The stand for testing characteristics of the x-ray thickness gauges
The invention relates to x-ray measurement technology. The stand comes with a second disc rotation drive and a set of interchangeable work samples thicknesses and replaceable additional samples of the reference thickness, while the second disc made in circumferential cross-section of radius r Windows, similar Windows on the first disk, in which replaceable samples working thicknesses and (or) replacement additional samples of the reference thickness, and the second disc is located between the first disk and the radiation receiver and shifted its axis from the axis of the x-ray flux on the value of r, and the first disk added in circumferential cross-section of radius r two Windows, one of which is open to x-ray radiation flux, the other closed. The technical result of the invention is the provision of high metrological performance thickness gauge, a wide range of controlled thickness and rentgenolaboranty during adjustment of the thickness gauge. 1 Il. The invention relates to a measuring and control technique, namely the checkout device of the x-ray thickness gauges designed for non-destructive testing of industrial products, and can be used pranowo spectrum x-ray radiation, containing the x-ray emitter, a radiation receiver, the filtering radiation, made in the form of torque element plates is variable continuously or discretely varying thicknesses and of different materials and is placed between the emitter and the radiation receiver (RF patent 2168229, CL G 21 K 3/00, B 15, 2001).These stands of ecologically rentgenooptiki for the environment and including for staff, and their functional capabilities for the calibration of x-ray apparatus is limited, so they do not find wide application in engineering.The closest technical solution is presented x-ray thickness gauge, containing the x-ray radiator and a radiation receiver, which is placed between the device self-test (calibration) parameters of thickness, including the disk drive of rotation and the reference set of samples thicknesses that are installed in a radial cross section of the disk, as well as the processing circuitry, control units, memory and register (patent US 4727561, CL G 01 15/02, 1988).This device is environmentally roentgenoscope to the environment only when calibrating the thickness gauge, but not when setting up and adjustment of its elements, which should be the options are limited by the calibration of thickness small range of reference thicknesses, at the same time during calibration of thickness equal validity of controlled thickness and consistency of the metrological performance over the entire range of control this device self-test does not provide for the same reasons: there is no possibility to carry out an autopsy of the radiation detector and to regulate (adjust) the parameters of its elements, etc. in an enabled mode of thickness.The essence of the proposed technical solution is that the stand that contains a box with the shell of rentgenophase material, the subject of x-ray thickness gauge, including the x-ray radiator and a radiation receiver, placed in the box along the axis Oh, processing circuitry, control unit, memory and recording disk drive disk rotation around its axis About1-O1located between the emitter and receiver of the thickness gauge, and the sets of samples of various materials reference thickness, and the disk in the circumferential his cross-section of radius r made of window, which set forth the samples of the reference thickness, and the disk is shifted to its axis About1-O1parallel to the axis Oh of x-flow radiator for the value of r, equipped with the second disk drive rotation of the second disk around svannah thicknesses are also made of different materials, while the second disc made in circumferential cross-section of radius r Windows, similar Windows on the first disk, in which replaceable samples working thicknesses and (or) replacement additional samples of the reference thickness, and the second disc is located between the first disk and the radiation receiver and shifted its axis O2-O2from the axis O-O of the x-ray flux on the value of r, and the first disk added in circumferential cross-section of radius r two Windows, one of which is open to x-ray UX, the other closed for x-ray screen of rentgenophase material.The technical result of the invention are a wide range of controlled thickness with the same accuracy due to the simulation of almost any thickness reference samples of various materials, the stability of metrological performance measurement over the entire range of controlled thickness, provided laboratory conditions settings on the samples of reference thicknesses and working thicknesses and high rentgenolaboranty the environment and, in particular, staff at the setup and calibration is included in the network of thickness in the opened state due to warom.It contains the case 1 in the form of a rectangular chamber, covered by a shell 2 made of a material that is opaque to x-rays (rentgenophase material), the subject of x-ray thickness gauge, including x-ray emitter 3 and the receiver 4 of the radiation, is placed in the case 1 along the axis O-O scheme 5 information processing measurement devices 6, 7 and 8 of the management, recording and registration, the first drive 9 drive 10 of rotation of the disk 9 around its axis About1-O1the second drive 11 drive 12 of rotation of the disk 11 around its axis About2-O2and sample 13 sample thickness, removable samples 14 working thickness and replaceable additional samples 15 reference thickness. All samples are represented by sets of various materials.In the first and second disks 9 and 11 are made in district cross sections of the radius r of the window, which is fixed samples 13 reference thickness rigidly (the first disc 9) and exchangeable samples 14 working thickness and (or) replacement additional samples 15 reference thickness (the second disk 11). The first disk 9 is placed directly in front of the x-ray emitter 3 and the second disk 11 between the first disk 9 and the radiation receiver 4, and their axes O1-O1and O2-O2the disks 9, 1 is echani disks 9 and 11.In addition, in the first disk 9 is additionally performed in the circumferential cross-section of radius r two Windows 16 and 17, one of which, for example 16, is open to x-ray UX, and the other 17 are closed to x-ray radiation flux screen 18 of rentgenophase material.Open window 16 of the disk 9 is designed to ensure the smooth passage of x-flow radiator 3, and the necessity of its orientation under a stream arises when you need to control working thickness replaceable samples 14 installed in the second disk 11, and thereby to obtain the experimental dependence of the output signal of the thickness gauge from working thickness replaceable samples 14.The screen 18, closing the window 17 of the disk 9, is designed to intercept the x-ray flux emitter 3 without turning off thickness gauge from the electrical network in order to rentgenolaboranty personnel in situations when it is necessary to perform the technician or operator settings of the receiver 4 of the radiation. This procedure is carried out when the lid is open the case 1 (not shown) located on the top wall of the box, i.e., near the receiver 4. To change the emitter 3 and the receiver 4 of the thickness gauge in the Boxing predusmotreli, taken from samples 13, 15 reference thicknesses and sample 14 working thickness. The output of the circuit 5 is connected to the first input of the control device 6, one end of which is connected through the device 7 storing input device 8 of the Desk, and the other two channel output with the inputs of the actuators 10 and 12 of rotation of the discs 9 and 11. The second input device 6 is connected to the output 7 of remembering. The control device 6 is designed to start and stop the operator of rotation of the discs 9 and 11 according to the program incorporated in the device 7 remember. As devices 7 and 8 may be a computer monitor.Samples 13, 14 and 15 are made in the form of plates 2020 mm and are sets of plates of different materials (steel, copper, bronze, brass, coin alloy, and others). To configure or sized to the thickness gauge at large thicknesses, both discs 9 and 11 placed under x-ray flux by means of the actuators 10 and 12 discs 9, 11 with the corresponding samples of the specified standards and materials, the sum of the thicknesses of which represent the amount included in the specified range control. As the material of the shell 2 of the case 1 and the screen 18 is applied to the lead. The discs 9, 11 are made of any material (transparent is adeusi disks 9 and 11.The work stand.The test gauge is connected to the mains. In the device 7 load a script (program) verification on samples of the respective materials and thicknesses, the control device 6 via the drive 10 install disk 9 under x-ray flux pattern preset reference thickness and material that are specified by the program and displayed on the screen 8, and carry out the calibration of the gauge consistently across a reference set of samples thicknesses of the same material in accordance with the program. This replacement samples 14 and 15 on the disk 11 are absent, so that x-ray flow freely passed through the window of the disk 11, which is oriented software under a stream to the receiver 4. The captured data is converted by the processing circuit 5 in the desired shape and form and go through the device 6 device 7 for storing and 8 of the Desk. The information obtained in the form of the dependence of the output electrical signal from the circuit 5 of the thickness gauge is stored in the device 7. Then in the disk 11 install removable additional samples 15 reference thickness of a material same as the material of the set of samples 13 and the calibration procedure was repeated in the amount of two Atanassov 14, simulating the thickness of the real product, you need the disk 9 to Orient his open window under x-ray radiation flux, and the disc 11 to be placed in the Windows of samples 14 working thickness and the obtained dependence can remember in the device 7, and then compare it with the dependence obtained on samples of the same material, but the reference thickness. According to the comparison of working and reference performance is judged on the metrological performance measurement, and stability data on the reliability of the control.Next, the procedure is repeated on samples other material.Configuring the receiver 4 of the radiation is carried out when the lid is open and on the thickness gauge. For this purpose, the disk 9 is placed under x-ray flux of the screen 18.The technical result of the invention are a wide range of controlled thickness with the same accuracy due to the simulation of almost any thickness of the reference samples, the stability of metrological performance measurement over the entire range of controlled thickness, provided laboratory conditions settings on the samples of reference thicknesses and working thicknesses and high rentgenolaboranty the environment and, in particular, the account is entered the screen and the shell of the box.
ClaimsThe stand for testing characteristics of the x-ray thickness gauges containing box shell of rentgenophase material, the subject of x-ray thickness gauge, including the x-ray radiator and a radiation receiver, placed in the box along the axis O-O, processing circuitry, control unit, memory and recording disk drive disk rotation around its axis O1-O1located between the x-ray emitter and receiver radiation thickness gauge, and the sets of samples of various materials reference thickness, and the disk in the circumferential his cross-section of radius r made of window, which set forth the samples of the reference thickness, the disc is displaced to its axis1-O1parallel to the axis O-O x-flow radiator for the value of r, characterized in that the stand comes with a second CD drive its rotation around its axis O2-O2and interchangeable sets of samples working thicknesses and replaceable additional reference samples thicknesses are also made of different materials, while the second disc made in circumferential cross-section of radius r Windows, similar Windows on the first disk, in which replaceable samples working thicknesses and (amnicon radiation and shifted its axis O2-O2from the axis O-O of the x-ray flux on the value of r, and the first disk added in circumferential cross-section of radius r two Windows, one of which is open to x-ray UX, the other closed for x-ray screen of rentgenophase material.
SUBSTANCE: method includes recording number of particles emitted by radioactive layer on basis of number of voltage or current pulses recorded by counting device, then to measuring detector a flow of ionizing radiation is directed from calibrating standard electrode and also registered is number of particles, position of covered electrode is change no less than two times, by turning it in horizontal plane around its axis for arbitrary angle, while repeating measurement of pulses number, while measurement time is selected to be such that number of recorded pulses was no less than 3600 pulses for each measurement position, and then selection of necessary number of electrodes is calculated for forming electrode system in chamber.
EFFECT: higher precision, higher safety.
FIELD: MEASUREMENT TECHNOLOGY.
SUBSTANCE: electromagnet wave is induced by means of directed aerial. The wave is incident to dielectric plate. Brusterain angle of incident wave is defined from minimum value of reflected wave and value of dielectric permeability is calculated. Power of incident and reflected waves are measured and the value of reflectivity and specific conductivity are calculated as well as value of dielectric loss of dielectric plate. Then incident angle of electromagnet wave is increased till achieving value providing total internal reflection of electromagnet wave and attenuation of intensity is measured at normal plane relatively direction of wave propagation. Factors of normal attenuation and thickness of dielectric plate are calculated. Method allows to find complex dielectric permeability and thickness of dielectric plates free of dielectric substrates.
EFFECT: improved reliability.
FIELD: electrical measurements.
SUBSTANCE: device is proposed for measurement of dielectric and magnetic permeability as well as thickness of spin coatings on surface of metal and can be used in chemical industry for inspecting composition and properties of liquid and solid media. Electro-magnetic field is induced in body of dielectric material to be inspected which material is applied onto dielectric substrate, by means of sequent excitation of slow surface waves: two E-waves are excited at different, but having almost the same value, wavelengths λr1 and λr2 and one H-wave having wavelength of λr3. Attenuation of field intensity is measured t normal plane in relation to direction of wave propagation by means of receiving vibrators system for different values of base d between them. Normal attenuation factors αE1,αE2 and αH are found from ratio of E(y)= E0 exp[-α(y) y]. Magnetic and dielectric permeability and thickness of magneto-dielectric coating are found from relations of and where has to be phase coefficient of H-wave.
EFFECT: improved precision of measurement.
FIELD: measuring engineering.
SUBSTANCE: meter determines dielectric permittivity and thickness of the oil layer by measuring at two angles unequal to the Brewster angle.
EFFECT: simplified design and expanded functional capabilities.
FIELD: radiometric testing.
SUBSTANCE: counting of electric pulses of all the detectors stops simultaneously as soon as any detector registers no less than specified number of electric pulses caused by ionizing radiation.
EFFECT: improved reliability.
2 cl, 1 dwg
FIELD: non-destructive inspection.
SUBSTANCE: primary and secondary n detectors are made of multielement converting elements made of materials having different atomic numbers. Materials are disposed in detectors subsequently starting from lower number to higher ones. Converting elements of primary and secondary n detectors are electrically connected with inputs of (1+n) analog-to-digital converters. Primary detector is rigidly fastened to collimator of radiation source and is turned to item with side having been made of material with higher atomic number. Secondary n detectors are turned to item with sides having lower atomic number. Points of stop of discrete displacement of radiator with primary detector along the rail are coincided with radial directions being placed in the middle of radial directions which form sectors and cross the items at lateral cross-section through their longitudinal axis and centers of secondary n detectors. Value of equivalent atomic number of any layer of coating is calculated from algorithm introduced into processor.
EFFECT: improved precision of inspection.
FIELD: the invention refers to the field of non-destructive control of objects with using of x-ray radiation.
SUBSTANCE: the arrangement has a source of x-ray radiation, three detectors of radiation and a scheme of processing. The characteristic feature of the arrangement is using of detectors with three-sectional converting elements with different spectral sensitivity. The technical result of the invention is increasing of energetic resolution expanding functional possibilities conditioned simultaneous measuring of the thickness of sheet material out of ferrous and non-ferrous metals.
EFFECT: the invention provides high metrological parameters.
FIELD: inspection of dynamics of changes in cellular structures.
SUBSTANCE: method concludes angular collimation of α-radiation by means of Soller collimator, registration of energy spectrum of collimated flux of particles, determination of lateral structures from the shape of registered spectrum on the base of its mathematical model.
EFFECT: improved precision; improved speed of measurement.
FIELD: measurement technology.
SUBSTANCE: microwave electromagnetic fields of running surface slow E-waves and E1 and E2 at two wavelengths λosc1 and λosc2 of oscillator being close in value above dielectric-metal surface at single-mode regime. Damping factors αe1 and αe2 of electric field strength are measured at normal plane relatively direction of propagation of slow surface of wave. Real value of dielectric constant and thickness of coating are calculated. Taking measured values of damping factors into account, values of deceleration are calculated for those wavelengths by relation of Directional pattern maximum angle of inclination θdp max(fz)=θe1(e2) is measured at far zone by means of vertically oriented receiving vibrator. Length of dielectric coating le1 and le2 is determined from relation of le1(e2)=0.552·λosc e1(e2)/(νdf e1(e2)-cosθe1(e2) and its value l=(le1+le2)/2 is subject to averaging.
EFFECT: improved precision of measurement of longitudinal sizes of dielectric coating.
FIELD: non-destructive inspection; X-ray technology.
SUBSTANCE: device has X-ray radiation source, first and second radiation detectors, processing circuit and registrar. Detectors with different spectral sensitivities are used. The detectors are disposed one after another in such a way to make contact to each other at the side being opposite to where X-ray source is located.
EFFECT: improved precision of measurement; improved sensitivity.