A portable device of the automated diagnostic x-ray thickness gauges

 

The invention relates to the field of calibration of measuring and inspection equipment, in particular by means of automated diagnostic x-ray thickness gauges, and can be used to control sheet and structural shapes in the dynamics. The inventive portable device of the automated diagnostic x-ray thickness gauges includes the case in which is placed an Autonomous power supply, analog shaper electrical signals, made in the form of parallel connected p simulation of circuits, each of which consists of the amplifying element FET, and serially connected to a capacitor. The control inputs of field-effect transistors are n inputs of the driver. Calibrator electrical signals, the input is connected to the output of the shaper. In addition, the device comprises a laptop with reference control program representing a database of standards in analog electrical form, imitating the reference thickness model measures from a material with different values of the effective atomic number Zeff. The outputs of the laptop connected to inputs of the analog formirovanie is on of the motor, the yield of the latter is intended for connection to the input of calibrated x-ray thickness gauge. Technical result: improvement of the metrological characteristics of the x-ray thickness gauges rental and additionally providing measurement of effective atomic number Zeffmaterial rental. 4 Il.

The invention relates to the field of calibration of measuring and inspection equipment, in particular by means of automated diagnostic x-ray thickness gauges, and can be used to control sheet and structural shapes in the dynamics directly on the cold and hot rolling.

Known stands for the formation of a given spectrum x-ray radiation, containing the x-ray emitter, a radiation receiver, the filtering radiation, made in the form of a rotating element with plates of variable continuously or discretely changing the thickness of various materials and is placed between the emitter and the radiation receiver [RF Patent 2168229, CL G 21 K 3/00, 15, 2001].

The accuracy and reliability of the diagnosis of such x-ray thickness gauges is limited by the fact that their nodes and device self-test does not allow ideone thickness. To improve the accuracy of the reference features may increase the expensive model measures with a small step changes in thickness and a fixed value of the effective atomic number Zeffmaterial measures, however, the self-test procedure is also time consuming.

Closest to the claimed technical solution is the device self-test measuring devices containing analog shaper electrical signals, made in the form of parallel connected p simulation of circuits, each of which consists of the amplifying element FET and serially connected to a capacitor, while the control inputs of field-effect transistors are n input shaper, the calibrator electrical signals, the input coupled to the output of the shaper, and an Autonomous power supply [RF Patent 2082640, CL 61 K 9/00, 18 BI - prototype].

This technical solution allows a wide range and with high accuracy to provide a self-diagnosis function measuring tool, but it is specific for each particular instrument, not reproducibly for other devices, and therefore, is not economically justified and is not on what is in a portable device of the automated diagnostic x-ray thickness gauges, containing case, which houses the analog shaper electrical signals, made in the form of parallel connected p simulation of circuits, each of which consists of the amplifying element FET and serially connected to a capacitor, while the control inputs of field-effect transistors are n input shaper, the calibrator electrical signals, the input coupled to the output of the shaper, and an Autonomous power supply, put the laptop with reference control program representing a database of standards in analog electrical form, simulating the reference thickness model measures from a material with different values of the effective atomic number Zeffand analog-to-digital Converter, and the calibrator is made in the form of a transformer, the input of which is the primary winding inductance, the output of the secondary winding inductance, and outputs the laptop is connected to n inputs of the analog shaper, and the output of the calibrator is connected to the input of analog-to-digital Converter, the output of which being wijesundara of the invention is to improve the metrological characteristics of the x-ray thickness gauges rental and additionally the measurement of effective atomic number Zeffmaterial steel, as well as the efficiency of the process technology calibration by eliminating the need of expensive set of reference samples to test the thickness and reduce the time of the calibration process. Moreover, the calibration thickness in this case is directly rolling mills, i.e., does not require dismantling of the thickness gauge from the line of the mill.

In Fig.1 shows a structural block diagram of the device of Fig.2 is a circuit diagram of the analog shaper of Fig.1; Fig.3 - a qualitative change in family output voltage of the device on the thickness of model measures for different values of the effective atomic number of the material measures; Fig.4 is a qualitative change in family output voltage of the device on the value of the effective atomic number of the material model measures at various thicknesses.

The device comprises a case 1 made in the form of a suitcase, and placed in it the notebook computer 2, the imaging unit 3 electric signal calibrator 4 electrical signals, analog-to-digital Converter 5 and a self-contained unit 6 power.

Laptop 2 is a microcomputer that includes a CPU, keyboard and monitor. Processor laptop 2 is provided an information-sorma, simulating the reference thickness model measures of material with different values of the effective atomic number Zeff. The control program is entered into the memory of the notebook computer 2 via its keyboard, and the monitor is used for visual observation of the process of program entry and calibration of the test x-ray thickness gauge (not shown). The outputs of the processor laptop 2 are connected to n inputs of the analog shaper 3, which is made in the form of parallel connected p simulation of circuits, each of which consists of the amplifying element FET 7 and serially connected to a capacitor 8 (Fig.2). Control inputs (gates) of field-effect transistors 7 driver 3 are n inputs.

Calibrator 4 electric signals made in the form of a transformer, the input of which is the primary winding 9 of the inductance, the output of the secondary winding 10 of the inductance. The input of the calibrator 4 is connected to the output of driver 3, and the output of calibrator 4 - input analog-to-digital Converter 5, the output of which is output to a portable device, designed for connection with the input of the calibrated x-ray thickness gauge (not shown). The entrance of the thickness gauge in this case, mo is to place an information-reference system, in which is recorded and stored data on monitored parameters model measures, i.e. the reference values of thickness h with a small step changes, such as about 10 microns, but a wide range of measures (thickness range), information about the effective atomic numbereffexemplary measures for each nominal thickness and other proprietary information, including the date and time of the study, the speed of the car. The software is stored in the memory of the notebook computer 2, and the customer can be upgraded.

The number of simulation circuits of the imaging unit 3 is not less than the number p of parameters measured calibrated thickness gauge. In the present case shows the two-variable fragment of the shaper 3 (R=2 - thickness of steel h and the effective atomic number Zeffmaterial rental). The shaper circuit 3 electrical signals are integrated load calibrator 4, consisting of active and reactive resistances, R, X. a Function of active resistance perform field-effect transistors 7 and functions reactance capacitors 8. The change of the nominal active and reactive resistances R and X is achieved by changing the gate voltage of the FET 7 forms the military earlier in the work of the calibrated (Respondent) thickness gauge with standard measures of normalized parameters (thickness h and the effective atomic numbers Zeffmaterial measures). The range of control voltages allows you to provide the imaging unit 3 modifying the complex impedance calibrator 4 within equivalent limits the thickness change and the effective atomic number of the real-controlled car (product) from the reference values to the maximum allowable deviations, appropriate change of parameters of model measures. By appropriate choice of the nominal active and reactive resistances whose values vary with changes in the levels of voltages applied to the gates of field-effect transistors 7, it is possible to provide at the output of the calibrator 4 electric signals corresponding to the nature and magnitude of the simulated parameter reference measure. In the absence of control voltages of the impedance simulating circuit shaper 3 is close to infinity.

The analog-digital Converter 5 is connected with the output of the calibrator 4, and the output is the output of a portable device. The Converter 5 is designed to convert an electrical signal from analog form to digital form, which allows to dramatically improve the noise immunity of the transmitted electric signal from the portable device the s parameters measured as follows. Programmatically or by the will of the operator for a specific circuit of the imaging unit 3, imitating a certain parameter is supplied from the output of the processor laptop 2 control voltage, obtained in accordance with the data in advance of interacting calibrated thickness gauge with an exemplary measure, imitating this particular option embedded in the software that causes a change in the impedance of the primary winding 9 and the secondary winding 10, and hence the electrical signals on these windings 9 and 10 of calibrator 4.

When applying the control voltage to the gate of field-effect transistor 7 in the same chain of its comprehensive resistance takes the value corresponding to the level value of the control voltage, equivalent to the value of the normalized parameter reference measure. Changing the voltage level on the gate of the FET 7 in a given range, build a family of analog dependency electrical output signals (voltages), shot with calibrator 4, from the values of the reference thickness h of model measures for dierent values of effective atomic number Zeffmaterial used measures (Fig.3).

Similarly, building a family dependency of the output voltage is of ancestoral 7 other circuits shaper 3 (in this case, the dependence of the stresses on the effective atomic number Zeffmaterial model measures for dierent values of thickness h measures used (Fig.4)). Then the obtained dependencies are injected into the memory of the calibrated thickness gauge.

Since the nominal values of the controlled parameters of the car before its manufacturer specified (known), find the exact reference dependence from their families in the graphs of Fig.3 and 4, and change the output electrical signals of thickness from measurements of the parameters of the real car and found the dependencies known to the values determined by the x-axis of the graphs (Fig. 3 and 4) deviations from the nominal values of monitored parameters, and hence the true values of the measured parameters.

The verification of thickness will be permitted in the absence of the test object, and, if available, but at rest (static) object, with constant values of the output signals, made a static object, remembered and recorded in the processor node of the calibrated thickness gauge. When controlling the thickness of the parameters of the car in the dynamics (the object is moving) on processor node gage record the current information in the form of voltage changes, the values of which data graphs of Fig.3 and 4, memorised in the thickness of the ecological characteristics of the x-ray thickness gauges rental and additionally the measurement of effective atomic number Zeffmaterial steel, as well as the efficiency of the process technology calibration by eliminating the need to constantly expensive set of reference samples for each test the thickness and reduce the time of the calibration process. Moreover, the calibration thickness in this case is directly rolling mills, i.e., does not require dismantling of the thickness gauge from the line of the mill.

Claims

A portable device of the automated diagnostic x-ray thickness gauges, containing case, which houses the analog shaper electrical signals, made in the form of parallel connected p simulation of circuits, each of which consists of the amplifying element FET and serially connected to a capacitor, while the control inputs of field-effect transistors are n input shaper, the calibrator electrical signals, the input coupled to the output of the shaper, and an Autonomous power supply, characterized in that it introduced a laptop with reference control program representing a database of standards in analog electrical form, they are the moat Zeffand analog-to-digital Converter, and the calibrator is made in the form of a transformer, the input of which is the primary winding inductance, the output of the secondary winding inductance, and outputs the laptop is connected to n inputs of the analog shaper, and the output of the calibrator is connected to the input of analog-to-digital Converter whose output, which output device is intended for connection to the input of calibrated x-ray thickness gauge.

 

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