X-ray method for measuring the thickness of sheet products

 

The invention relates to the field of non-destructive testing of objects using x-rays. The method consists in Desk passed through the controlled object x-ray radiation. A distinctive feature is the two consecutive detection of the last thread, the determination of the ratios of the electrical signals and determining the thickness of the product by comparing the relationship of the signals from the calibration function. The technical result of the invention is to improve the sensitivity and accuracy of measurement. 1 Il.

The invention relates to measurement techniques, in particular x-ray thickness gauging, and can be used to control the thickness of sheet metal products rolling mill and the thickness of the tapes, strips of different materials as in statics and dynamics.

Known x-ray methods of measuring the thickness of sheet products that are implemented in the devices consists in the fact that the product Shine already predetection x-ray flux, which after passing the product detects again, then the electrical signals from detaicossa signal is judged on the thickness of the sheet [SU Patent N 718700, G 01 15/02, 28.02.80].

The control accuracy of such methods is unsatisfactory because of the presence of high-frequency fluctuation noise, even with little change in thickness of the wall of the product, and the amount of interference may be commensurate with the magnitude of the useful signal and, in addition, the fluctuation persists and is not compensated by these methods.

The closest technical solution to the claimed represented the x-ray method for measuring the thickness of sheet products, implemented in the playback device of the method lies in the fact that the product Shine in advance predetection x-ray flux, and after x-ray products this thread again detects, then both electric signal from the detecting x-ray flux to the product after its sum, then subtract them and the results obtained from the summation and subtraction divide each other, and the private value of the division is judged on the value of the measured thickness [RU Patent N 2179706, CL G 01 15/02, BI N5, 2002 - prototype].

In this technical solution, the fluctuation component is eliminated, the oscillation of the anode current of the x-ray radiation is also compensated for by the action of pic is my product Shine already predetection x-ray flux. On the other hand the detection of x-ray UX always causes its weakening (filtering), so the detection of flow to the product leads to a decrease of the potential sensitivity of the mode, and the control of products of small thickness is substantial absorption of soft x-ray spectral component of the radiation, which also reduces the sensitivity of the method, in addition, its accuracy is also insufficient due to errors associated with the change in the spectral distribution of the recorded x-ray flux.

The essence of the invention consists in that the x-ray method for measuring the thickness of the product, which consists in the fact that the product can be seen through the x-ray flux, detects this thread from the opposite side of the product and the change of the electric signal proyektirovanive flux transmitted through the product is judged on its thickness, characterized in that the first x-ray the x-ray flux alternately samples the reference thickness, and passed through each of the samples x-ray emission detected twice in succession along the flow, but with different spectral sensitivity, and the electrical signals I1/I2depending on the thickness dFLreference samples (I1/I2)=fdFLwhere dFLthe thickness of the reference sample, I1- electrical signal upon initial detection of the x-ray thread, I2electric signal with additional detection of x-ray UX, then pishevarenie procedures are exactly the same as on the real (working) testing item with the current thickness of dslaveexcept that the newly obtained values of relations I1/I2on the work product to determine the current value of the thickness dslavecontrolled product calibration characteristic, while the anode voltage uAx-ray source for all procedures support permanent.

A positive result of the invention is a high sensitivity in the region of small and large thickness of the test object and the accuracy of the control method by eliminating the error associated with the change in the spectral distribution of the detected x-ray flux within the al flux detection twice in this thread with different spectral sensitivity, eliminating the operations of summation and subtraction of the electrical detection signals, thereby to improve in addition to Metrology and reliability of the method.

The drawing shows the calibration characteristic values of the ratio of output electrical signals of I1/I2obtained during the initial and additional detektirovaniya x-ray UX, as a function of thickness dFLreference samples.

The operation detection carried out with different spectral sensitivity, which is defined by selecting a different value of the atomic number Z of the transformative elements such as detectors for detection, and the greater the difference in the values of the atomic number, the higher the sensitivity of the method. In process control the thickness of the reference samples and work products of the anode voltage of the x-ray source support uAnd=const. Since the speed of propagation of x-rays is close to the speed of light, the operation detection is kvaziodnorodnoj, despite the fact that the detection is performed sequentially along the x-ray UX.

The technical result - the method of controlling thickness of the product, the opposite side, which provide x-ray radiation, and the detection is performed with different spectral sensitivity.

The work method is that the x-ray flux emit first turn on the samples of the reference thickness and positivly sample stream with different spectral sensitivity detects twice in succession along the x-ray UX. Then the values of the electrical signals I1and I2obtained during the initial and additional detektirovaniya with different spectral sensitivity, enhance and share them with each other, and then build the calibration characteristic of the values of the relations I1/I2obtained by division, depending on the values of thickness dFLreference samples (I1/I2)=fdFL.

Performed the above steps (procedures) are exactly the same as on the real (working) testing item with the current, the thickness of dslaveexcept that the newly obtained values of relations I1/I2the desktop product is determined by calibration characteristic thickness dslavecontrolled products. When the anode voltage uAndsource output result of the invention are high metrological performance control of the thickness of the product when Troubleshooting process operations of subtraction and summation of electrical signals, achieved double sequential detection of x-ray flux transmitted through the test object, with different spectral sensitivity.

Claims

X-ray method for measuring the thickness of sheet products, which consists in the fact that the product can be seen through the x-ray flux, detects this thread from the opposite side of the product and the change of the electric signal proyektirovanive flux transmitted through the product is judged on its thickness, wherein the first x-ray the x-ray flux alternately samples the reference thickness, and passed through each of the samples x-ray emission detected twice in succession along the flow, but with different spectral sensitivity, and the electrical signals I1and I2obtained respectively from the first (initial) and second (additional) detection, enhance, share each other and build the calibration characteristic from the received values of the ratio (I1/I2depending on the thickness dFLsamples sample thickness (I1/I2)=f(dFL), then the above procedures performed the relations (I1/I2) the controlled product determine the current value of the thickness d of the controlled products on the calibration characteristic, while the anode voltage UAx-ray source with all the procedures of the method of constant support.

 

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