Device for surface quality control
(57) Abstract:The invention relates to measuring technique and can be used to control the surface and width of the flat parts. The device contains two fiber optic collector 1, 2 and transmitting 3,4 and reception 5,6 branches each, mutually optically conjugate. The device also contains two emitter 8,9, two of the photodetector 10 and 11, a clock 12, two channel selection information including the switches 13, 14, demodulators 15,16 block difference 17, an adder 18, two blocks grading 21, 22, the processing circuit measurement data and the block 27 of the Desk. The device solves functionality. The clock 12 generates a shifted time of the pulse phases emitters 8,9 that illuminate controlled flat part 28 located more facet of normally the common optical axis of the light guide collectors 1, 2. From the received signal for each channel are allocated to components that carry information about the size of the reflected and past threads radiation. The magnitude of the reflected radiation flux is estimated surface quality and largest past the width of the flat part. After sorting the blocks 21, 22 arrives at the Blo is Olya surface quality.A device for quality control cylindrical surface  contains the light source, the beam-splitting plate, a fiber, a sensor, a processing unit.A disadvantage of this device is the large measurement error, since the measurement result is influenced not only by the quality of the surface, but the distance to it due to the monotonous fall of optical characteristics, in addition, the device has a narrow features, because it does not allow to control the diameter of the wire.A device for quality control cylindrical surface  contains the light source, the lens, the optical fiber of the fiber, incoming and outgoing radiation, alternating between the radiation receiver, the processing unit information.A disadvantage of this device are narrow features, because the device does not allow to control the diameter of the wire.The problem to be solved by the proposed device is the extension of functionality by simultaneous control of the quality of the surface and width of the part.This is achieved by a device for quality control of the surface containing DV is optically associated with the transmitting branch of the corresponding light guide collector, first and second photodetector, optically coupled with the receiving branch of the corresponding light guide collector synchronizer, first and second outputs of which are connected respectively to the first and second emitter connected in series to the first switch, the first demodulator, the block difference, the comparator, the first block grading and registration unit, the outputs of the first and second photodetector connected respectively to first and second inputs of the first switch, the third output clock to the third input of the first switch and the second input of the first demodulator, the output of block difference is also connected to the second input of the first unit inspection endoscope collectors are aligned and optically interconnected, while the device has connected in series with a second switch, the second demodulator, the adder block averaging amplifier, the output of which is connected to the third input of the first unit inspection and connected to the first and second input respectively to the outputs of the block difference and adder differential amplifier connected to its output first input of the integrator connected to the output of the last second unit inspection exit cat the ith pulse, the output of which is connected to the second inputs of the second unit grading and integrator, the output of the comparator is also connected to the third input of the integrator, the outputs of the second and first sensors connected respectively to first and second inputs of the second switch to the third input of which is connected to the third output clock, is connected also to the second input of the second demodulator, the output of the first demodulator connected to the second input of the adder, and the output of the second demodulator connected to the second input of the difference.In Fig. 1 shows a structural diagram of the device of Fig.2 timing diagram of the operation of the individual blocks of the device.The device comprises (Fig.1) mounted coaxially with and optically coupled between the first 1 and second 2 of the light guide collectors with the inlet 3, 4, and foster 5, 6 branches, block 7 orientation, the first 8 and second 9 emitters, the first 10 and second 11 photodetectors, clock 12, the first and second outputs of which are connected respectively to the first 8 and second 9 to the emitter.The device also contains the first 13 and second 14 switches, the first 15 and second 16 demodulators, each connected to the first input to output sootvetstvenno the first and the second input of the differential amplifier 19, connected to its output, the first input of the integrator 20. The device also includes first 21 and second 22 blocks grading, the comparator 23, the driver 24 and the gate pulse, the block averaging 25, the amplifier 26, block 27 of the Desk.The emitters 8, 9 optically conjugate with the transmitting branch 3, 4 of the respective light guide collector 1, 2.The photodetectors 9, 10 optically coupled with receiving branches 5, 6 of the respective light guide 1, 2. The output of the first photodetector 10 is connected to the first input of the first switch 13 to the second input of which is connected the output of the second photodetector 11. The output of the second photodetector 11 is connected to the first input of the second switch 14, to the second input of which is connected the output of the first photodetector 10.The third output clock 12 is connected to the third input of the switch 14, 15 and the second inputs of the demodulators 15, 16. The output of the first demodulator connected to the first input unit 17 of the difference to the second input of which is connected the output of the second demodulator 15. The output of the latter is connected also to the first input of the adder 18 to the second input of which is connected to the output of the first demodulator 15. The output unit 17 of the differential is connected to the input of the comparator 23, the output of which moderator 20 connected to the first input of the second unit 22 inspection to the second input of which is connected to the output of the driver 24 and the gate pulse, is connected also to the second input of the integrator 20, to the third input of which is connected to the output of the comparator 23. The output unit 17 of the differential is connected to the second input of the first unit 22 grading, to the third input of which is connected to the output of the amplifier 26. The output of the adder 18 is connected to the input unit 25 of averaging, the output of which is connected to the input of the amplifier 26. The outputs of the first 21 and second 22 blocks grading connected respectively to first and second inputs of the block 27 of the Desk.The light guide collectors 1, 2 are fiber optic collectors of mixed fibers, branches at the joint end. The size of the light guide collectors 1, 2 along a line width measurement items is greater than the maximum possible width of the part being measured 28.The device operates as follows.The first part 28 is not in the control zone. The synchronizer 12 generates a continuous sequence of pulses of the clock signal Utand synchronously with him two pulse signals phase UF1and UF2active levels which do not coincide in time (see Fig.2), for example shifted by half eradawson branches 3 and 4 of the respective light guide collector 1 and 2 alternately transmitted in the control zone.In the absence of details on 28 position control of the flow of the study is reflected from block elements 7 orientation, the end of the coaxial light guide collector 2 or 1 and is captured by the admissions branch 5 or 6 corresponding to collector 1 and 2 and is applied to the photodetector 10 or 11. Their outputs are in-phase with the corresponding signal phase UF1and UF2generated pulse signal UP1UP2with the amplitude (see Fig.2). Another part of the radiation flux of the illumination of the receiving branch 5 or 6 coaxial collector passes to the photodetector 10 or 11, and outputs pulses of UP1UP2amplitude Ubeing in antiphase with the corresponding signals UF1and UF2. The channels are identical and the amplitude of the corresponding pairs of the same name signals equal in each step, which is achieved by appropriately setting the channels.Thus, the output of each of the photodetectors 10 and 11 alternately with the frequency of the clock signal Utthere are pulse amplitude Uand U. For their separation are applied to the switches 13, 14, controlled by a clock 12. The input of the first demodulator 15 is supplied sequence of pulses with amplitude Uon whne analog signals with the storage time, much larger sampling time.Sampling is performed by a clock signal Utclock 12. The output of block 15 there is a constant signal with amplitude Uand the output unit 16, the signal amplitude U(see Fig.2 chart U( t), U(t) in the interval 0 t1).Next, in block 17 of the difference is subtraction, and the adder 18, the summation of these signals, respectively, at their outputs have UpU- Uand UcU+ U. The signal Ucthrough block averaging 25 constituting a filter of low frequency, and the amplifier 26 with adjustable gain as the reference signal Uopis fed to the input of the first unit 21 grading. To another input unit 21 receives the signal UBecause in this mode item 28 there is no output signal from the comparator 23 Uto(see Fig.2) prohibits the analysis of signals in the first block 21 grading, as well as the Builder 24 gate pulse and the integrator 20. Block 19 of the differential amplifier provides the selection signal U1proportional component of the radiation flux of the illumination passing from one channel to another. Input integretel 28 to the position control, that plane more faces normal to the optical axis of the light guide collectors 1, 2, varies the ratio between the reflected and transmitted components of the radiation flux of the illumination and, consequently, between the signals Uand UThe signal Uincreases in the value of Uand the signal Ureduced by the amount of UIn General, to one surface of the output signal of the first demodulator 15 can be written in the form
U(t, R( ( g') )= U+ U(t,R( g')) f(t), where t is the time parameter;
R(g') is a function that determines the dependence of the reflectivity of the plot details from the reflection coefficient and the geometric parameters g' surface defects;
f(t) function that describes the response of the transducer to produce perfect parts and takes values:
Accordingly, the signal at the output of the second demodulator 16 may be written as
U(t ( g)) UU(t (g)) f(t), where (g) is a function that determines the dependence of the integrated system throughput of the two fiber optic collectors from the geometrical parameters of the controlled items.The value of Ug(t,R ( y') is reduced in the presence of depekene Uor Uchanged only when the scanning area of the workpiece surface with a defect. Scanning items with a smooth defect-free surfaces and with a width that does not change the values of these signals.In Fig. 2 presents graphs of the above-described signals Uand U; interval (0, t) corresponds to the absence of details on the testing; the interval (t1, t2the submission details on the testing; the interval (t2, t3) the overlapping part of the control zone; the interval (t3, t4) release detail with position control; the interval (t4that is similar to the interval (0,t1), i.e., the absence of details on the testing after its passage.In accordance with the described algorithm is a condition for acceptance of parts as good is the fulfillment of the inequality
(t, R(, g))K+ U(t (g))(1+K)]f(t)
where (t,R(g') function, the value of which is equal to the average between the values of U(t, R (g') corresponding to the condition of each of the controlled surfaces. In the absence of the defect on all surfaces (t) U(t)
To normalizing factor that sets the level of the reference signal.Thus, when receiving parts 28 with a defect poveselelilo and reference signals in the first block 21 grading. In fact, here in each moment of time t the condition (1) and its violation is issued signal of marriage recorded in block 27 of the Desk. Simultaneously to the input of the integrator 20 receives the signal
U1(t (g)) 2 U2 U(t (g)) f(t)
When submitting details 28 to the position control is activated, the comparator 23 and permits the accumulation of the signal until the arrival of the pulse from shaper 24 gate pulse. The leading edge of the gate pulse is generated on the trailing edge of the signal Uto. Item 28 is considered accepted, if the signal at the output of the integrator 20 is in a given interval.Checking this condition is in the second block 22 grading when the gate pulse from shaper 24 gate pulse. The result is recorded in block 27 of the Desk. Rear front gate pulse integrator 20 is installed in its original state.Thus, the device has a wider functionality than the prototype, because it allows simultaneous control of surface quality control and the width of the part. DEVICE FOR CONTROLLING the quality of the SURFACE containing two svetoograzhdenie the transmitting branch of the corresponding light guide collector, first and second photodetector, optically coupled with the receiving branch of the corresponding light guide collector, the clock, the first and second outputs of which are connected respectively to the first and second emitters connected in series to the first switch, the first demodulator, the block difference, the comparator, the first block grading and registration unit, the outputs of the first and second photodetectors are connected respectively to first and second inputs of the first switch, the third output clock is connected to the third input of the first switch and the second input of the first demodulator, the output of block difference is also connected to the second input of the first block grading, characterized in that that of the light guide collectors are aligned and optically connected, the device is equipped with a series-connected second switch, the second demodulator, the adder block averaging amplifier, the output of which is connected to the third input of the first block, grading, and connected to first and second inputs respectively to the outputs of the block difference and adder differential amplifier connected to its output first input of the integrator connected to the output of the latter comparator driver gate pulse, the output of which is connected to the second inputs of the second unit grading and integrator, the output of the comparator is also connected to the third input of the integrator, the outputs of the second and first sensors connected respectively to first and second inputs of the second switch to the third input of which is connected to the third output clock, is connected also to the second input of the second demodulator, the output of the first demodulator connected to the second input of the adder, and the output of the second demodulator connected to the second input of the difference.
FIELD: measurement of planeness of strip in reel shaft of hot strip rolling mill.
SUBSTANCE: proposed method includes measurement of planeness in reel shaft of hot rolling mill; reel shaft is provided with movable and immovable strips between pulling device and reel; hot strip is fed to reel through its shaft by means of roller table and pulling roller of pulling device; reel is provided with drum, hold-down rollers and end guides; roller for measurement of planeness is closed in reel shaft turned inside guide strip. Moving roller used for measurement of planeness has working position at which hot strip passes around roller used for measurement of planeness retaining approximately constant wrapping angle α and lowered position; reel shaft is provided with swivel guide strip closing the roller used for measurement of planeness.
EFFECT: enhanced economical efficiency; enhanced protection of roller in lowered position.
15 cl, 9 dwg
FIELD: physics, measurements.
SUBSTANCE: invention is related to the field of metering equipment, namely to measurement of moving surface parametres. Charge of explosive substance is initiated with the help of lens or detonation distributor on surface, which is speeded up by explosion products to velocity that causes glow of shock wave in front of it. Receiver of the same shape closed by screen is installed on motion route. Two or more groups of electro-optical detectors are installed in receiver along normal line to moving surface on different bases from initial position of surface. Surface of screen inverted to electro-optical detectors in process of motion interacts with their ends, besides, at the same time electric and light signals are generated, which are supplied to recorders. Recorders measure time of moving surface approach to the end of every detector. Diversity is defined by difference of times of electric and light signals in every group of detectors.
EFFECT: makes it possible to improve reliability and accuracy of measurements of time intervals in complex expensive experiments.
FIELD: physics, measurement.
SUBSTANCE: invention may be used for contactless detection of quality in items having medium and low classes of purity. Detection of surface roughness parametres is carried out by digital survey of investigated surface or its area by digital optical device with resolution of at least 3 megapixels at angle of illumination of 15°, 45°, 75° with normal location of lens to investigated surface. Digital pictures are sent to computer, pictures are processed and analysed on the basis of calculation of statistical criteria of each picture. Mean-square deviation is found between statistical criteria, which is correlated with arithmetical mean deviation of roughness sample Ra. Restoration coefficient k is determined. Electronic model of surface microrelief is built by transformation of picture pixels into three-dimensional coordinates, which are used for calculation of geometric parametres of surface roughness.
EFFECT: higher efficiency of surface roughness parametres measurement.
2 cl, 14 dwg, 8 tbl
FIELD: measurement technology.
SUBSTANCE: this method is based on the use of coherent electromagnetic radiation. Under this technology optical nonlinearity of the surface with microrelief and reference specimen are created. Measurement of the surface microrelief is made by the analysis of the interferences obtained as a result of interaction between nonlinear optical surface reflected from the microrelief of the giant second harmonic and giant second harmonic reflected from the surface of the reference specimen. Unambiguity of the microrelief altitude measurement is ensured by the analysis of the interferences of the derived part of radiation and radiation reflected from the surface with microrelief. Optical nonlinearity of the surfaces with microrelief and reference specimen can be created by the method of chemical chemical etching of the surfaces or by their covering with metal nanoparticles or semiconductor particles.
EFFECT: improvement of the accuracy and unambiguity of the measurements of the microrelief altitude with sharp drop of altitudes.
3 cl, 2 dwg
SUBSTANCE: method of controlling surface roughness involves probing the surface with laser radiation and recording photoluminescence intensity using photosensitive devices. The rough surface is covered with a layer of nanoparticles. The detected information feature used is characteristic photoluminescence of these particles, induced by the probing laser radiation. Roughness of the surface is controlled by changing the nature of photoluminescence intensity when the angle between the axis of the probing radiation and the normal to the rough surface is changed.
EFFECT: integral evaluation of roughness, local evaluation of the section of interest and automation of the control process.
7 cl, 6 dwg, 2 tbl
SUBSTANCE: roller for measuring flatness defects of a strip has force transducers built into the lateral surface of the roller with formation of measurement sections and coatings for the force transducers which are flush with the surface of the roller. The coatings are surrounded by a gap for movement with formation of a clearance from the force transducers. The measurement sections are closed by one or more metal films adhesively connected to the surface of the roller. Also the measurement roller has an additional shell.
EFFECT: increased strength and wear-resistance of the measurement roller, prevention of shear deformation in coatings which form measurement sections of the roller.
9 cl, 8 dwg
FIELD: measurement equipment.
SUBSTANCE: invention relates to measurement equipment, in particular, to facilities for control of relief and surface properties of samples with the help of sclerometers, and may be used to assess variation of surface properties along the scanning path. For this purpose they perform scanning of the controlled surface more than once with different extent of probe approaching to the controlled surface with simultaneous production of data on spatial and power parameters of scanning, and sample parameters are defined using them, which characterise relief and/or properties of the sample surface, extent of probe action at the surface or surface layers of the sample, and also value of residual deformation is defined by difference of produced values of spatial and power parameters. At the same time the first scanning is carried out with a load at the probe, not causing plastic deformation of the surface, and they assess vertical movements of the probe in process of scanning, on the basis of which they build a profilogram of the controlled surface and determine parameters of its roughness, then the probe is returned into the initial position, the probe is inserted into the surface layer for the required depth, reflecting volume properties of the surface layer, due to application of the permanent normal load, and the second scanning is performed, and vertical movements of the probe are assessed, on the basis of which they build the curve of the support surface and assess its characteristics, and also define the distribution of hardness of the surface layer along the scanning path.
EFFECT: expansion of functional capabilities of assessment of surface layer characteristics and production of more correct data reflecting volume properties of surface layers.
FIELD: measurement equipment.
SUBSTANCE: invention relates to measurement equipment, in particular, to devices for measurement of profile of surfaces of low-modular viscoelastic sheet materials of light industry, namely, man-made and natural leathers, etc. A device to detect profile of materials in deformed condition, comprising a base, a counting unit, a locating element, installed as capable of rotation around its axis, differing by the fact that the locating element is made in the form of a semi-cylinder with a hollow semi-cone and two limiting plates to fix a sample; the device comprises an additional counting unit fixed on the semi-cylinder, to detect bending radius of the investigated sample, arranged in parallel to the semi-cone guide, at the same time the main counting unit is made as combined, capable of displacement along the axis of rotation of the locating element and comprises a strain gauge motion sensor and a digital optical microscope.
EFFECT: device makes it possible to study hidden defects of natural leather and man-made materials, to determine variation of material relief under bending deformation.
2 cl, 1 dwg
FIELD: measuring equipment.
SUBSTANCE: device for measuring macro roughnesses surfaces can be used in hydropower control macro roughnesses, taper and deviation from the horizontal plane mirror surfaces disc thrust bearings of hydroelectric. Device for measuring macro roughnesses surfaces, comprising mounted horizontally and in parallel above one another rigid rectangular plates fixed together by vertical uprights disposed on the outer side of each plate at the corners three support adjustable legs installed at the inner side of the bottom plate two sensor inclination angle, the axes sensitivity are mutually perpendicular and parallel to the adjacent side of the plate and fixed by means of removable alignment ring on one of the plates with its outer side magnet, the center of which is located inside the right-angled triangle formed by the three bearing adjustable feet at the median from the vertex of the right angle.
EFFECT: technical result is to increase the accuracy of measurement macro roughnesses by measuring the angular displacement in the coordinate system associated with the survey surface, expanding the functionality of the device.
1 cl, 1 dwg