X-ray method for measuring the thickness of sheet products
The invention relates to the field of non-destructive testing of objects using x-rays. The method consists in Desk passed through the controlled object x-ray radiation. A distinctive feature is the two consecutive detection of the last thread, the determination of the ratios of the electrical signals and determining the thickness of the product by comparing the relationship of the signals from the calibration function. The technical result of the invention is to improve the sensitivity and accuracy of measurement. 1 Il.The invention relates to measurement techniques, in particular x-ray thickness gauging, and can be used to control the thickness of sheet metal products rolling mill and the thickness of the tapes, strips of different materials as in statics and dynamics.Known x-ray methods of measuring the thickness of sheet products that are implemented in the devices consists in the fact that the product Shine already predetection x-ray flux, which after passing the product detects again, then the electrical signals from detaicossa signal is judged on the thickness of the sheet [SU Patent N 718700, G 01 15/02, 28.02.80].The control accuracy of such methods is unsatisfactory because of the presence of high-frequency fluctuation noise, even with little change in thickness of the wall of the product, and the amount of interference may be commensurate with the magnitude of the useful signal and, in addition, the fluctuation persists and is not compensated by these methods.The closest technical solution to the claimed represented the x-ray method for measuring the thickness of sheet products, implemented in the playback device of the method lies in the fact that the product Shine in advance predetection x-ray flux, and after x-ray products this thread again detects, then both electric signal from the detecting x-ray flux to the product after its sum, then subtract them and the results obtained from the summation and subtraction divide each other, and the private value of the division is judged on the value of the measured thickness [RU Patent N 2179706, CL G 01 15/02, BI N5, 2002 - prototype].In this technical solution, the fluctuation component is eliminated, the oscillation of the anode current of the x-ray radiation is also compensated for by the action of pic is my product Shine already predetection x-ray flux. On the other hand the detection of x-ray UX always causes its weakening (filtering), so the detection of flow to the product leads to a decrease of the potential sensitivity of the mode, and the control of products of small thickness is substantial absorption of soft x-ray spectral component of the radiation, which also reduces the sensitivity of the method, in addition, its accuracy is also insufficient due to errors associated with the change in the spectral distribution of the recorded x-ray flux.The essence of the invention consists in that the x-ray method for measuring the thickness of the product, which consists in the fact that the product can be seen through the x-ray flux, detects this thread from the opposite side of the product and the change of the electric signal proyektirovanive flux transmitted through the product is judged on its thickness, characterized in that the first x-ray the x-ray flux alternately samples the reference thickness, and passed through each of the samples x-ray emission detected twice in succession along the flow, but with different spectral sensitivity, and the electrical signals I
ClaimsX-ray method for measuring the thickness of sheet products, which consists in the fact that the product can be seen through the x-ray flux, detects this thread from the opposite side of the product and the change of the electric signal proyektirovanive flux transmitted through the product is judged on its thickness, wherein the first x-ray the x-ray flux alternately samples the reference thickness, and passed through each of the samples x-ray emission detected twice in succession along the flow, but with different spectral sensitivity, and the electrical signals I1and I2obtained respectively from the first (initial) and second (additional) detection, enhance, share each other and build the calibration characteristic from the received values of the ratio (I1/I2depending on the thickness dFLsamples sample thickness (I1/I2)=f(dFL), then the above procedures performed the relations (I1/I2) the controlled product determine the current value of the thickness d of the controlled products on the calibration characteristic, while the anode voltage UAx-ray source with all the procedures of the method of constant support.
SUBSTANCE: method includes recording number of particles emitted by radioactive layer on basis of number of voltage or current pulses recorded by counting device, then to measuring detector a flow of ionizing radiation is directed from calibrating standard electrode and also registered is number of particles, position of covered electrode is change no less than two times, by turning it in horizontal plane around its axis for arbitrary angle, while repeating measurement of pulses number, while measurement time is selected to be such that number of recorded pulses was no less than 3600 pulses for each measurement position, and then selection of necessary number of electrodes is calculated for forming electrode system in chamber.
EFFECT: higher precision, higher safety.
FIELD: MEASUREMENT TECHNOLOGY.
SUBSTANCE: electromagnet wave is induced by means of directed aerial. The wave is incident to dielectric plate. Brusterain angle of incident wave is defined from minimum value of reflected wave and value of dielectric permeability is calculated. Power of incident and reflected waves are measured and the value of reflectivity and specific conductivity are calculated as well as value of dielectric loss of dielectric plate. Then incident angle of electromagnet wave is increased till achieving value providing total internal reflection of electromagnet wave and attenuation of intensity is measured at normal plane relatively direction of wave propagation. Factors of normal attenuation and thickness of dielectric plate are calculated. Method allows to find complex dielectric permeability and thickness of dielectric plates free of dielectric substrates.
EFFECT: improved reliability.
FIELD: electrical measurements.
SUBSTANCE: device is proposed for measurement of dielectric and magnetic permeability as well as thickness of spin coatings on surface of metal and can be used in chemical industry for inspecting composition and properties of liquid and solid media. Electro-magnetic field is induced in body of dielectric material to be inspected which material is applied onto dielectric substrate, by means of sequent excitation of slow surface waves: two E-waves are excited at different, but having almost the same value, wavelengths λr1 and λr2 and one H-wave having wavelength of λr3. Attenuation of field intensity is measured t normal plane in relation to direction of wave propagation by means of receiving vibrators system for different values of base d between them. Normal attenuation factors αE1,αE2 and αH are found from ratio of E(y)= E0 exp[-α(y) y]. Magnetic and dielectric permeability and thickness of magneto-dielectric coating are found from relations of and where has to be phase coefficient of H-wave.
EFFECT: improved precision of measurement.
FIELD: measuring engineering.
SUBSTANCE: meter determines dielectric permittivity and thickness of the oil layer by measuring at two angles unequal to the Brewster angle.
EFFECT: simplified design and expanded functional capabilities.
FIELD: radiometric testing.
SUBSTANCE: counting of electric pulses of all the detectors stops simultaneously as soon as any detector registers no less than specified number of electric pulses caused by ionizing radiation.
EFFECT: improved reliability.
2 cl, 1 dwg
FIELD: non-destructive inspection.
SUBSTANCE: primary and secondary n detectors are made of multielement converting elements made of materials having different atomic numbers. Materials are disposed in detectors subsequently starting from lower number to higher ones. Converting elements of primary and secondary n detectors are electrically connected with inputs of (1+n) analog-to-digital converters. Primary detector is rigidly fastened to collimator of radiation source and is turned to item with side having been made of material with higher atomic number. Secondary n detectors are turned to item with sides having lower atomic number. Points of stop of discrete displacement of radiator with primary detector along the rail are coincided with radial directions being placed in the middle of radial directions which form sectors and cross the items at lateral cross-section through their longitudinal axis and centers of secondary n detectors. Value of equivalent atomic number of any layer of coating is calculated from algorithm introduced into processor.
EFFECT: improved precision of inspection.
FIELD: the invention refers to the field of non-destructive control of objects with using of x-ray radiation.
SUBSTANCE: the arrangement has a source of x-ray radiation, three detectors of radiation and a scheme of processing. The characteristic feature of the arrangement is using of detectors with three-sectional converting elements with different spectral sensitivity. The technical result of the invention is increasing of energetic resolution expanding functional possibilities conditioned simultaneous measuring of the thickness of sheet material out of ferrous and non-ferrous metals.
EFFECT: the invention provides high metrological parameters.
FIELD: inspection of dynamics of changes in cellular structures.
SUBSTANCE: method concludes angular collimation of α-radiation by means of Soller collimator, registration of energy spectrum of collimated flux of particles, determination of lateral structures from the shape of registered spectrum on the base of its mathematical model.
EFFECT: improved precision; improved speed of measurement.
FIELD: measurement technology.
SUBSTANCE: microwave electromagnetic fields of running surface slow E-waves and E1 and E2 at two wavelengths λosc1 and λosc2 of oscillator being close in value above dielectric-metal surface at single-mode regime. Damping factors αe1 and αe2 of electric field strength are measured at normal plane relatively direction of propagation of slow surface of wave. Real value of dielectric constant and thickness of coating are calculated. Taking measured values of damping factors into account, values of deceleration are calculated for those wavelengths by relation of Directional pattern maximum angle of inclination θdp max(fz)=θe1(e2) is measured at far zone by means of vertically oriented receiving vibrator. Length of dielectric coating le1 and le2 is determined from relation of le1(e2)=0.552·λosc e1(e2)/(νdf e1(e2)-cosθe1(e2) and its value l=(le1+le2)/2 is subject to averaging.
EFFECT: improved precision of measurement of longitudinal sizes of dielectric coating.
FIELD: non-destructive inspection; X-ray technology.
SUBSTANCE: device has X-ray radiation source, first and second radiation detectors, processing circuit and registrar. Detectors with different spectral sensitivities are used. The detectors are disposed one after another in such a way to make contact to each other at the side being opposite to where X-ray source is located.
EFFECT: improved precision of measurement; improved sensitivity.