X-ray device for inspecting thickness of multilayer coatings of cylindrical items

FIELD: non-destructive inspection.

SUBSTANCE: primary and secondary n detectors are made of multielement converting elements made of materials having different atomic numbers. Materials are disposed in detectors subsequently starting from lower number to higher ones. Converting elements of primary and secondary n detectors are electrically connected with inputs of (1+n) analog-to-digital converters. Primary detector is rigidly fastened to collimator of radiation source and is turned to item with side having been made of material with higher atomic number. Secondary n detectors are turned to item with sides having lower atomic number. Points of stop of discrete displacement of radiator with primary detector along the rail are coincided with radial directions being placed in the middle of radial directions which form sectors and cross the items at lateral cross-section through their longitudinal axis and centers of secondary n detectors. Value of equivalent atomic number of any layer of coating is calculated from algorithm introduced into processor.

EFFECT: improved precision of inspection.

1 dwg

 

The invention relates to the field of control and measurement technology, in particular to x-ray measurement of the thickness of the multilayer protective coating of hollow cylindrical articles, and can be used to control parameters of coatings of any materials in the process of applying to the surface of the main pipelines in the dynamics.

Known x-ray device control the wall thickness of the product from a metal alloy containing the x-ray source, a primary detector, placed in the direct x-ray flux, a secondary detector, placed in the reflected from the product of the x-ray stream, and processing and recording of the output signals [RF Patent N 2221220, 2004, US No. 4803715 A, 1989, GB No. 1079999 But, 1967].

A disadvantage of the known x-ray control device thickness is limited functionality, which consists in controlling the coating thickness of flat and cylindrical products in the local points on the surface of the product with a fixed chemical composition and in need of a set of model measures the reference thickness for each coating material to ensure a given Metrology devices.

The closest technical solution to the claimed appears to be an x-ray control of the thickness of the cylindrical articles containing the x-ray source, the primary and secondary detectors, analog-to-digital converters, processor, Registrar and other functional bodies of the operation of the device [RF Patent №2159408, IB No. 32, 2000].

A disadvantage of the known technical solution is the functional limitation in measuring the thickness of one wall, and an integral value of the measurement result is judged on the thickness of the entire surface of the product.

The invention consists in that in the x-ray device control the thickness of the multilayer coating cylindrical articles containing the radiation source x-ray flux by the collimator, the primary detector, controlled multi-product, secondary n detectors are protected from each other and from the radiation source and the primary detector x-ray shielding screens, (1+n) multi-channel analog-to-digital Converter, a processor, coupled inputs with outputs (1+n) analog-to-digital converters, the logger associated with the input output processor, the guide rail with shell made in the form of a rigid ring and placed respectively on the upper and lower orbits cross-section of the cylindrical article, the electric actuator in the form of a stepper motor for discrete movement of the emitter and digital-to-analogue Converter connected to the input to control what they access processor, and the output with the input of the emitter, and the emitter is installed properly its collimator to the product surface and mounted on the guide rail hinge with the possibility of discrete movement along the rail, and the secondary n detectors installed as normal to the product and is secured to the cowling firmly in equal from each other the distance of the arcs of the sectors formed by the radial lines passing through the longitudinal axis of the product and the centers of each of the secondary n detectors, primary and secondary n detectors are collected from multiple transforming elements, materials which have different atomic numbers and placed in the detectors sequentially from smaller numbers to larger, the primary detector is rigidly attached to the collimator of the radiation source and directed to the product side conversion element from a material with high atomic number, and the secondary n detectors converted to the product by the parties with the transformative elements of a material with a lower atomic number, and breakpoints discrete movement of the emitter with the primary detector along the rail combined with the radial directions lying in the middle between the radial directions, forming sector and passing through the longitudinal axis of the product and the secondary n detectors in the cross-settimescale.

A positive result of the invention is that the proposed device provides quasiplane control of the thickness of each coating, made of any material, over the entire cylindrical surface of the product, due to the simultaneous rotation of the emitter and the linear displacement of the test object and at the same time, allows us to calculate the value of the equivalent atomic number of each coating in accordance with a specified algorithm due multielement design of detectors made of materials with different atomic numbers.

The drawing shows a diagram of the device for controlling the thickness of the multilayer coating cylindrical articles.

The device comprises a source 1 of radiation of the x-ray flux by collimator (collimator not shown), the primary detector 2, which is controlled cylindrical piece 3 with a multi-layer protective coating, secondary n detectors 4, protected from each other and from the radiation source 1 and the primary detector x-ray protection 2 screens (screens not shown), (1+n) multi-channel analog-to-digital Converter 5, a CPU 6, inputs connected to the outputs of the (1+n) analog-to-digital Converter 5, the Registrar 7, the input associated with output processor 6, the guide rail 8 shell 9 made in the form of a rigid ring and placed sootvetstvenno upper and lower orbits cross-section of the cylindrical article, the electric actuator 10 in the form of a stepper motor to provide a discrete displacement of the emitter 1 and the d / a Converter 11.

The emitter 1 is installed on the guide rail 8 is articulated with the possibility of discrete move along the rail 8 and turned her collimator is normal to the surface of the product, and the secondary n detectors 4 are set as normal to the surface 3 and is secured to the cowling firmly in even apart intervals along arcs of sectors formed by radial lines passing in the cross-section of the object 3 through its longitudinal axis and the centers of each of the secondary n detectors 4. Primary and secondary n detectors 2 and 4 are assembled from multiple transforming elements, materials which have different atomic numbers (numbers) Z, and placed these elements in the detectors in series, for example, from smaller numbers to larger. Converts the elements of the detectors 2 and 4 are connected to the inputs (1+n) multi-channel analog-to-digital Converter 5, the primary detector 2 is rigidly attached to the collimator of the radiation source 1 and converted to the product side conversion element from a material with high atomic number, and the secondary n detectors 4 are turned to the article 3 of its sides with transforming elements from a material with less and atomic numbers. Breakpoints at discrete emitter movement 1 with the primary detector 2 along the rail 8 is combined with the radial directions located in the cross section of articles 3 and lying midway between the radial lines passing in the same transverse section of the object 3 through its longitudinal axis, and accordingly the secondary n detectors 4. The stopping time of the emitter 1 at discrete points of the rail 8 should be sufficient so that all actions of the processor 6, in connection with the operations of the information processing were made.

Emitter 1 with the primary detector 2 are provided with an Autonomous electrical power that would have to untie them from the power blocks of the device at discrete movement. Electrical connection with other low-voltage blocks are provided through the galvanic isolation.

The detectors 2 and 4 are used to convert x-ray radiation into analog electrical signals that are digitized in (1+n) multi-channel analog-to-digital converters 5. The expression (1+n) denotes the sum of primary and secondary n detectors 2 and 4. The value of n is assigned on the basis of obtaining the necessary information capabilities specified in the technical specifications for coating products 3.

Mnogoplemennosti converters detectors 2 and 4 different sizes atom is diversified number Z of materials and their sequential placement of the detectors 2 and 4 provide high energy resolution, improving the spectral sensitivity of the detectors 2 and 4, and in General the device and increase the value of the signal-to-noise ratio and reducing the distortion of the spectrum of radiation, while allowing not only to restore the traditional method the geometric structure of the controlled coating product 3 according to the degree of absorption of x-rays with a fixed effective energy of the x-ray flux, but also to calculate the values of the equivalent atomic number of each layer of the protective coating, applied to the cylindrical piece 3.

Atomic number materials transforming elements appoint from 3 to 90, which correspond to the materials from lithium or sodium to bismuth. Defined equivalent atomic number materials coatings included in this range.

The CPU 6 performs the functions of a content created by a given algorithm, it play automatically or by operator command, processing the electrical signals of the detectors 2 and 4 for a given algorithm, convert (addition, subtraction, division) in the format suitable for playback on the recorder 7, the control mode of the emitter 1 and remembering information that is displayed on the recorder 7.

The electric actuator 10 electrical input is connected to control the output of the processor 6 and the mechanical output to what bosom emitter 1, for example, through a reducer (not shown) and is intended to provide a discrete displacement of the emitter 1 along the rail 8 for a given algorithm.

D / a Converter 11 connected between the CPU 6 and the emitter 1 and is designed to regulate the current and voltage of the emitter 1, which allows to manage the effective energy of the flow of the probing x-rays.

Efficient energy is a function of the relationship of the currents transforming elements of the primary and secondary n detectors 2 and 4, which covered a wider range of energy quanta probe radiation, and the spectral change during the passage of radiation through the thickness of the layers of coating cylindrical articles with greater accuracy is determined by the equivalent chemical composition of the coating product.

The guide rail 8 is made in the form of a ring, combined with its contour with the upper orbit of the cylindrical test object 3 at a distance from the workpiece 3, which provides x-ray radiography of the wall thickness of the test object. Annular ring 9 is made smaller in diameter and aligned with the bottom of the orbit, between the upper orbit and cylindrical product 3. Both orbits are placed in a single cross-section of the object 3. The electric actuator 10 kinematically for example, through the reduction gear, connected to the emitter 1 and provides a discrete movement of the emitter 1 in the circumferential direction of the product 3 in accordance with a program incorporated in the processor 6. As Registrar 7 use the video monitor.

The operation of the x-ray device.

For stabilization of the metrological characteristics of the device in the process control of the thickness of multilayer coatings products 3 constant support efficient energy flow probe radiation and its intensity for a given algorithm, entered in the processor 6. X-ray flux emitted through the collimator source 1 penetrating through a primary detector 2 and the coating and the foundations of the wall of the cylindrical article 3, is reflected from the boundary of the coating product 3, and the reflected flux falls on two adjacent (lateral) from the direct x-ray UX of the secondary detectors 4. In this case, on the screen of the Registrar 7 appear above the fixed horizontal line line called zero level obtained in the absence of multi-layer coatings, others glowing lines that are spaced, for example, above the zero level, the number of which will correspond to the number of coatings. The values of electrical signals between zero and current levels will characterize the thickness of each of the coatings in jet, the x local areas of the surface of the cylindrical article 3 relative to the direct radiation flux. Obtained data from two nearby from direct x-ray flux detectors 4 are recorded in the processor 6. In addition, when displaying a working electrical levels on the screen of the Registrar 7 simultaneously displayed digital non coatings opposite the working levels. If the levels are merged into one line, then the digital numbers corresponding to these levels are displayed in a line. This situation will mean the equality of the coating thickness in this local area measurement.

Then the emitter 1 with the primary detector 2 is moved by means of an electrical actuator 10 along the rail 8 by a certain amount in accordance with the command program in the processor 6. In another case, on the screen of the Registrar 7 also appear above the fixed horizontal line line other glowing lines, electric amplitude equivalent values of the next real thickness of each layer of coating cylindrical articles 3 in two other specific local areas of control. The procedure of control in other areas of the surface 3 is repeated in the circumferential direction in the same way. On the obtained measurement data of the electric current levels relative to the zero judge the thickness of each of the multilayer coatings in individual areas of the control surface and products 3.

In the process control of film thickness product 3 evenly move along its longitudinal axis, to thereby provide control of the coating thickness of the product 3 in a spiral direction of its generatrix of the cylindrical surface. It is possible to provide the control surface 3 on a circular path, i.e. in the cross-section of the object 3, then its axial displacement must be discrete.

At the same time with the technology of measuring the thickness of multi-layer coatings are compared in the processor 6 electrical signals from materials controlled coatings, and the change compared to the signals of the detectors 2 and 4 is judged on the values of the effective atomic number Z of the material of the controlled coating.

The technical result of the invention is that the proposed device provides quasiplane control of the thickness of each coating, made of any material, over the entire cylindrical surface of the product, due to the simultaneous rotation of the emitter 1, the linear displacement of the test object 3 and the high energy resolution and at the same time, allows us to calculate the value of the equivalent atomic number of each coating in accordance with a specified algorithm due to the multi-element design of the detectors 2 and 4 are made of materials with different atomic numbers.

 

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