X-ray thickness gauge

 

X-ray thickness gauge is designed to monitor the thickness of the strips or paintings in statics and dynamics. Feature of the device lies in the fact that the probe entered the unit value, while the active element of the differential chain made in the form of first and second series-connected field-effect transistors, the gates of which are connected to the output of block value, and the flow of the first and second source transistors connected to the first input of the third amplifier. The technical result of the invention is the extension of the measurement range with high performance control and noise measurement in dynamic measurements. 2 Il.

The invention relates to measurement techniques, in particular x-ray thickness gauges, and can be used when measuring the thickness of the metal strips, the strips in the rolling mill and the thickness of paper, cardboard and rubber bands as in statics and dynamics.

Known x-ray thickness gauges containing x-ray radiation source, two light receiver, between which is placed a controlled product, the first and second amplifiers, the inputs connected to the outputs of detectors matched with the spruce allows you to control the thickness of the product in the dynamics, however, due to the presence of high-frequency fluctuation error of measurement of the thickness they do not provide high precision control.

The closest technical solution to the claimed represented the x-ray thickness gauge, containing the radiation source, two light receiver, between which is placed a controlled product, the first and second amplifiers and consistently connected to the processing circuit, representing myCitadel, an adder and a divider, the error correction block including a differential chain, third and fourth amplifiers, electronic key and the second capacitor and the Registrar [Application 2000120378/28, a Positive decision of FIPS 01.11.01 for a patent].

In the correction block this thickness provides the ability to eliminate high-frequency fluctuation noise, which increases the accuracy of the measurement. However, the range of thickness measurements of the controlled products limited.

The essence of the proposed technical solution is that of measurement, containing the x-ray radiation source, two light receiver, between which is placed a controlled product, the first and second amplifiers, the inputs connected to the outputs of detectors matched with the error correction block, including differential chain consisting of reactive (first capacitor) and the active electrical elements, the third and fourth amplifiers, electronic key and the second capacitor and the Registrar, the inputs of the processing circuit, connected to the outputs of the first and second amplifiers are first and second inputs of vicites and adder, respectively, and its output is the output of the divider inputs connected to the outputs of vicites and adder, the input of the correction block is free terminal of the first capacitor, and the output is the output of the fourth amplifier, and the output of the third amplifier correction block is connected to the input of an electronic key, the first output of which is connected to the first input of the fourth amplifier and the free terminal of the first capacitor and the second output is connected via a second capacitor with the output of the fourth amplifier to form a feedback circuit, torn upon actuation of the key, and the second inputs of the third and fourth amplifiers connected together, forming a "ground" entered the unit value, while the active element of the differential chain made in the form of first and second series-connected field-effect transistors, the gates of which are connected to the output of the unit value of the AC unit denomination and the drain of the second field-effect transistor are connected to "earth".

A positive result is an expanded range of measured thicknesses of sheet products due to set the required value of the electric voltage at the drain of the first and second source transistors, which is the same, the voltage at the first input of the third amplifier, by setting the gates of the transistors of the voltage value proportional to a controlled thickness.

In Fig.1 shows a block diagram of an x-ray thickness gauge, Fig. 2 - scheme of the correction block of Fig.1.

It contains (Fig.1) x-ray emitter 1, the first and second detectors (ionization chamber) 2, 4, between which there is a controlled product (tape, strip of 3, the first and second amplifiers 5 and 6 and connected in series circuit 7 processing, the correction unit 8 and the Registrar 9.

Scheme 7 made in the form of vicites 10, the adder 11 and the divider 12. The output of the first radiation receiver 2 is connected through the first amplifier 5 with the first inputs of vicites 10 and the adder 11, and the output of the second radiation receiver 4 is connected through a second amplifier 6 with the second inputs of vicites 10 and the adder 11. The outputs of vicites 10 and adder 11 are connected respectively to first and second inputs of the divider 12, the output of which is stoaway of series-connected reactive and active electrical components, when this reactive element represents the first capacitor 13, and the active element is designed as series-connected first and second field-effect transistors 14 and 15, block 16 of the nominal voltage, the third and fourth amplifiers 17 and 19, the electronic key 18 and the second capacitor 20. The input of the correction unit 8 is free terminal of the first capacitor 13 differential chain and the first input of the fourth amplifier 19, and the output unit 8 to the output of the fourth amplifier 19. The first input of the third amplifier 17 is connected to the drain of the first and the source of the second field-effect transistors 14 and 15, the output of the third amplifier 17 is connected to the input of the electronic key 18. The first key 18 is connected to the first input of the fourth amplifier 19, and the second exit key 18 is connected through the second capacitor 20 with the output of the fourth amplifier 19, forming an inverse negative relationship torn when triggered, the electronic key 18. Free terminal unit 16 of the nominal value, the drain of the second field-effect transistor 15, and the second inputs of the third and fourth amplifiers 17, 19 are interconnected and form a common point ground block 8 correction.

The correction unit 8 is designed to suppress high-frequency fluctuations of x-ray radiation n is inogo voltage control state of the active element (the voltage on the gates of transistors 14 and 15) differential chain.

The parameters of the differential chain, as well as the values of the nominal control voltage that can be set at block 16 value is selected such that, had the ability with high precision and speed to measure any given program, for example, rolling mill nominal thickness of the product. Unit 14 nominal value represents a source of constant voltage, continuously or discretely controlled value that specifies the Manager or operator of a product depending on the incoming, for example, in the rolling mill values of the gauge of the product. When changing the output voltage of the block 14 value changes the resistance of the active element of the differential chain, and consequently, changes the voltage at the first input of the third amplifier 17.

The source 1 of radiation may be x-ray tube. Receivers 2 and 4 radiation or ionization chambers are used to convert x-rays into an electrical voltage (signal). Electronic key 17 may be made on the basis of, for example, optocouplers, field-effect transistors, etc.

The active element of the differential chain can be made on the basis of field-effect transistors types K for paraparesia specified value, coming to the first input of the third transistor 16.

The work of measuring the thickness.

In the first and second receivers 2, 4 radiation enters the x-ray flux, and the first receiver 2 stream passes through the test object 3. Radiation in the first receiver 2 is converted into an electrical pulse with an amplitude determined by the thickness of the product 3 and the parameters of the emitted x-ray flux, and radiation in the second receiver 4 is converted into electrical pulses of constant amplitude, determined only by the parameters of the emitted x-ray flux emitter 1. Electrical signals from the receivers 2, 4 are amplified in the first and second amplifiers 5, 6 and are fed to the inputs of vicites 10 and adder 11 scheme 7 processing, where the signals in them are to be subtracted and added, and then the divider 12, a differential signal is divided by the total signal, resulting in the output of the circuit 7 receives the dependence of the electrical signal from the thickness of the test object, but contains high-frequency noise caused by the fluctuation of the x-ray flux.

With the output of the circuit 7 processing the electrical signal to the input of the correction unit 8, where the elimination vysokochastotnykh ratings may change slowly or rapidly.

When melanotaeniidae the thickness of the product this signal on the differential chain block 8 correction sharply attenuated, due to the selected nominal elements 13, 14 and 15 of the differential chain and the control voltage of the block 16, which exhibited the output voltage corresponding to a particular nominal thickness of the product. Due to the weak electric signal, albeit amplified by the third amplifier 17, the electronic key 18 is closed (does not work), so a negative capacitive feedback (the second condenser 20) of the fourth amplifier 19 is connected, which causes a large time constant of the amplifier 19. Consequently, high-frequency fluctuations are suppressed in the correction unit 8 and to the input of the Registrar 9 comes useful electrical signal proportional to the thickness of the test object.

When rapidly changing the thickness of the test material of the same nominal value of the electrical signal on the differential chain almost not attenuated and passes to the first input of the third amplifier 17 through a high-frequency component of the signal. This signal, amplified in the amplifier 17, is fed to the input of an electronic key 18, which activates and disconnects the circuit the output reduces the time constant. In this case, the signal from the circuit 7, the process goes to the logger 9 through the fourth amplifier 19 correction block 8 with a small time constant, resulting in a change of the thickness values of the controlled products instantly reflected on the Registrar 9 in the form of electrical signal changes.

If you want to control the thickness of another value, for example greater than was the previous one, you must set the output of block 16 of the nominal output voltage level higher, but equivalent in amplitude to the measured thickness than the previous one.

The technical result of the invention is the significant expansion of the range of measured thickness while maintaining high performance measurement and Troubleshooting of high-frequency fluctuations of the output signal of the thickness gauge.

Claims

X-ray thickness gauge, containing the x-ray radiation source, two light receiver, between which is placed a controlled product, the first and second amplifiers, the inputs connected to the outputs of photodetectors, respectively, and connected in series circuit processing, representing myCitadel, the adder and divider unit adjusting the practical elements, the third and fourth amplifiers, electronic key and the second capacitor and the Registrar, the inputs of the processing circuit, connected to the outputs of the first and second amplifiers are first and second inputs of vicites and adder, respectively, and its output is the output of the divider inputs connected to the outputs of vicites and adder, the input of the correction block is free terminal of the first capacitor, and the output is the output of the fourth amplifier, and the output of the third amplifier correction block is connected to the input of an electronic key, the first output of which is connected to the first input of the fourth amplifier and the free terminal of the first capacitor, and a second output connected through a second capacitor with the output of the fourth amplifier to form a feedback circuit, torn upon actuation of the key, and the second inputs of the third and fourth amplifiers connected together, forming a "land", characterized in that it introduced the unit value, while the active element of the differential chain made in the form of first and second series-connected field-effect transistors, the gates of which are connected to the output of block value, and the flow of the first and the source of the second field-effect transistors connected to the first input of the third intensify

 

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