The method of quantitative mineral analysis of trace contaminants in raw quartz and automatic analyzer trace mineral in quartz raw materials
(57) Abstract:Usage: in the technique of analytical control substances in mining, glass industry, with exploration for rapid determination of trace mineral in industrial raw quartz. The inventive method is based on excitation of a pulse-periodic cathodoluminescence quartz substrate when irradiated by an electron beam, measuring the intensity of spectral bands 560 - 580 nm to determine the content of Apatite, 600 - 620 nm to determine the content of calcite, 690 - 730 and/or 370 - 490 nm to determine the content of feldspar and comparison of measurement results with the reference. The irradiation of moving crushed quartz train of pulses of the electron beam, the following frequency, providing a complete change of raw materials in the field irradiation for midimusic period, increases the sensitivity of the method. An additional area of the field of irradiation provides an absolute measurement of the number of grains indicated mineral traces in the analyzed raw materials without comparing with standards. The meter consists of the analytical chamber, the photodetector with dispersing ontstaan with pulse-periodic electron accelerator, further provided with a drawer in it and remove from it the quartz raw material, the flow of which intersect inside the chamber with an electron beam, and the processing system of measurement results is additionally connected device, integrating the signal of a sensor, a device that searches for the minimum value of the luminescence intensity among pulses of Zug, and the device, summing the intensity of all of the pulses of Zug. The meter provides additional photodetector apparatus over the flow of raw materials, coming from the field of irradiation. The method and the device does not destroy or pollute the analyzed raw materials, do not require special processing and preparation equipment, such as its seal, and provide expressnet one dimension of the order of minutes. 2 C. and 8 C. p. F.-ly, 7 Il. The invention relates to techniques for analytical control of the substance and can be used in mining, glass industry, with exploration for rapid determination of trace mineral in industrial raw quartz.The known method mineralogical analysis of quartz grain, including the dissolution of it in the special rest is.This method has a large number of disadvantages, the main of which are big time (up to several hours) required for the analysis, the destruction and pollution of the analyte and a small accuracy of the method.There is a method of detection of feldspars, including the grinding of mineral raw materials, irradiated by light radiation and the detection of luminescence in the field 880-890 nm.This method applies only to detect certain types of K-feldspar, a fraction of the total number of species of feldspars. In addition, this method does not involve quantitative measurements.Closest to the invention is a method of analysis of minerals and rocks, including their irradiation of a pulsed electron beams, the registration and determination of the spectral location of the bands of luminescence and determination by him of the mineral composition.The main disadvantage of this method is that it does not provide specific recommendations for the quantitative analysis of the content of mineral components.The aim of the invention is to implement a rapid fluorescent quantitative analysis of the content of the irradiation of electron beams, check the resulting luminescence, processing optical spectral information and visualization of the analysis results.The objective is achieved by ensuring the constancy of the square field exposure and completeness of its filling quartz raw materials in each series of measurements. To determine the weight or volumetric content of an impurity measure integrated over the exposure time of one frame, the intensity of luminescence in the spectral range of 560-580 nm to determine the content of the Apatite 600-620 nm for determination of calcite, 690-730 and/or 370-490 nm to determine the content of feldspar, and the exposure time of one frame spectral band 370-490 nm feldspar exceeds at least on the order of the characteristic time of decrease in the intensity of the same band luminescence of quartz.To increase the sensitivity and reliability of the results of the analysis of the use of crushed quartz raw material, give it a movement in the direction crossing the axis of the electron beam, is irradiated bundle (train) pulses of the electron beam, the following repetition rate, providing a complete change of quartz raw materials in the field of irradiation pulse period period, measured integral online is P CLASS="ptx2">To determine the number of grains of mineral impurities in irradiated mass of quartz raw materials separately measured under the same exposure integral intensity of the luminescence of one or known numbers fixedly mounted in the irradiation field of the grains measured mineral impurities with the same characteristic size, which in the analyzed quartz raw materials, determine the intensity of the luminescence of single grain Ioby dividing the measured intensity by the number of grains and to determine the number of grains of mineral impurities by dividing the total intensity Isthe intensity of one grain Ioand the content of impurity is defined as p n / N S (1) where n is the number of measured grains impurity, N the number of pulses of the electron beam in Zug; S the irradiation field area; the surface density of grains of quartz raw materials, the number of grains of quartz raw material per unit area of its surface.To increase the versatility and expressnet way especially with a low content of impurities, the intensity of the luminescence of single grain mineral impurities Ioautomatically defined in each series analysis as the minimum non-zero intensity luminesce with a low content of mineral admixtures reduce the size of the field of irradiation and each time it spend reduction measure until while not implemented, the condition ( 1 ) with no/ NoSo( 1 + ) C
C n1/ N1S1or p / No(3) where Nonoand Saboutthe number of pulses of the electron beam in Zug irradiation, the number of pulses in Zug, in which the detected luminescence of mineral impurities, and the area of the field of irradiation, respectively;
n1N1and S1the number of grains of mineral impurities measured in this raw material, when the number of pulses in Zug N1and square-irradiated S1;
p content of mineral impurities (in relative units, i.e. the number of grains of impurities per one grain raw materials);
- asked the measurement error ( no/ no) which has the meaning of probability of finding in the field of radiation more than one grain mineral admixtures.To improve the accuracy of the measurements up to the maximum possible measure of the integral or the maximum intensity of the luminescence of mineral impurities in each pulse train, find the minimum non-zero value within ( 1 ) ImIm( 1 + ) Imwhere the variance of the probability density distribution of the grains of impurities in size, among them determine the average value of the intensive the slo grains impurities by dividing the total intensity to the average intensity of a single grain.In Fig. 1 presents spectra of pulse cathodoluminescence quartz (I), Apatite (II), calcite (III) and feldspar (plagioclase) (IV) of Fig. 2 shows the integral intensity of the luminescence band 370-490 nm quartz raw materials in the form of grains with a characteristic grain size of 300 μm, still installed in the irradiation field, containing feldspar 400 ppm (V), 200 ppm (VI) and unknown contents (VII) with exposure time of 450 MS; Fig. 3 presents the total luminescence intensity of the same band, obtained by irradiation of eight pulses in the train is moving quartz raw materials of the same size with the content of feldspar 30 ppm (VIII), 20 ppm (IX) and 10 ppm (X) with exposure time of one frame 500 MS.The proposed method is based on two main provisions. First, it is based on the difference of spectral-kinetic parameters of luminescence of the main component raw materials of quartz and mineral admixtures type of Apatite, calcite and feldspar irradiated by electron beam (Fig. 1). Such luminescence is called pulse cathodoluminescence (ikl), if irradiation is carried out by single pulses of the electron beam, and a pulse-periodic cathodoluminescence (IPCL), if Onesti ikl and TPCL from the quantitative content of the mineral, located in the irradiation field, i.e. at the intersection of the electron beam with the analyzed raw materials.In industrial quartz raw materials the main component is colorless quartz, and other minerals included in the composition of the raw materials are undesirable components, reducing its quality. Their content depending on the degree of cleaning can vary from tenths to thousands of ppm (the number of particles of impurity per million main). The distribution inside the quartz raw materials subject to the known laws of mathematical statistics. The characteristic size of grains of quartz raw material is 0.1 to 0.4 mm with the most probable value of 0.16 mm. Thus, in the upper layer of the field irradiation area of 1 cm2when it is full fit around a thousand grains. On the basis of conditions nerazreshimosti analyzed raw material, which is provided at an electron energy of the beam is of the order of or less than 300 Kev, the depth of penetration of mineral grains of quartz and its attendant mentioned above, impurity components is of the same order as the grain size. Although in these conditions, the exposure shall be not more than the first two surface layers, however, when the content in syy analysis can be carried out according to the method of paragraph 1, i.e., this method of measurement should be used at initial concentration of silica raw materials.With less content of impurities (in the tens of ppm) is sufficient to artificially increase the area of the surface layer of irradiated raw materials by continuous or discrete change in the irradiation field. Thus it is necessary to carry out the irradiation unit (train) pulses of the electron beam so that each pulse of Zug was irradiated with a new batch of raw materials, and to summarize the integral luminescence intensity on all pulse Zug. These steps and their sequence are reflected in the method according to paragraph 2. It should be noted that to improve accuracy by eliminating measurement errors caused by the instability of electron beam parameters and noise photoresistive of equipment, every new batch of raw material can be irradiated by a series of pulses averaged registered under this integrated intensity IPCL by the number of pulses in the series.Methods of measurement points 1 and 2 are not absolute and require prior calibration of quartz raw materials with known content measured impurities. Moreover, the calibration should be carried out on quartz raw materials of the same field, Thu is about, to enter the calibration corresponding to this subspecies of the amendment, as the intensity of the TCL and IPCL is one of the characteristics of a particular subspecies of the mineral.The position of luminescence band 370-490 nm feldspars coincides with the position of luminescence band of the quartz. However, they significantly differ in the kinetics. If in quartz, this band is a band fluorescence with a characteristic time of the decay intensity1in a few tens of microseconds, feldspar he is the band of the phosphorescence characteristic fall time2in a few seconds. This difference is manifested in the value of the integral intensity of the band IPCL and ikl quartz raw materials after integrating over the exposure time Tmore1If you have a low content of grains of mineral matter, at the level of ppm and below, the probability of getting each pulse of Zug in the field of radiation decreases. This leads to a decrease in the measurement accuracy in the methods of paragraphs 1 and 2. In this case, it is expedient to carry out the counting mode of the grains analyzed impurities that fall within the field of irradiation, when train mode irradiation of raw materials. Their final content should be defined in sootvetstvenno impurity has its own practical value, since their number determines, for example, usercost quartz glass and crystals, melted and grown from this raw material.The intensity of these luminescence bands of mineral impurities irradiated with electromagnetic beams is sufficient for its confident reception with a single grain with a characteristic size of 0.1--0.4 mm traditional photodetectors type photoelectric tube (PMT). This principle lies at the basis of the method according to paragraph 3. Its implementation requires knowledge of the intensity values of individual grains impurities. These values can be obtained experimentally and included in the device memory or presented in the form of graphic images. This is no longer necessary in the method according to item 4, which automatically determines the intensity of the luminescence of one grain of the analyzed mixture. This method unlike the previous is absolute and, in principle, does not require prior calibration. For its implementation must satisfy the condition of the high probability close to one, falling into the irradiation field is only one grain in one or more pulses of Zug. At low impurity content (of the order of ppm or below) this condition is easily issue is to ensure that by reducing the area of the field of irradiation and increasing the number of pulses in Zug. However, this method is practically not taken into account the dispersion of grains of mineral impurities in size and the possibility of identification of two grains of small size for one that entails a certain amount of measurement error. Therefore, when a very low content of mineral impurities, and, if necessary, determine the exact count of grains admixture of mineral per unit mass or volume of quartz raw materials, the methods of paragraphs or 2, or 3, or 4 are complemented by measurements of the frequency of detection of the luminescence of mineral impurities in a moving stream of raw materials irradiated train of pulses of the electron beam number N (i.e., measure the number of pulses n in which the detected luminescence of impurity, and attributed it to the number of all N pulses of the electron beam in Zug). This reduction in the size of the field of irradiation until a condition is met (2). When this condition in separate portions of the quartz raw material and irradiated with single pulses of Zug, the number of grains of impurity mineral zero if not found its luminescence, and equal to the unit if it is detected its luminescence. In this case, the probability of falling into one frame exposure of two or more grains of impurities is taken into account by WEEE single grain impurities and can be pre-calculated from the laws of probability density distribution of impurities in raw materials or Vice versa can serve as the basis for calculating the probability density, if the latter is a priori not known.Finally, the accuracy of the measurement of the number of grains of impurities increases almost to the limit by taking into account the dispersion of the probability distribution of the grain size. For a particular process grinding of raw materials this dispersion and surface density of grains of quartz raw materials are known quantities and can be pre-entered into the memory device implementing the proposed methods. How unlike the previous is an independent, not more, although it may be used in the final quality.Thus, the number of grains of impurity mineral known in the irradiated mass of quartz raw materials, defined by the area of the field of irradiation, the number of pulses in Zug and the frequency of their recurrence, as well as the speed of flow of raw materials by known physical laws, the proposed method of paragraph 6 is determined with the highest accuracy. And in this case, the grain size does not matter, because the measurements can be carried out according to the principle of luminescence has a grain of impurity luminescence no no and grain impurities.The content of grains of mineral admixture per one grain of quartz raw materials, in methods in paragraphs 3 and is atomatizatsii and can be implemented in one device, on the same instrumental basis by switching reception and processing of spectral-luminescent information. The use of a single unit of three or more photodetectors, each of which is configured to strip ikl (IPCL) of its mineral impurities, allows the simultaneous analysis of the content of all of the above impurities. The use of filtering the light flux luminescence allows for a consistent analysis of the content of various impurities by a single photodetector.In contrast to the known, currently used in industry methods of quantitative analysis of the proposed method is nondestructive and does not change the quality of the analyzed materials. These raw materials can be used for its intended purpose. Therefore, the proposed method can be applied for rapid analysis of raw material during its processing.The complete analysis consists of three parts: the time spent on preparing the sample for analysis, the time required for analysis, and the time required for processing, display and storage of the results of the analysis. In the proposed method there is no neoliterate in the device, i.e. this time, constituting a significant portion of the total time of analysis in the known methods, in this case, is practically eliminated. The time spent directly for analysis in the proposed method a minimum of paragraph 1, i.e., in the analysis of raw materials with high content of impurities. When irradiated by a single pulse it is equal to several tens or hundreds of milliseconds, depending on the required accuracy of the analysis. The maximum analysis time is required in the fourth paragraph of method in the analysis of raw materials with a low content of impurities. Here is fundamentally necessary Zogby mode irradiation of a moving stream of raw materials. However, here the analysis is not enough. For example, if the pulse repetition rate of the electron beam 10 Hz and the number of pulses in Zug, 600 (analysis of raw materials with impurity content less tenths ppm), own analysis time is 1 min, which is several orders of magnitude smaller than in the known methods. And, finally, the time processing and display of analysis results is determined by the choice of the appropriate equipment and its component parts. In modern manufacturing systems based on microprocessors or personal computers this time does not exceed 1 min Takeov less than traditional used in industry the ways in which the analysis took several hours when irretrievable use of expensive chemicals.The proposed method makes it possible to provide rapid, non-destructive quality analysis of quartz raw materials in the process of technological preparation and to stop this process when the required quality. This method is practically the only automated way of counting grains of mineral matter.The proposed method was specifically implemented as follows. For excitation of periodic-pulsed luminescence used electron beam from a compact electron accelerator with the following parameters: electron energy of 200 Kev, the electron current density of 100 A/cm2the pulse duration of 3 NS, a repetition rate of 10 Hz or single pulses. Analyzed raw quartz Kuznechikhinskaya deposits in the form of grains with a typical grain size 0.1 to 0.4 mm with a known (200 and 400 ppm) and the unknown content of feldspar in terms of its definition. The analysis was carried out according to the method of the first paragraph of the area irradiated 1.5 cm2and the exposure times of 300, 450 and 750 MS. the certain results of these measurements clearly show the increase of the integral of the square of the field exposure time and exposure intensity of this band TCL at all times of exposure. Experiments have also shown that the content of feldspar raw materials of unknown content close to 200 ppm, which was confirmed by conventional measurements.Analyzed quartz raw materials containing feldspar 30, 20 and 10 ppm. When analyzing the method according to the first paragraph, the measurement error was high and did not allow for this experimental software to identify any significant difference. However, the method implemented according to paragraph 2, when eight pulses in Zug, i.e. just at the eightfold effectively increase the area of exposure of the raw materials, with exposure time of 500 MS allowed us to obtain the explicit change of the total luminescence intensity of raw materials, proportional to the content of feldspar.At the same setup measured intensities of luminescence of individual grains of Apatite, calcite and feldspar different species with a characteristic size of 0.1-0.3 mm, Their luminescence in these spectrum bands steadily even registered by a sensor type CCD, where the sensitivity by several orders of magnitude below the sensitivity of the PMT.Known cathode fluorescent analyzer typomorphism of minerals containing vacuumer ectrode, connected to the DC high voltage, and the needle of insulating material.This analyzer requires the analyzer vacuum chamber after each load of minerals. He is, essentially, not a meter, and a separator minerals of different kinds, and separation is performed by visual observation of weak luminescence of minerals and manual separation of one mineral from another, which is reflected, first of all, on expressnet analysis.A device for the spectral composition of the ores containing the illuminator optical system with a dispersing device, a sensor, processing the received information and the visualization system of measurement results.This device is only applicable for analysis of ore rocks with significantly different coefficients of reflection of light from the useful ore component and ballast rock, and to determine the content of an impurity of the same dielectric mineral in the other this device is practically not usable.Closest to the invention is an automated Mineralogy analyzer, based on the simultaneous measurement of reflection coefficient, the, two systems of the photodetector and three analog-to-digital Converter.The disadvantages of this device are that, firstly, the volume of one of the analyzed samples, the mineral restricted area of the field of view of the microscope. Therefore, the probability of detecting impurities of any mineral in this sample is small even when its content at the level of hundreds of ppm. For detection of mineral admixtures such and a lower content requires multiple preparation, installation, and microscopic analysis of new samples of the same mineral raw materials, which reduces expressnet measurements. In addition, the analysis of the sample in transmitted light assumes its transparency, at least for any particular wavelength. This condition limits the range of the analyzed minerals. Finally, this analyzer is complicated analysis and identification of minerals with similar coefficients of reflection and transmission, i.e., measurement error, e.g. in raw quartz calcite, feldspar and Apatite in this analyzer is great.The aim of the invention is to implement rapid, with high accuracy and sensitivity of automated fluorescent probe quality quartz is The objective is achieved by the fact that the meter provides an analytical chamber, the photodetector with a dispersing device, the device analysis and processing of signals of the photodetectors, the input device and storing the reference (calibration) information and device visualization of measurement results, analytical camera is connected to a pulse-periodic electron accelerator and is additionally provided with a device for continuous or discontinuous feed into it and remove quartz, designed so that the flow of raw material inside the chamber intersects with the electron beam in a calibrated aperture, through which the output light flux of the luminescence of minerals in the analytical window of the camera, moreover, the plane of flow of the raw material forms with the axis of the electron beam angle, non-deployed, and the size of an orifice of the diaphragm, along which the movement of raw materials, satises dv(t)dt, (4) where v(t) the instantaneous speed of flow of raw materials; f is the pulse repetition frequency electronic start; totime the end of the previous pulse, and in the processing system at the output of the photodetector enabled device, electrically integrating the time dimension of the k content of mineral impurities analytical Luggage made with the same number k of the output luminous flux of the luminescence, to which docked k photodetectors with k dispersing devices, and the signals from the sensors are transmitted on the k-channel processing equipment.To expand the capabilities and accuracy of measurement of the meter contains additional photodetector with its dispersal system located over the flow of raw materials, post-irradiated at a distance, satisfying the condition v11 v2(5) where v is the average velocity of the flow of raw materials;1and2the characteristic times of the luminescence decay of quartz and impurity mineral, respectively.To save energy meter contains a gravity feeder in the analytical chamber of quartz raw materials in the form of a funnel with the flap in its narrowest part installed above the analytical chamber, and a receiving funnel to drain the raw material installed below the analytical chamber, and the size of an orifice aperture satises d g / 2t2(6) where g is 9.8 m/s2the acceleration of free fall.With the aim of expanding the dynamic range of the measurements of the content of mineral impurities calibrated aperture diaphragm is arranged to change its area PMU processing at the output of the integrator device, providing search and transfer in the analyzer minimum non-zero value of the integral intensity of the individual pulses of Zug, the minimizer and the device, summing the integral intensity of all pulses of Zug, the adder input value of the total intensity on the analyzer.In Fig. 4 is a diagram of the meter with horizontal flow in the analytical chamber of raw materials; Fig. 5 scheme of the meter with several independent photodetectors of Fig. 6 diagram of the meter with spaced photodetectors of Fig. 7 scheme of gauge gravity feed raw materials in the analytical chamber.The offered meter is intended for analysis of industrial quartz raw materials in the form of grains with a wide range of content of non-metallic mineral impurities (from thousands to tenths of units pmm and below) for qualitative and quantitative measurements. Such a width of the dynamic range of measurement is based on the corresponding set of dispersing elements (filters) and the external input mode measurements, which includes, first, the installation of the integrating mode or mode account grains impurity minerals, secondly, to set the number of impulsesnin (4) and (6), setting the exposure time of light emission of the luminescence sensor Tthe installation area of the field exposure by selecting the aperture size of the diaphragm, install the appropriate calibration data.The meter is an implementation of the above method, which is based on the difference of spectral composition and kinetics IPCL minerals of different kinds, as well as its high intensity, which allows to detect the luminescence from a single mineral grains with a characteristic size of the order and even less than 0.1 mmThe size of an orifice chart, along which moves raw quartz and satisfying conditions (4) or (6), provides a complete change of the quartz raw material due to its motion in the field of this hole for midimusic period. Thus installed within the analytical chamber in the path of the electron beam aperture with a calibrated orifice that provides exposure to exactly famous the share of raw materials from all of its flow, resulting in improved measurement accuracy. Non-deployed the angle between the plane of flow of raw materials and the axis of the electron beam necessary to ensure the electron beam irradiation everything ovenia electrons in quartz (0.1-0.5 mm) most of the quartz raw material in the aperture is non-irradiated and not fluorescent. In addition, this angle is convenient for selecting the luminous flux of the luminescence of minerals on the photodetector apparatus located outside the analytical chamber, through the window in the wall.Automatic fluorescent probe contains analytical chamber 1, to which is connected a pulse-periodic accelerator 2 electrons with the control unit 3, for receiving the quartz raw material 4 device 5 with the valve 6 located outside the analytical chamber 1 (Fig. 4-6) or the vertical axis on top of the camera 1, in the form of a funnel with a valve at its lower narrow part (Fig. 7). The flap 6 is provided with a device 7 management associated with the unit 3 control accelerator. Receiving for the past analysis of the raw device 8 is set out in Fig. 4-6 or the bottom of the camera 1 (Fig. 7). Inside the chamber 1 is set to aperture with a calibrated orifice 9, the center of which coincides with the axis of the electron beam 10. Raw in the camera 1 enters the chute 11, the guiding thread of quartz raw materials and limiting its width. On the side of the camera 1 has one (Fig. 4, 6, 7) or more (Fig. 5) Windows 12 to output light flux 13 luminescence of minerals. The Windows 12 mounted color filters 14 and the photodetector 15. The filter 14 and photoplan. ). The photodetector 15 is electrically connected to a single channel (Fig. 4, 6, 7) or multichannel (Fig. 5) integrator 16 signal, electrically connected with the minimizer 17, the adder 18 and the unit 3 control the acceleration of electrons. The analyzer 19 is electrically connected to the minimizer 17, the adder 18, block 3 control accelerator device 20 storing the calibration information and the device 21 visualization.Automatic fluorescent measuring the quality of the quartz raw material is as follows.Before beginning work included electrical power meter. In unit 3 control the acceleration set the measurement mode, the pulse repetition frequency f, the number of pulses in Zug N and the exposure time TIn the device 20 storing the calibration information is set in accordance with the selected mode of measurement and the object of measurement (specific impurity mineral) calibration information. In accordance with the subject of measurement to set the required filter 14 in meters Fig. 4, 6, 7 (in meter 5 this operation is not required). In the receiving device 5 is loaded required for the selected measurement mode number quarter CLASS="ptx2">Block 3 control accelerator switch on the meter is in measurement mode. When this signal is input to the device 7 and it opens the valve 6. Quartz raw material 4 through the chute 11 into the chamber 1 and forms a flow of the raw material along the plane of the opening 9 of the diaphragm. After the complete filling of the flow of raw materials opening 9 of the diaphragm is enabled periodic-pulsed electron accelerator with a pulse repetition frequency f, is installed on the unit 3 control. Electron beam 10 irradiates the flow of raw materials, filling the hole 9 of the diaphragm. The resulting luminous flux luminescence 13 is directed through the window 12, the filter 14 on the photodetector 15, and the flow of raw materials, continuing its movement, is delivered to the receiving device 8. In the meter (Fig. 6) after time t 1/v is additional registration luminescence (phosphorescence). The electrical signal from the photodetector 15, proportional to the instantaneous intensity of the luminescence of impurity mineral enters the integrator 16 integrates each pulse Zug separately for the exposure time Tset the integrator 16 by the control unit 3, and stops the reception of signals from the photodetector 15 after processing the N signals. the, the excellent from zero, the value of the integrated intensity within the wavetrain of pulses and displays this value in the analyzer 19. Each integrated signal from the integrator 16 is supplied to the adder 18, which is the sum over all momenta of Zug, and after processing all N pulses summed signal is fed into the analyzer 19. When this accelerator 2 electrons automatically from the control unit 3 turns off and the valve 6 is returned to a normally closed position. The analyzer 19 are primary treatment received from the adder 18 and the minimizer 17 information and its comparison with calibration, coming from the device 20 storing the calibration information and the control unit 3, the final processing on the specified initially the program and the issuance of the obtained measurement results to the device 21 visualization.In the meter of Fig. 5 measured simultaneously the contents of multiple (three) types of mineral admixtures. For the measurement of the content of other mineral impurities in meters Fig. 4, 6, 7 repeats the preparatory operation is tailored exactly to this mixture, while the quartz raw materials from the receiving device 8 is poured into the receiving device 5 and all operatic ready but not working electron accelerator. After filling with the next sample of the material he starts again in the measurement mode, and the final switch it off is by removing the supply voltage.When installing the meter, not one, but several photodetectors with their dispersing device (Fig. 5) or multi-channel photodetector with dispersing device in the form of a prism or a diffraction grating, the meter is able to simultaneously determine the content of several mineral impurities in quartz raw materials. The maximum time of one measurement is required when the meter is in the counting mode of grains of mineral impurities. In this case, it is equal to several minutes. In other modes, the measurement time is significantly less. The existence of a minimizer and adder necessary measures. When implementing the first three paragraphs of the way the minimizer is not required, and the function of the adder may perform integrator.The meter does not destroy the analyzed sample, which can be used for its intended purpose. It can be used directly in the process of cleaning the quartz grains as a command device group when the indicator in terms of 1 cm width of the flow of raw materials is 7-10 kg/H. It is comparable in magnitude with the performance of existing enterprises. 1. Method of quantitative analysis of trace mineral in quartz raw materials, including the irradiation of the analyzed sample and the registration of its spectral characteristics in three spectral bands, which carry out the analysis, wherein the irradiated raw quartz pulsed electron beams, thus ensure the continuity of the square field exposure and the constancy of the degree of filling of the field of irradiation of quartz raw materials, as the spectral characteristics using the luminescence of raw materials, which is recorded in the range of 560 to 580 nm, 600 to 620 nm and 370 - 490 nm, characterizing cathodoluminescence Apatite, calcite and feldspar, respectively, this measures the integral by the area of the field of irradiation and exposure time, the intensity of the luminescence, and upon registration of luminescence in the range 370 - 490 nm, the exposure time is chosen such that it is exceeded by at least the order of the characteristic time of decrease in the intensity of luminescence of quartz in the same range.2. The method according to p. 1, characterized in that irradiation of quartz raw materials give the movement direction, perschl a new batch of raw materials, and the registration of luminescence summarize the integral value of the luminescence intensity for all the irradiated portions of the raw material.3. The method according to p. 2, wherein the pre-measure the intensity of luminescence of single grain mineral impurities with the same characteristic size, and grain impurities in the analyzed raw materials, and determine the number n of grains of the desired mineral impurities in raw materials by dividing the total intensity measured for all portions of the raw material, the intensity of one grain, and the content of impurity is defined as P = n/S N g, where N is the number of pulses in a packet, S - exposed area, g is the surface density of the grain material.4. The method according to p. 3, characterized in that in the preliminary measurement of the intensity of one grain size of the field of irradiation is chosen so that the probability of hitting him in just one grain impurities by irradiation with at least one pulse was close to unity, and determine the intensity of the luminescence of single grain impurities as the minimum non-zero intensity registered by irradiation with at least one pulse.5. Automatic analyzer trace mineral in quartz raw materials, including spectral-optiomization information containing at least one channel processing equipment, by the processing system spectral-luminescent information attached block comparison and visualization of measurement results, wherein the analyzer further comprises a pulse-periodic electron accelerator for irradiation of materials of a pulsed electron beam and an analytical chamber, provided with at least one optical window feeder in the camera and the removal from it of raw materials and device integration of the electrical signal, the camera is docked to the periodic-pulsed electron accelerator, in the feeder and remove completed the main hole, and the camera is equipped with a diaphragm with a calibrated orifice, coinciding with the main hole feeder and removal of raw materials, the latter are set so that the plane of its main hole forms with the axis of the electron beam angle, non-deployed, and the analytical chamber through at least one window through the spectral-optical system is associated with at least one sensor that is attached to the device integration, connected to the processing system of SpectraLine material is made with the material flow along the hole of the diaphragm, the size of the pupil satisfies the condition
< / BR>where V(t) is the instantaneous speed of flow of raw materials;
f is the pulse repetition rate of the electron beam;
tabout- the time of the end of the previous pulse.7. The analyzer PP.5 and 6, characterized in that the camera has a k optical Windows through which the chamber by means of K spectral-optical system optically connected with k sensors, and the processing system spectral-luminescent information contains k-channel processing equipment, where K is the number of analyzed impurities in raw materials.8. The analyzer PP.6 and 7, characterized in that the analyzer contains additional sensors and additional spectral-optical system, feeder and removal of material is made an extra hole, optically connected via an additional spectral-optical system with additional sensors attached to the device integration, the distance between the primary and secondary holes in the feeder and removal of raw materials satisfies the condition
where V is the average velocity of the flow of raw materials;
1and2 PP.5, 7 and 8, characterized in that the feeder and removal of material is made in the form of gravitational device, provided with a funnel with the flap in its narrowest part and the receiving funnel to drain the raw materials, with a funnel with a valve is installed on top of the analytical chamber, and a loading hopper mounted below the analytical chamber, and the size of an orifice aperture satisfies the condition
where g = 9.8 m/s2;
f is the pulse repetition rate of the electron beam.10. The analyzer PP.5 and 9, characterized in that the chamber is equipped with a diaphragm with a variable throat section.
SUBSTANCE: method involves taking bone tissue fragment sample in area under examination, measuring relative laser luminescence level. The obtained values are compared to normal bone tissue characteristics. Quantitative reduction of mineral composition being found relative to reference value in normal state is diagnosed by interpreting spectral characteristics in diagnostic bandwidth of 350-550 nm.
EFFECT: high accuracy of diagnosis.
FIELD: analytical methods.
SUBSTANCE: method is based on specific physicochemical feature of combination of impurity traces, which determine composition of product, said feature being capacity of absorbing and reemitting optical emission (luminescence). According to invention, one accumulates files of spectral-luminescent characteristics of product being identified and reference product. Identification procedures allow one to follow minor deviations of characteristics in liquid composition.
EFFECT: increased identification efficiency.
5 dwg, 4 tbl
FIELD: analysis of water and organic solutions.
SUBSTANCE: sensor has multi-channel structure in form of length 1 of poly-capillary pipe with through capillary, forming micro-channels, which are filled with two layers of non-mixing substances. One layer 4 is formed by water or water solution and other 3 - by organic substance. In first of said layers into micro channels micro-granules 5 of absorbent are placed.
EFFECT: higher efficiency, lower costs.
27 cl, 14 dwg
FIELD: measurement technology.
SUBSTANCE: glowing of tested object is excited and pulses are amplified, formed, registered and compared with test-object. Tested object is subject preliminary to freezing, then the object is placed inside container made of low heat conductivity material. Container is placed into light-tight chamber provided with shutter. After glowing is established, quantum light flux radiated by tested object is passed through optical mirrors located at input of photomultiplier tube. Glowing is initiated by flash light due to contact tool which makes photo flash connection circuit synchronously with operation of shutter.
EFFECT: improved precision of measurements; improved precision.
SUBSTANCE: method involves measuring luminescence parameters in to areas on biological object (control area and case one). Each area is exposed to optical radiation action sequentially in spectrum segments corresponding to various tissular fluorophors luminescence excitation. Radiation components are selected from luminescence radiation caused by optical treatment applied to the areas on biological object in each of mentioned spectrum segments. Their intensity is measured synchronously with appropriate pulsation wave phase in corresponding biological object area. Device is usable for excluding artifact and general somatic state influence upon luminescence parameters measurement results.
EFFECT: high accuracy in estimating fluorescence properties of aerobic and anaerobic bacteria.
27 dwg, 3 tbl
FIELD: measurement technology.
SUBSTANCE: porous-structured semiconductor materials are modified by recognition element and exposing to electromagnetic radiation carries out photoluminescence reaction. Recognition elements that can be chosen from bio-molecular, organic and non-organic components interact with target to be subject to analysis. As a result, the modulated photoluminescence reaction arises.
EFFECT: improved sensitivity.
31 cl, 13 dwg
FIELD: microbiology, optics.
SUBSTANCE: invention relates to investigations of materials by assay of their physical or chemical properties using optical devices and to systems wherein material is excited by optical agents resulting to it luminescence. Invention proposes a test carrier as a centrifugal tube. Carrier is separated for upper and bottom cavities by partition. Volume of lower cavity is 0.1 of tube volume. A hole is made in partition near a wall. The constructive decision of partition provides efflux of sample from lower cavity with minimal overcoming the combined forces of wetting and surface tension. Also, invention proposes methods/variants for rapid measurement of absolute concentration of microorganisms in biosubstrate by their photoluminescence. Methods involve using fluorescent or phosphorescent measuring device and above said test carrier. Methods provides increasing rate and precision of assay, to use serial measuring devices and to carry out measurement of the concentration of particles in substrate with another specific gravity value as compared with that of liquid in substrate. Invention can be used in food and biotechnological industry for determination of absolute concentration of microorganisms in different substrates.
EFFECT: improved method for assay, valuable properties of carrier.
2 tbl, 1 dwg
SUBSTANCE: method involves recording omega-potential. The values being observed between -14 and +20 mV, septic shock occurrence with multiple organ failure following. Omega-potential values being below -26 mV, sepsis or severe sepsis occurrence with moderate scale organ dysfunction is to be determined. Omega-potential values being between -15 and -26 mV, moderate severity clinical course of systemic inflammatory response syndrome is determined.
EFFECT: high accuracy of prognosis.
4 dwg, 2 tbl
FIELD: measuring engineering.
SUBSTANCE: device comprises unit for power supply, photomultiplier, main pulse amplifier, pulse counter, nontransparent chamber with the shield, light source, unit for control of shield, and cell. The cell is provided with the converting lens that is mounted above the cell. The object set in the cell can move under the light source and photomultiplier. After converting the flux of the quantum light that passes through the lens and amplifier of the photomultiplier, the pulses can be recorded.
EFFECT: enhanced efficiency.
1 cl, 1 dwg
FIELD: measurement technology.
SUBSTANCE: method includes application of probing optical signals directly to specified part of space, measurement of spectrum of dissipation and excited fluorescence spectrum within preset part of area. Moments of measurement of amplitudes of spectral components of received signals are defined by distance D to area of measurement. Diagram of measured differential image is subsequently put to coincidence with closer criterion differential spectral images and better approach is found. Transmitting optical system of the device and receiving optical system are connected together through measured part of area. Optical system can be oriented at the direction of tested part of space.
EFFECT: improved speed of measurement.
2 cl, 5 dwg