X-ray thickness meter

 

The invention relates to x-ray measurement technology. Feature of the device is that the housing of the ionization chamber and the cable screen connection of the output of the camera with reinvestiruet the input of the amplifier is connected to the amplifier output and its inverting input and is isolated from ground. The technical result of the invention is to improve the measurement accuracy. 1 Il.

The invention relates to the control and measurement technology, in particular to an x-ray thickness gauges, and can be used to measure wall thickness of tubes, tape, strip mills for hot and cold rolling as in statics and dynamics.

Known x-ray thickness gauges containing the x-ray emitter, ionization chamber, between which is placed the controlled product, and connected in series amplifier, the processing circuitry and the Registrar, and the output of the camera is connected to the input of the amplifier shielded communication cable [1].

In a known measure of the thickness of the housing of the ionization chamber and the screen of a communications cable connecting the outlet chamber with the input of the amplifier, typically grounded to the high impedance input of the amplifier has not received external pomena the impedance of the amplifier 1 Gω and capacitance 50 PF its time constant (RC) signal is high and equal to ~ 50 mc, that adds thickness measurements, and therefore reduces the performance of the meter. Another problem is the possible mechanical movement, shock, bending of the cable connection between the camera and the amplifier cause a change in capacitance of the cable, and consequently, the magnitude of the capacitive load at the input of the amplifier. This can lead to very large noise voltage. When the output voltage from the ionization chamber 10 In the capacitance of the cable 0.5% causes a tip of about 50 mV, which causes a large random component of the error of measurement of thickness.

Known x-ray thickness meter, containing the x-ray emitter, ionization chamber, between which is placed the controlled product, and connected in series amplifier, the processing circuitry and the Registrar, and the output of the ionization chamber is connected to the input of the amplifier shielded communication cable [2].

This thickness gauge is also not provided for measures to reduce its time constant, so the speed and accuracy of the measurement is limited due to the presence of the capacitive load between the camera body with the screen of the cable relative to the earth.

The invention consists in that and in the controlled product, and consistently connected differential amplifier, the processing circuitry and the Registrar, and the output of the ionization chamber is connected with reinvestiruet input of the differential amplifier shielded communication cable, the output of the differential amplifier connected to the housing of the ionization chamber, the cable screen connection and its own inverting input, while the camera body and the cable shield is isolated from ground.

A positive result is a significant increase speed and accuracy of measurement due to the electrical connection of the housing of the ionization chamber and cable screen connection with the output of the differential amplifier and its inverting input, and the insulation casing and screen from the earth. This means that the difference voltage between the camera body, the cable screen connection and information to residential zero. Therefore, capacitive noise is significantly reduced, since the potential difference between them is determined only by the bias voltage of the operational amplifier.

The drawing shows a structural diagram of the proposed measuring the thickness.

It contains the x-ray emitter 1, the ionization chamber 2, between which is placed a controlled product 3, and the face 6. The output of the ionization chamber 2 is connected via a shielded cable connection (on the drawing screen is depicted by the dashed line) with reinvestiruet (positive) input of differential amplifier 4. The camera body 2 and the cable screen connection is isolated from ground, but electrically connected with the output of the differential amplifier 4 and the inverting (negative) input. The latter forms a 100% negative feedback.

Figure 5 processing the information signal provides its transformation into a form and format suitable for playback on the recorder 6, and can be performed on the chip type UD, transistors CT 315, 361.

As recorder 6 may be a video or recording device.

Has a thickness gauge as follows.

The x-ray flux from the oscillator 1 passes through the test object 3 and enters the ionization chamber 2. The radiation in the chamber 2 is converted into an electrical pulse with an amplitude determined by the thickness of the product 3. Information electric signal from the camera 2 is amplified in the differential amplifier 4 and supplied to the processing circuit 5 where it is converted into a convenient shape and form, providing further analysis. In the controlled product. This signal is recorded in the recorder 6.

The technical result of the invention are high performance and precision control of the thickness of the product due to the introduction of new technical solutions.

Sources of information 1. Rechentechnik. The Handbook. Edited by centuries Klyuyev. Book 2. M: Engineering. 1992. - S. 322.

2. RF patent N 2159408, CL G 01 15/02, BI N32, 2000.

Claims

X-ray thickness meter, containing the x-ray emitter, ionization chamber, between which is placed the controlled product, and consistently connected differential amplifier, the processing circuitry and the Registrar, and the output of the ionization chamber is connected with reinvestiruet input of the differential amplifier shielded communication cable, characterized in that the output of the differential amplifier connected to the housing of the ionization chamber, with the screen of the communication cable and its own inverting input, but the camera body and the cable shield is isolated from ground.

 

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