etc.) premises semiconductor devices for unauthorized removal of verbal and visual information (conventionally shown only two such devices).

During practical use of the scanning device 1 is directed to the target surface. The transmitting antenna unit 2 radiation of electromagnetic waves, which can be applied to the generator standard signal is sent to the probing signal, for example, at a frequency of 915 MHz. The irradiation of this signal hidden in the surface of semiconductor devices 11.1, 11.2 from the last recorded higher harmonic multiples of the probing signal. The feedback received at frequencies 1830 and 2745 MHz accept receiving antenna unit 3 receiving electromagnetic waves, made for example in the form of selective microvoltmeter. The source and destination scan data supplied to the telemetry unit 6 through the interface 7 and channel 10 data received for processing in the PC 9.

Simultaneously with electromagnetic scanning the target surface with the semiconductor device and 11.1, 11.2 illuminated by the laser 4, operating in the visible range, and photographed with a digital camera 8. Received photos also come in personal computer 9, which is integral processing of the results of the survey surface and is constructed integral picture of responses.

Work 2 blocks radiation and 3 receiving electromagnetic waves, the illumination laser 4, the interface 7 digital device 8 and the PC 9 is carried out by appropriate commands from the control unit 5. Provides software for examination of the surface, performing surveys in automatic mode with the use of the results of the surveys received from the scanning device 1, and the photographic survey from the digital camera 8, and precluding the possible errors of the operator performing the inspection.

In this technical solution, the results of the examination room surfaces is both an objective assessment of the availability of mortgages semiconductor devices, and promptly received a localized zones of potential bookmarks that are documented using a digital camera 8 and the PC 9 with subsequent delivery of hard copy images of all potentially hazardous areas of the target surface and indicating what kind of responses were received to the particular localized area.

Thus, this hardware-software complex provides more accurate identification and quality assessment of places bookmarks semiconductor devices, as well as expanding the range of tasks.

How to identify and assess places bookmarks in the areas of semiconductor devices for unauthorized removal of verbal and visual information, which consists in the sequential scanning of the target surface nonlinear locator, fixing and processing received from her responses in the PC showing the location of the semiconductor device, characterized in that in the case of responses from the target surface at the command of the PC include working in the visible range laser, illuminating them feedback, produce their photography with a digital camera and capture in the PC, with the processing of responses tied to the image of the subject surface and build integrated picture of the responses, which additionally visually detect potential place bookmarks semiconductor devices, as well as determine the trajectory trace communications on the subject surface structure built structures and abnormalities in these structures.



 

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